المؤلفون: Li, L., Chen, X., Zeng, G., Liu, X., Jian, Y., Yang, G., Li, Z.

المصدر: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 69(3):609-619 Mar, 2022

المؤلفون: Li, L., Li, Z., Chen, X., Wu, Y., Zhang, J., Ren, M., Zhang, B., Pang, Y., Wu, X.

المصدر: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 67(9):2062-2072 Sep, 2020

المؤلفون: Li, L., Li, Z., Ren, M., Li, J., Yang, G., Chen, X., Liu, X., Jian, Y., Shi, J.

المصدر: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 67(3):508-517 Mar, 2020

المؤلفون: Li, L., Li, Z.H., Wu, Y.Z., Chen, X.C., Zhang, J.P., Ren, M., Jian, Y., Zhang, B.

المصدر: IEEE Journal of the Electron Devices Society IEEE J. Electron Devices Soc. Electron Devices Society, IEEE Journal of the. 8:1043-1049 2020

المؤلفون: Li, L., Li, Z.-H., Zhang, J.-P., Wu, Y.-Z., Chen, X.-C., Min-Ren, Zhang, B., Jian, Y.

المصدر: IEEE Journal of the Electron Devices Society IEEE J. Electron Devices Soc. Electron Devices Society, IEEE Journal of the. 8:1096-1104 2020

المؤلفون: Wang, Cailin, Cao, Rongrong, Yang, Wuhua, Tian, Qianhui

المصدر: 2019 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) Electron Devices and Solid-State Circuits (EDSSC), 2019 IEEE International Conference on. :1-3 Jun, 2019

Relation: 2019 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC)

المؤلفون: Chen, W., Liu, C., Shi, Y., Liu, Y., Tao, H., Zhou, Q., Li, Z., Zhang, B.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 64(10):4206-4212 Oct, 2017

المؤلفون: Chen, W., Tao, H., Liu, C., Xia, Y., Shi, Y., Liu, Y., Liu, J., Zhou, Q., Li, Z., Zhang, B.

المصدر: IEEE Transactions on Industry Applications IEEE Trans. on Ind. Applicat. Industry Applications, IEEE Transactions on. 54(5):5465-5473 Jan, 2018

المؤلفون: Luther-King, N., Sweet, M., Madathil Sankara Narayanan, E.

المصدر: IEEE Transactions on Power Electronics IEEE Trans. Power Electron. Power Electronics, IEEE Transactions on. 27(6):3072-3080 Jun, 2012

المؤلفون: Lei Li, Ze Hong Li, Yu Zhou Wu, Xiao Chi Chen, Jin Ping Zhang, Min Ren, Yuan Jian, Bo Zhang

المصدر: IEEE Journal of the Electron Devices Society, Vol 8, Pp 1043-1049 (2020)

مصطلحات موضوعية: Anode-short MOS-controlled thyristor, displacement damage, modeling, bipolar devices, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/9201480/; https://doaj.org/toc/2168-6734

URL الوصول: https://doaj.org/article/3c6b46a674e646299f678e151fea3889