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1
المؤلفون: C.E. Meyer, Niklas Dellby, George Corbin, Benjamin Plotkin-Swing, Ondrej L. Krivanek, M.V. Hoffman, Luca Piazza, Andreas Mittelberger, Tracy C. Lovejoy, Sacha De Carlo
المصدر: Microscopy and Microanalysis. 26:1928-1930
مصطلحات موضوعية: Optics, Materials science, Pixel, business.industry, Detector, Large dynamic range, business, Instrumentation, Low noise
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2
المؤلفون: Niklas Dellby, Luca Piazza, M.V. Hoffman, Sacha De Carlo, Radosav S. Pantelic, Andreas Mittelberger, Ondrej L. Krivanek, Tracy C. Lovejoy, Christoph Hoermann, Benjamin Plotkin-Swing, G.J. Corbin, C.E. Meyer
المصدر: Ultramicroscopy. 217
مصطلحات موضوعية: 010302 applied physics, Point spread function, Materials science, Pixel, business.industry, Electron energy loss spectroscopy, Detector, 02 engineering and technology, Electron, 021001 nanoscience & nanotechnology, 01 natural sciences, Noise (electronics), Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, Detective quantum efficiency, Optics, 0103 physical sciences, 0210 nano-technology, business, Instrumentation, Dark current
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3
المؤلفون: Ondrej L. Krivanek, Andrew Bleloch, Jordan A. Hachtel, Benjamin Plotkin-Swing, G.J. Corbin, M.V. Hoffman, C.E. Meyer, Juan C. Idrobo, N.J. Bacon, M.T. Hotz, Niklas Dellby, Tracy C. Lovejoy
المصدر: Ultramicroscopy. 203
مصطلحات موضوعية: 010302 applied physics, Materials science, Spectrometer, business.industry, Electron energy loss spectroscopy, Resolution (electron density), 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, law.invention, law, 0103 physical sciences, Scanning transmission electron microscopy, Optoelectronics, Electron microscope, 0210 nano-technology, business, Spectroscopy, Instrumentation, Image resolution, Monochromator
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4
المؤلفون: Benjamin Plotkin-Swing, G.J. Corbin, Z.S. Szilagyi, M.V. Hoffman, C.E. Meyer, Andreas Mittelberger, Tracy C. Lovejoy, P. Hrncirik, Ondrej L. Krivanek, Niklas Dellby, N. Johnson, Andrew Bleloch, N.J. Bacon, G.S. Skone, M.T. Hotz
المصدر: Microscopy and Microanalysis. 25:512-513
مصطلحات موضوعية: Software, Materials science, business.industry, Detector, Electronic engineering, business, Instrumentation
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5
المؤلفون: Tracy C. Lovejoy, George Corbin, Niklas Dellby, Ondrej L. Krivanek, M.V. Hoffman
المصدر: Microscopy and Microanalysis. 24:446-447
مصطلحات موضوعية: Materials science, business.industry, Stem eels, 0103 physical sciences, Optoelectronics, 02 engineering and technology, 021001 nanoscience & nanotechnology, 010306 general physics, 0210 nano-technology, business, High energy resolution, 01 natural sciences, Instrumentation
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6
المؤلفون: Ondrej L. Krivanek, Niklas Dellby, Andrew Bleloch, N.J. Bacon, Tracy C. Lovejoy, M.V. Hoffman
المصدر: Microscopy and Microanalysis. 23:1552-1553
مصطلحات موضوعية: Materials science, business.industry, 0103 physical sciences, Optoelectronics, 02 engineering and technology, 021001 nanoscience & nanotechnology, 010306 general physics, 0210 nano-technology, business, High energy resolution, 01 natural sciences, Instrumentation
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7
المؤلفون: M.V. Hoffman, Niklas Dellby, Tracy C. Lovejoy, Ondrej L. Krivanek
المصدر: Microscopy and Microanalysis. 22:952-953
مصطلحات موضوعية: 010302 applied physics, Materials science, 0103 physical sciences, 02 engineering and technology, 021001 nanoscience & nanotechnology, 0210 nano-technology, High energy resolution, 01 natural sciences, Instrumentation, Engineering physics
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8دورية أكاديمية
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل. -
9دورية أكاديمية
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل. -
10دورية أكاديمية
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل.