المؤلفون: Kawashima, T., Murakami, Y., Hozumi, N., Kurimoto, M., Yoshida, S., Umemoto, T., Mabuchi, T., Muto, H.

المصدر: IEEE Transactions on Dielectrics and Electrical Insulation IEEE Trans. Dielect. Electr. Insul. Dielectrics and Electrical Insulation, IEEE Transactions on. 30(6):2642-2649 Dec, 2023

المؤلفون: Takeda, N., Kawashima, T., Kurimoto, M., Murakami, Y., Hozumi, N., Yoshida, S., Umemoto, T., Mabuchi, T., Muto, H.

المصدر: 2020 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) Electrical Insulation and Dielectric Phenomena (CEIDP), 2020 IEEE Conference on. :322-325 Oct, 2020

Relation: 2020 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)

المؤلفون: Muto, H., Yoshida, S., Umemoto, T., Mabuchi, T., Kurimoto, M.

المصدر: 2020 IEEE 3rd International Conference on Dielectrics (ICD) Dielectrics (ICD), 2020 IEEE 3rd International Conference on. :253-256 Jul, 2020

Relation: 2020 IEEE 3rd International Conference on Dielectrics (ICD)

المؤلفون: Kurimoto, M., Yoshida, S., Umemoto, T., Mabuchi, T., Muto, H.

المصدر: 2020 IEEE 3rd International Conference on Dielectrics (ICD) Dielectrics (ICD), 2020 IEEE 3rd International Conference on. :65-68 Jul, 2020

Relation: 2020 IEEE 3rd International Conference on Dielectrics (ICD)

المؤلفون: Kodama, N., Yamada, D., Kawashima, T., Hozumi, N., Murakami, Y., Yoshida, S., Umemoto, T., Mabuchi, T., Muto, H.

المصدر: 2019 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) Electrical Insulation and Dielectric Phenomena (CEIDP), 2019 IEEE Conference on. :118-121 Oct, 2019

Relation: 2019 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)

المؤلفون: Kawashima, T., Matin, Totoh Abdul, Murakami, Y., Hozumi, N., Yoshida, S., Umemoto, T., Mabuchi, T., Muto, H.

المصدر: 2019 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) Electrical Insulation and Dielectric Phenomena (CEIDP), 2019 IEEE Conference on. :373-376 Oct, 2019

Relation: 2019 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)

المؤلفون: Kurimoto, M., Yoshida, S., Umemoto, T., Mabuchi, T., Muto, H.

المصدر: 2019 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) Electrical Insulation and Dielectric Phenomena (CEIDP), 2019 IEEE Conference on. :360-363 Oct, 2019

Relation: 2019 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)

المؤلفون: Nakauchi, M., Mabuchi, T., Kinefuchi, I., Takeuchi, H., Tokumasu, T.

المصدر: 2016 IEEE 16th International Conference on Nanotechnology (IEEE-NANO) Nanotechnology (IEEE-NANO), 2016 IEEE 16th International Conference on. :218-221 Aug, 2016

Relation: 2016 IEEE 16th International Conference on Nanotechnology (IEEE-NANO)

المؤلفون: Riveira-Munoz, E, He, SM, Escaramis, G, Stuart, PE, Huffmeier, U, Lee, C, Kirby, B, Oka, A, Giardina, E, Liao, W, Bergboer, J, Kainu, K, de Cid, R, Munkhbat, B, Zeeuwen, PLJM, Armour, JAL, Poon, A, Mabuchi, T, Ozawa, A, Zawirska, A, Burden, AD, Barker, JN, Capon, F, Traupe, H, Sun, LD, Cui, Y, Yin, XY, Chen, G, Lim, HW, Nair, RP, Voorhees, JJ, Tejasvi, T, Pujol, R, Munkhtuvshin, N, Fischer, J, Kere, J, Schalkwijk, J, Bowcock, AM, Kwok, PY, Novelli, G, Inoko, H, Ryan, AW, Trembath, RC, Reis, A, Zhang, XJ, Elder, JT, Estivill, X

المصدر: The Journal of investigative dermatology. 131(5):1105-1109

مصطلحات موضوعية: Medicin och hälsovetenskap

URL الوصول: http://kipublications.ki.se/Default.aspx?queryparsed=id:122434429

المؤلفون: Osa, Y., Mabuchi, T., Uchikado, S.

المصدر: ISIE 2001. 2001 IEEE International Symposium on Industrial Electronics Proceedings (Cat. No.01TH8570) Industrial electronics - South Korea Industrial Electronics, 2001. Proceedings. ISIE 2001. IEEE International Symposium on. 1:58-63 vol.1 2001

Relation: ISIE 2001. 2001 IEEE International Symposium on Industrial Electronics Proceedings