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1
المؤلفون: A. Meftah, Sonia Amdouni, M.-A. Zaïbi, Mehdi Rahmani
المصدر: Journal of Materials Science: Materials in Electronics. 32:4321-4330
مصطلحات موضوعية: 010302 applied physics, Arrhenius equation, Materials science, Photoluminescence, Silicon, Analytical chemistry, chemistry.chemical_element, Schottky diode, Substrate (electronics), Condensed Matter Physics, Porous silicon, 01 natural sciences, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, symbols.namesake, Nickel, Full width at half maximum, chemistry, 0103 physical sciences, symbols, Electrical and Electronic Engineering
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2
المؤلفون: Mehdi Rahmani, A. Meftah, M.-A. Zaïbi, Sonia Amdouni
المصدر: Silicon. 13:179-187
مصطلحات موضوعية: 010302 applied physics, Photoluminescence, Materials science, business.industry, Nanowire, Schottky diode, 02 engineering and technology, Substrate (electronics), 021001 nanoscience & nanotechnology, Porous silicon, 01 natural sciences, Isotropic etching, Electronic, Optical and Magnetic Materials, Saturation current, Etching (microfabrication), 0103 physical sciences, Optoelectronics, 0210 nano-technology, business
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3
المؤلفون: M.-A. Zaïbi, M.-B. Bouzourâa, Stéphane Dalmasso, A. En Naciri, Meherzi Oueslati, Yann Battie
المساهمون: Laboratoire de Chimie et Physique - Approche Multi-échelle des Milieux Complexes (LCP-A2MC), Université de Lorraine (UL), Laboratoire LANSER, Université de Tunis El Manar (UTM), Université de Tunis, Ecole Nationale Supérieure des Ingénieurs de Tunis
المصدر: Superlattices and Microstructures
Superlattices and Microstructures, Elsevier, 2018, 117, pp.457-468. ⟨10.1016/j.spmi.2018.03.078⟩مصطلحات موضوعية: [PHYS]Physics [physics], 010302 applied physics, Quenching, Spin coating, Photoluminescence, Materials science, Condensed matter physics, Condensed Matter::Other, Exciton, 02 engineering and technology, Atmospheric temperature range, 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Molecular electronic transition, Condensed Matter::Materials Science, Ellipsometry, 0103 physical sciences, General Materials Science, Electrical and Electronic Engineering, Thin film, 0210 nano-technology, ComputingMilieux_MISCELLANEOUS
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4
المؤلفون: M.-A. Zaïbi, M. Oueslati, M. Rahmani, S. Amdouni
المصدر: Journal of Luminescence. 157:93-97
مصطلحات موضوعية: Photoluminescence, Materials science, Silicon, Inorganic chemistry, Biophysics, Analytical chemistry, Dangling bond, chemistry.chemical_element, Infrared spectroscopy, General Chemistry, Condensed Matter Physics, Porous silicon, Biochemistry, Atomic and Molecular Physics, and Optics, symbols.namesake, Nickel, chemistry, symbols, Fourier transform infrared spectroscopy, Raman spectroscopy
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5
المؤلفون: M.-B. Bouzourâa, Yann Battie, Stéphane Dalmasso, M.-A. Zaïbi, Meherzi Oueslati, A. En Naciri
المساهمون: Laboratoire de Chimie et Physique - Approche Multi-échelle des Milieux Complexes (LCP-A2MC), Université de Lorraine (UL), Université de Tunis, Ecole Nationale Supérieure des Ingénieurs de Tunis, Laboratoire de nanomatériaux et des systèmes pour les énergies renouvelables [Tunis] (LANSER), Université de Tunis El Manar (UTM)
المصدر: Superlattices and Microstructures
Superlattices and Microstructures, Elsevier, 2017, 104, pp.24-36. ⟨10.1016/j.spmi.2017.01.044⟩مصطلحات موضوعية: 010302 applied physics, [PHYS]Physics [physics], Spin coating, Materials science, Photoluminescence, Condensed matter physics, business.industry, 02 engineering and technology, 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Condensed Matter::Materials Science, Ellipsometry, 0103 physical sciences, Dispersion (optics), Damping factor, Optoelectronics, General Materials Science, Crystalline silicon, Electrical and Electronic Engineering, 0210 nano-technology, Absorption (electromagnetic radiation), Spectroscopy, business, ComputingMilieux_MISCELLANEOUS
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6
المؤلفون: M.-A. Zaïbi, A. Moadhen, A. Chaillou, M. Guendouz, Meherzi Oueslati, Hervé Rinnert, Yann Battie, A. En Naciri, M.-B. Bouzourâa
المساهمون: Université de Tunis El Manar (UTM), Laboratoire de Chimie et Physique - Approche Multi-échelle des Milieux Complexes (LCP-A2MC), Université de Lorraine (UL), Laboratoire de Spectroscopie Raman, Faculté des Sciences Mathématiques, Physiques et Naturelles de Tunis (FST), Université de Tunis El Manar (UTM)-Université de Tunis El Manar (UTM), Institut Jean Lamour (IJL), Institut de Chimie du CNRS (INC)-Université de Lorraine (UL)-Centre National de la Recherche Scientifique (CNRS), Fonctions Optiques pour les Technologies de l'informatiON (FOTON), Université de Rennes (UR)-Université européenne de Bretagne - European University of Brittany (UEB)-Institut National des Sciences Appliquées - Rennes (INSA Rennes), Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-École Nationale Supérieure des Sciences Appliquées et de Technologie (ENSSAT)-Télécom Bretagne-Centre National de la Recherche Scientifique (CNRS), Université de Rennes 1 (UR1), Université de Rennes (UNIV-RENNES)-Université de Rennes (UNIV-RENNES)-Université européenne de Bretagne - European University of Brittany (UEB)-Institut National des Sciences Appliquées - Rennes (INSA Rennes), Institut National des Sciences Appliquées (INSA)-Université de Rennes (UNIV-RENNES)-Institut National des Sciences Appliquées (INSA)-École Nationale Supérieure des Sciences Appliquées et de Technologie (ENSSAT)-Télécom Bretagne-Centre National de la Recherche Scientifique (CNRS), Université de Tunis
المصدر: Materials Chemistry and Physics
Materials Chemistry and Physics, 2016, 175, pp.233-240. ⟨10.1016/j.matchemphys.2016.03.026⟩
Materials Chemistry and Physics, Elsevier, 2016, 175, pp.233-240. ⟨10.1016/j.matchemphys.2016.03.026⟩مصطلحات موضوعية: Materials science, Silicon, Scanning electron microscope, Analytical chemistry, chemistry.chemical_element, 02 engineering and technology, Porous silicon, 01 natural sciences, Crystallinity, Optics, Ellipsometry, 0103 physical sciences, General Materials Science, Crystalline silicon, Thin film, Photoluminescence, 010302 applied physics, Spin coating, Optical properties, business.industry, 021001 nanoscience & nanotechnology, Condensed Matter Physics, chemistry, ZnO, [PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci], 0210 nano-technology, business
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7
المؤلفون: Lazhar Haji, Meherzi Oueslati, M.-A. Zaïbi, M. Rahmani, H. Ajlani, A. Moadhen
المصدر: Journal of Alloys and Compounds. 506:496-499
مصطلحات موضوعية: Photoluminescence, Materials science, Passivation, Silicon, business.industry, Band gap, Mechanical Engineering, Metals and Alloys, Analytical chemistry, chemistry.chemical_element, Porous silicon, Spectral line, Tunnel effect, Optics, chemistry, Mechanics of Materials, Excited state, Materials Chemistry, business
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8
المؤلفون: Mehrezi Oueslati, A. Moadhen, Alain Lusson, M. Rahmani, M.-A. Zaïbi, Habib Elhouichet
المصدر: Journal of Alloys and Compounds. 485:422-426
مصطلحات موضوعية: Equivalent series resistance, Chemistry, business.industry, Mechanical Engineering, Metals and Alloys, Analytical chemistry, Porous silicon, Acceptor, Space charge, Threshold voltage, symbols.namesake, Optics, Mechanics of Materials, Materials Chemistry, symbols, business, Ohmic contact, Raman scattering, Diode
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9
المؤلفون: Habib Elhouichet, M.-A. Zaïbi, M. Rahmani, A. Moadhen, Meherzi Oueslati
المصدر: Journal of Luminescence. 128:1763-1766
مصطلحات موضوعية: Photoluminescence, Silicon, Passivation, Chemistry, Doping, Biophysics, Analytical chemistry, Dangling bond, Infrared spectroscopy, chemistry.chemical_element, General Chemistry, Condensed Matter Physics, Porous silicon, Biochemistry, Atomic and Molecular Physics, and Optics, Fourier transform infrared spectroscopy
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10
المؤلفون: M.-A. Zaïbi, A. Aïssa, J.-P. Lacharme
المصدر: Vacuum. 79:19-24
مصطلحات موضوعية: Sticking coefficient, Silicon, Passivation, Scattering, Analytical chemistry, Dangling bond, chemistry.chemical_element, Hydrogen atom, Condensed Matter Physics, Surfaces, Coatings and Films, Adsorption, chemistry, Atom, Atomic physics, Instrumentation