يعرض 1 - 10 نتائج من 2,150 نتيجة بحث عن '"Ma, Xing"', وقت الاستعلام: 1.02s تنقيح النتائج
  1. 1
    مؤتمر
    Condition Monitoring the Inhomogeneous Thermal Fatigue of Multi-chip IGBT Module Based on the Natural Frequency of Thermal Network

    المؤلفون: Zhang, Jun, Shen, Huixian, Sun, Pengju, Ma, Xing

    المصدر: 2024 IEEE 10th International Power Electronics and Motion Control Conference (IPEMC2024-ECCE Asia) Power Electronics and Motion Control Conference (IPEMC2024-ECCE Asia), 2024 IEEE 10th International. :2648-2653 May, 2024

    Relation: 2024 IEEE 10th International Power Electronics and Motion Control Conference (IPEMC2024-ECCE Asia)

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  2. 2
    مؤتمر
    A Semi-Physical Model of SiC MOSFETs for Improved Static Characteristic

    المؤلفون: Liu, Qingsong, Sun, Pengju, Peng, Guoxiu, Ma, Xing

    المصدر: 2024 IEEE 7th International Electrical and Energy Conference (CIEEC) Electrical and Energy Conference (CIEEC), 2024 IEEE 7th International. :1842-1845 May, 2024

    Relation: 2024 IEEE 7th International Electrical and Energy Conference (CIEEC）

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  3. 3
    مؤتمر
    A Gate-Oxide Degradation Monitoring Method of SiC MOSFETs Based on Threshold Voltage Hysteresis

    المؤلفون: Zhou, Xinghao, Sun, Pengju, Peng, Guoxiu, Ma, Xing

    المصدر: 2024 IEEE 7th International Electrical and Energy Conference (CIEEC) Electrical and Energy Conference (CIEEC), 2024 IEEE 7th International. :2809-2812 May, 2024

    Relation: 2024 IEEE 7th International Electrical and Energy Conference (CIEEC）

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  4. 4
    مؤتمر
    Review on the Thermal Parameters Applications in the Reliability of Power Semiconductor Device

    المؤلفون: Shen, Huixian, Zhang, Jun, Sun, Pengju, Ma, Xing

    المصدر: 2024 IEEE 7th International Electrical and Energy Conference (CIEEC) Electrical and Energy Conference (CIEEC), 2024 IEEE 7th International. :4482-4487 May, 2024

    Relation: 2024 IEEE 7th International Electrical and Energy Conference (CIEEC）

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  5. 5
    مؤتمر
    Study on 28NM Technology Node ILD0-CMP Micro_Scratch Defect Reduction

    المؤلفون: Ma, Xing, Wang, Kailin, Yu, Jianwen, Que, Yurong, Li, Hu, Fang, Jingxun, Zhang, Yu

    المصدر: 2024 Conference of Science and Technology for Integrated Circuits (CSTIC) Science and Technology for Integrated Circuits (CSTIC), 2024 Conference of. :1-3 Mar, 2024

    Relation: 2024 Conference of Science and Technology for Integrated Circuits (CSTIC)

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  6. 6
    مؤتمر
    Active and Reactive Power Decoupling Control Strategy for LCC-HVDC Based on Finite Operation Range

    المؤلفون: Duan, Qingxi, Liu, Zhen, Duan, Yu, Ma, Xing, Zhu, Zimin, Li, Zhijie, Wang, Xiaoyun

    المصدر: 2023 2nd Asia Power and Electrical Technology Conference (APET) Asia Power and Electrical Technology Conference (APET), 2023 2nd. :295-298 Dec, 2023

    Relation: 2023 2nd Asia Power and Electrical Technology Conference (APET)

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  7. 7
    مؤتمر
    Reliability Estimation of Power Converter in the Energy Storage System

    المؤلفون: Zhang, Jun, Shen, Huixian, Wang, Zhihuan, Ma, Xing

    المصدر: 2023 IEEE 2nd International Power Electronics and Application Symposium (PEAS) Power Electronics and Application Symposium (PEAS), 2023 IEEE 2nd International. :1860-1863 Nov, 2023

    Relation: 2023 IEEE 2nd International Power Electronics and Application Symposium (PEAS)

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  8. 8
    مؤتمر
    A Gate Voltage Clamping Method to Improve the Short-Circuit Characteristic of SiC MOSFET

    المؤلفون: Ouyang, Wenyuan, Sun, Pengju, Xie, Minghang, Hu, Yingpeng, Ma, Xing

    المصدر: 2023 IEEE 2nd International Power Electronics and Application Symposium (PEAS) Power Electronics and Application Symposium (PEAS), 2023 IEEE 2nd International. :287-292 Nov, 2023

    Relation: 2023 IEEE 2nd International Power Electronics and Application Symposium (PEAS)

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  9. 9
    مؤتمر
    A Novel Time-Sharing Conduction Method for Improving SiC MOSFET Reliability

    المؤلفون: Lan, Yufeng, Sun, Pengju, Li, Qiang, Hu, Yingpeng, Fang, Xinbin, Ma, Xing

    المصدر: 2023 IEEE 2nd International Power Electronics and Application Symposium (PEAS) Power Electronics and Application Symposium (PEAS), 2023 IEEE 2nd International. :1922-1926 Nov, 2023

    Relation: 2023 IEEE 2nd International Power Electronics and Application Symposium (PEAS)

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  10. 10
    مؤتمر
    Impact of Short-Circuit Events on the Threshold Voltage Instability of SiC MOSFETs

    المؤلفون: Li, Kaiwei, Sun, Pengju, Ma, Xing, Huang, Xu, Li, Qiang, Chen, Lan

    المصدر: 2023 IEEE 2nd International Power Electronics and Application Symposium (PEAS) Power Electronics and Application Symposium (PEAS), 2023 IEEE 2nd International. :1874-1878 Nov, 2023

    Relation: 2023 IEEE 2nd International Power Electronics and Application Symposium (PEAS)

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