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1دورية أكاديمية
المؤلفون: Mads Brincker, Peter Karlsen, Esben Skovsen, Thomas Søndergaard
المصدر: AIP Advances, Vol 6, Iss 2, Pp 025015-025015-6 (2016)
وصف الملف: electronic resource
Relation: https://doaj.org/toc/2158-3226
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المصدر: Brincker, M, Pedersen, K B, Kristensen, P K & Popok, V 2018, ' Comparative study of Al metallization degradation in power diodes under passive and active thermal cycling ', IEEE Transactions on Components, Packaging and Manufacturing Technology, vol. 8, no. 12, 8506441, pp. 2073-2080 . https://doi.org/10.1109/TCPMT.2018.2877845
مصطلحات موضوعية: 010302 applied physics, Materials science, business.industry, 020208 electrical & electronic engineering, 02 engineering and technology, Semiconductor device, Temperature cycling, 01 natural sciences, Industrial and Manufacturing Engineering, Electronic, Optical and Magnetic Materials, Corrosion, power semiconductor devices, Semiconductor device metallization, Reliability (semiconductor), Semiconductor, environmental factors, semiconductor device reliability, 0103 physical sciences, Thermal, 0202 electrical engineering, electronic engineering, information engineering, Optoelectronics, Degradation (geology), Electrical and Electronic Engineering, business, Diode
وصف الملف: application/pdf
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المصدر: Brincker, M, Sand, H M B & Nielsen, M S 2021, ' Gating window correction for users combining Varian RPM and TrueBeam for gated radiotherapy ', The NACP 2020/21 Symposium, 11/04/2021-13/04/2021 .
Aalborg UniversityURL الوصول: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::384bedc5d3e5197967d494467993ea2d
https://vbn.aau.dk/da/publications/4c55b6e0-455c-473e-8049-a2c012c129ce -
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المؤلفون: Mads Brincker, S. Söhl, Ronald Eisele, Vladimir Popok, Peter Kristensen
المصدر: Microelectronics Reliability. :774-778
مصطلحات موضوعية: Void (astronomy), Fabrication, Materials science, Bond strength, 020208 electrical & electronic engineering, Intermetallic, 02 engineering and technology, 021001 nanoscience & nanotechnology, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, law.invention, Metal, Optical microscope, law, Soldering, visual_art, Homogeneity (physics), 0202 electrical engineering, electronic engineering, information engineering, visual_art.visual_art_medium, Electrical and Electronic Engineering, Composite material, 0210 nano-technology, Safety, Risk, Reliability and Quality
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المؤلفون: Thomas Walter, Peter Kristensen, Vladimir Popok, Mads Brincker
المصدر: Brincker, M, Walter, T, Kristensen, P K & Popok, V 2018, ' Thermo-mechanically induced texture evolution and micro-structural change of aluminum metallization ', Journal of Materials Science: Materials in Electronics, vol. 29, no. 5, pp. 3898-3904 . https://doi.org/10.1007/s10854-017-8328-x
مصطلحات موضوعية: 010302 applied physics, Materials science, business.industry, 02 engineering and technology, Temperature cycling, 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Atomic and Molecular Physics, and Optics, Thermal expansion, Electronic, Optical and Magnetic Materials, Stress (mechanics), Semiconductor, 0103 physical sciences, Ultimate tensile strength, Surface roughness, Texture (crystalline), Electrical and Electronic Engineering, Composite material, 0210 nano-technology, business, Electron backscatter diffraction
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المؤلفون: Stefan Söhl, Vladimir Popok, Mads Brincker, Ronald Eisele
المصدر: Microelectronics Reliability. :378-382
مصطلحات موضوعية: 010302 applied physics, Materials science, Fabrication, Intermetallic, 02 engineering and technology, Temperature cycling, 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, law.invention, Optical microscope, law, Soldering, 0103 physical sciences, Homogeneity (physics), Thermal, Electronic engineering, Electronics, Electrical and Electronic Engineering, Composite material, 0210 nano-technology, Safety, Risk, Reliability and Quality
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المصدر: Microelectronics Reliability. 64:489-493
مصطلحات موضوعية: 010302 applied physics, Chemistry, Scanning electron microscope, Nanotechnology, 02 engineering and technology, Temperature cycling, 021001 nanoscience & nanotechnology, Condensed Matter Physics, Microstructure, 01 natural sciences, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, 0103 physical sciences, Degradation (geology), Texture (crystalline), Electrical and Electronic Engineering, Thin film, Composite material, 0210 nano-technology, Safety, Risk, Reliability and Quality, Sheet resistance, Electron backscatter diffraction
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المؤلفون: Esben Skovsen, Kjeld Møller Pedersen, Mads Brincker
المصدر: Brincker, M, Pedersen, K & Skovsen, E 2015, ' Tunable local excitation of surface plasmon polaritons by sum-frequency generation in ZnO nanowires ', Optics Communications, vol. 356, pp. 109-112 . https://doi.org/10.1016/j.optcom.2015.07.066
مصطلحات موضوعية: Sum-frequency generation, Materials science, business.industry, Nanowire, Plasmonic Circuitry, Surface plasmon polariton, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, Wavelength, Optics, Optoelectronics, Electrical and Electronic Engineering, Physical and Theoretical Chemistry, business, Spectroscopy, Plasmon, Excitation
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المصدر: Microelectronics Reliability. 55:1988-1991
مصطلحات موضوعية: Materials science, Temperature cycling, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Corrosion, Stress (mechanics), Power cycling, Forensic engineering, Electrical and Electronic Engineering, Composite material, Electric current, Current (fluid), Safety, Risk, Reliability and Quality, Sheet resistance, Diode
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المؤلفون: Mads Brincker, Thomas Søndergaard, Esben Skovsen
المصدر: Søndergaard, T, Brincker, M & Skovsen, E 2016, Theoretical analysis of microstructured gradient-index lens for THz photonics using Greens function integral equation methods . in 2016 41st International Conference on Infrared, Millimeter, and Terahertz waves (IRMMW-THz) . IEEE, 2016 41st International Conference on Infrared, Millimeter, and Terahertz waves (IRMMW-THz), Copenhagen, Denmark, 25/09/2016 . https://doi.org/10.1109/IRMMW-THz.2016.7758624
مصطلحات موضوعية: Surface (mathematics), Materials science, Terahertz radiation, business.industry, Physics::Optics, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Integral equation, Magnetic field, law.invention, 010309 optics, Lens (optics), Condensed Matter::Materials Science, Semiconductor, Optics, Etching (microfabrication), law, 0103 physical sciences, Optoelectronics, Photonics, 0210 nano-technology, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a3f9c642fbab9fbd74cad1be683a5113
https://doi.org/10.1109/irmmw-thz.2016.7758624