المؤلفون: Rathaur, S.K., Ma, C., Dixit, A., Lee, C., Chang, E.Y.

المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 24(3):428-436 Sep, 2024

المؤلفون: Li, A., Wang, W., Li, F., Zhu, Y., Zhang, Y., Liu, W., Yu, G., Zeng, Z., Zhang, B.

المصدر: 2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD) Power Semiconductor Devices and ICs (ISPSD), 2024 36th International Symposium on. :1-3 Jun, 2024

Relation: 2024 36th International Symposium on Power Semiconductor Devices and ICs (ISPSD)

المؤلفون: Liang, Y., Zhang, Y., He, X., Zhao, Y., Yan, J., Wang, M., Liu, W.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(5):2914-2919 May, 2024

المؤلفون: Li, S., Zeng, F., Xing, Z., Wu, N., Cao, B., Luo, L., Wu, C., Wang, W., Li, G.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(5):2920-2924 May, 2024

المؤلفون: Lee, Y., Chang, K., Lin, H., Tai, M., Huang, W., Lin, J., Kuo, H., Lee, J., Huang, I., Chang, T.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(4):2349-2354 Apr, 2024

المؤلفون: Lee, Y., Chang, K., Tai, M., Wang, Y., Lin, H., Yeh, Y., Kuo, H., Tsai, X., Lee, J., Huang, I., Chang, T., Sze, S.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(3):1792-1797 Mar, 2024

المؤلفون: Wang, Q., Pan, M., Zhang, P., Wang, L., Yang, Y., Xie, X., Huang, H., Hu, X., Xu, M.

المصدر: IEEE Access Access, IEEE. 12:16089-16094 2024

المؤلفون: Tan, Junzhe, Yang, Dongyi, Wu, Shiqiang, Zhu, Yuhao, Pan, Yaoyao, Cui, Pengju, Liu, Wen

المصدر: 2023 International Conference on IC Design and Technology (ICICDT) IC Design and Technology (ICICDT), 2023 International Conference on. :52-56 Sep, 2023

Relation: 2023 International Conference on IC Design and Technology (ICICDT)

المؤلفون: Wu, Pei-Yu, Tsai, Xin-Ying, Chang, Ting-Chang, Tsai, Tsung-Ming, Sze, Simon M.

المصدر: 2023 35th International Conference on Microelectronic Test Structure (ICMTS) Microelectronic Test Structure (ICMTS), 2023 35th International Conference on. :1-4 Mar, 2023

Relation: 2023 35th International Conference on Microelectronic Test Structure (ICMTS)

المؤلفون: Arias-Purdue, A., Rowell, P.V., King, C.M., Carter, A.D., Paniagua, A., Shinohara, K., Bergman, J., Urteaga, M.E., Miller, N.C., Elliott, M., Gilbert, R., Herrault, F., Green, D., Buckwalter, J.F.

المصدر: IEEE Microwave and Wireless Technology Letters IEEE Microw. Wireless Tech. Lett. Microwave and Wireless Technology Letters, IEEE. 33(7):1011-1014 Jul, 2023