المؤلفون: Leurquin, C., Vandendaele, W., Jaud, M., Lavieville, R., Mohamad, B., Masante, C., Despesse, G., Nowak, E.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(5):3123-3129 May, 2024

المؤلفون: Zafar, Saniya, Jangsher, Sobia, Zafar, Adnan

المصدر: 2024 IEEE Wireless Communications and Networking Conference (WCNC) Wireless Communications and Networking Conference (WCNC), 2024 IEEE. :1-6 Apr, 2024

Relation: 2024 IEEE Wireless Communications and Networking Conference (WCNC)

المؤلفون: Pasenkova, Irina

المساهمون: University/Department: Universitat Pompeu Fabra. Departament de Traducció i Ciències del llenguatge

مرشدي الرسالة: Alsina i Keith, Victòria

المصدر: TDX (Tesis Doctorals en Xarxa)

مصطلحات موضوعية: English verbs of speaking, Verbs de parla anglesa, Russian, Rus, English, Anglès, MoSC, CoNS, VoS

وصف الملف: application/pdf

URL الوصول: http://hdl.handle.net/10803/669340

المؤلفون: Leurquin, C., Vandendaele, W., Gwoziecki, R., Mohamad, B., Despesse, G., Iucolano, F., Modica, R., Constant, A.

المصدر: 2023 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2023 IEEE International. :1-6 Mar, 2023

Relation: 2023 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Vandendaele, W., Leurquin, C., Lavieville, R., Jaud, M.A, Viey, A.G., Gwoziecki, R., Mohamad, B., Nowak, E., Constant, A., Iucolano, F.

المصدر: 2023 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2023 IEEE International. :1-8 Mar, 2023

Relation: 2023 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Mohamad, B., Royer, C. Le, Rigaud-Minet, F., Piotrowicz, C., Paes Pinto Rocha, P. Fernandes, Leurquin, C., Vandendaele, W., Escoffier, R., Buckley, J., Becu, S., Biscarrat, J., Gwoziecki, R.

المصدر: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) Electron Devices Technology & Manufacturing Conference (EDTM), 2023 7th IEEE. :1-3 Mar, 2023

Relation: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)

المؤلفون: Le Royer, C., Mohamad, B., Biscarrat, J., Vauche, L., Escoffier, R., Buckley, J., Becu, S., Riat, R., Gillot, C., Charles, M., Ruel, S., Pimenta-Barros, P., Posseme, N., Besson, P., Boudaa, F., Vannuffel, C., Vandendaele, W., Viey, A.G., Krakovinsky, A., Jaud, M.-A., Modica, R., Iucolano, F., Tiec, R. Le, Levi, S., Orsatelli, M., Gwoziecki, R., Sousa, V.

المصدر: 2022 IEEE 34th International Symposium on Power Semiconductor Devices and ICs (ISPSD) Power Semiconductor Devices and ICs (ISPSD), 2022 IEEE 34th International Symposium on. :49-52 May, 2022

Relation: 2022 IEEE 34th International Symposium on Power Semiconductor Devices and ICs (ISPSD)

المؤلفون: Jaud, M.-., Vandendaele, W., Rrustemi, B., Viey, A.G., Martin, S., Le Royer, C., Vauche, L., Martinie, S., Gwoziecki, R., Modica, R., Iucolano, F., Poiroux, T.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 69(2):669-674 Feb, 2022

المؤلفون: Viey, A.G., Vandendaele, W., Jaud, M.-A., Coignus, J., Cluzel, J., Krakovinsky, A., Martin, S., Biscarrat, J., Gwoziecki, R., Sousa, V., Gaillard, F., Modica, R., Iucolano, F., Meneghini, M., Meneghesso, G., Ghibaudo, G.

المصدر: 2021 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2021 IEEE International. :1-8 Mar, 2021

Relation: 2021 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Leurquin, C., Vandendaele, W., Viey, A.G, Gwoziecki, R., Escoffier, R., Salot, R., Despesse, G., Iucolano, F., Modica, R., Constant, A.

المصدر: 2022 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2022 IEEE International. :10B.3-1-10B.3-6 Mar, 2022

Relation: 2022 IEEE International Reliability Physics Symposium (IRPS)