-
1مؤتمر
المؤلفون: Rachidi, S., Ramesh, S., Tierno, D., Donadio, G. L., Pacco, A., Maes, J. W., Jeong, Y., Arreghini, A., Van Den Bosch, G., Rosmeulen, M.
المصدر: 2024 IEEE International Memory Workshop (IMW) Memory Workshop (IMW), 2024 IEEE International. :1-4 May, 2024
Relation: 2024 IEEE International Memory Workshop (IMW)
-
2مؤتمر
المؤلفون: Arimura, H., Franco, J., Ragnarsson, L.-A., Vandooren, A., Brus, S., Maqsood, W., Conard, T., Verni, G. Alessio, Maes, J. W., Kannan, B., Givens, M., Horiguchi, N.
المصدر: 2024 IEEE Silicon Nanoelectronics Workshop (SNW) Silicon Nanoelectronics Workshop (SNW), 2024 IEEE. :47-48 Jun, 2024
Relation: 2024 IEEE Silicon Nanoelectronics Workshop (SNW)
-
3مؤتمر
المؤلفون: van der Veen, Marleen H., Maes, J. W., Pedreira, O. Varela, Zhu, C., Tierno, D., Datta, S., Jourdan, N., Decoster, S., Wu, C., Mousa, M., Byun, Y., Struyf, H., Park, S., Tokei, Z.
المصدر: 2023 IEEE International Interconnect Technology Conference (IITC) and IEEE Materials for Advanced Metallization Conference (MAM)(IITC/MAM) Advanced Metallization Conference (MAM)(IITC/MAM), 2023 IEEE International Interconnect Technology Conference (IITC) and IEEE Materials for. :1-3 May, 2023
Relation: 2023 IEEE International Interconnect Technology Conference (IITC) and IEEE Materials for Advanced Metallization Conference (MAM)(IITC/MAM)
-
4مؤتمر
المؤلفون: Arimura, H., Brus, S., Franco, J., Oniki, Y., Vandooren, A., Conard, T., Chan, B.-T., Kannan, B., Samiee, M., Li, W., Deminskyi, P., Shero, E., Bakke, J., Jourdan, N., Verni, G. Alessio, Maes, J. W., Givens, M., Ragnarsson, L.-A., Mitard, J., Litta, E. Dentoni, Horiguchi, N.
المصدر: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2023 IEEE Symposium on. :1-2 Jun, 2023
Relation: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)
-
5مؤتمر
المؤلفون: Gupta, A., Radisic, D., Maes, J. W., Pedreira, O. Varela, Soulie, J-P., Jourdan, N., Mertens, H., Bandyopadhyay, S., Le, Q. T., Pacco, A., Heylen, N., Vandersmissen, K., Devriendt, K., Zhu, C., Datta, S., Sebaai, F., Wang, S., Mousa, M., Lee, J., Geypen, J., De Wachter, B., Chehab, B., Salahuddin, S. M., Murdoch, G., Biesemans, S., Tokei, Zs., Litta, E. Dentoni, Horiguchi, N.
المصدر: 2021 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2021 IEEE International. :22.5.1-22.5.4 Dec, 2021
Relation: 2021 IEEE International Electron Devices Meeting (IEDM)
-
6مؤتمر
المؤلفون: Sioncke, S., Franco, J., Vais, A., Putcha, V., Nyns, L., Sibaja-Hernandez, A., Rooyackers, R., Ardila, S. Calderon, Spampinato, V., Franquet, A., Maes, J. W., Xie, Q., Givens, M., Tang, F., Jiang, X., Heyns, M., Linten, D., Mitard, J., Thean, A., Mocuta, D., Collaert, N.
المصدر: 2017 Symposium on VLSI Technology VLSI Technology, 2017 Symposium on. :T38-T39 Jun, 2017
Relation: 2017 Symposium on VLSI Technology
-
7مؤتمر
المؤلفون: Zhou, X., Waldron, N., Boccardi, G., Sebaai, F., Merckling, C., Eneman, G., Sioncke, S., Nyns, L., Opdebeeck, A., Maes, J. W., Xie, Q., Givens, M., Tang, F., Jiang, X., Guo, W., Kunert, B., Teugels, L., Devriendt, K., Hernandez, A. Sibaja, Franco, J., van Dorp, D., Barla, K., Collaert, N., Thean, A. V-Y.
المصدر: 2016 IEEE Symposium on VLSI Technology VLSI Technology, 2016 IEEE Symposium on. :1-2 Jun, 2016
Relation: 2016 IEEE Symposium on VLSI Technology
-
8مؤتمر
المؤلفون: Arimura, H., Cott, D., Loo, R., Vanherle, W., Xie, Q., Tang, F., Jiang, X., Franco, J., Sioncke, S., Ragnarsson, L.-A., Chiu, E., Lu, X., Geypen, J., Bender, H., Maes, J. W., Givens, M., Sibaja-Hernandez, A., Wostyn, K., Boccardi, G., Mitard, J., Collaert, N., Mocuta, D.
المصدر: 2016 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2016 IEEE International. :33.4.1-33.4.4 Dec, 2016
Relation: 2016 IEEE International Electron Devices Meeting (IEDM)
-
9دورية أكاديمية
المؤلفون: VAES, B., VAN HOECKE, L., ALLAERT, S., MAES, J.-W., FRANÇOIS, J., POELAERT, J., LAPAGE, K.
المصدر: Acta Anaesthesiologica Belgica; May2024, Vol. 75 Issue 2, p107-115, 9p
-
10دورية أكاديمية
المؤلفون: Chang, V. S., Ragnarsson, L.-A., Yu, H. Y., Aoulaiche, M., Conard, T., Yin, K., Schram, T., Maes, J. W., De Gendt, S., Biesemans, S.
المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 54(10):2738-2749 Oct, 2007