المؤلفون: Rachidi, S., Ramesh, S., Tierno, D., Donadio, G. L., Pacco, A., Maes, J. W., Jeong, Y., Arreghini, A., Van Den Bosch, G., Rosmeulen, M.

المصدر: 2024 IEEE International Memory Workshop (IMW) Memory Workshop (IMW), 2024 IEEE International. :1-4 May, 2024

Relation: 2024 IEEE International Memory Workshop (IMW)

المؤلفون: Arimura, H., Franco, J., Ragnarsson, L.-A., Vandooren, A., Brus, S., Maqsood, W., Conard, T., Verni, G. Alessio, Maes, J. W., Kannan, B., Givens, M., Horiguchi, N.

المصدر: 2024 IEEE Silicon Nanoelectronics Workshop (SNW) Silicon Nanoelectronics Workshop (SNW), 2024 IEEE. :47-48 Jun, 2024

Relation: 2024 IEEE Silicon Nanoelectronics Workshop (SNW)

المؤلفون: van der Veen, Marleen H., Maes, J. W., Pedreira, O. Varela, Zhu, C., Tierno, D., Datta, S., Jourdan, N., Decoster, S., Wu, C., Mousa, M., Byun, Y., Struyf, H., Park, S., Tokei, Z.

المصدر: 2023 IEEE International Interconnect Technology Conference (IITC) and IEEE Materials for Advanced Metallization Conference (MAM)(IITC/MAM) Advanced Metallization Conference (MAM)(IITC/MAM), 2023 IEEE International Interconnect Technology Conference (IITC) and IEEE Materials for. :1-3 May, 2023

Relation: 2023 IEEE International Interconnect Technology Conference (IITC) and IEEE Materials for Advanced Metallization Conference (MAM)(IITC/MAM)

المؤلفون: Arimura, H., Brus, S., Franco, J., Oniki, Y., Vandooren, A., Conard, T., Chan, B.-T., Kannan, B., Samiee, M., Li, W., Deminskyi, P., Shero, E., Bakke, J., Jourdan, N., Verni, G. Alessio, Maes, J. W., Givens, M., Ragnarsson, L.-A., Mitard, J., Litta, E. Dentoni, Horiguchi, N.

المصدر: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2023 IEEE Symposium on. :1-2 Jun, 2023

Relation: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)

المؤلفون: Gupta, A., Radisic, D., Maes, J. W., Pedreira, O. Varela, Soulie, J-P., Jourdan, N., Mertens, H., Bandyopadhyay, S., Le, Q. T., Pacco, A., Heylen, N., Vandersmissen, K., Devriendt, K., Zhu, C., Datta, S., Sebaai, F., Wang, S., Mousa, M., Lee, J., Geypen, J., De Wachter, B., Chehab, B., Salahuddin, S. M., Murdoch, G., Biesemans, S., Tokei, Zs., Litta, E. Dentoni, Horiguchi, N.

المصدر: 2021 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2021 IEEE International. :22.5.1-22.5.4 Dec, 2021

Relation: 2021 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Sioncke, S., Franco, J., Vais, A., Putcha, V., Nyns, L., Sibaja-Hernandez, A., Rooyackers, R., Ardila, S. Calderon, Spampinato, V., Franquet, A., Maes, J. W., Xie, Q., Givens, M., Tang, F., Jiang, X., Heyns, M., Linten, D., Mitard, J., Thean, A., Mocuta, D., Collaert, N.

المصدر: 2017 Symposium on VLSI Technology VLSI Technology, 2017 Symposium on. :T38-T39 Jun, 2017

Relation: 2017 Symposium on VLSI Technology

المؤلفون: Zhou, X., Waldron, N., Boccardi, G., Sebaai, F., Merckling, C., Eneman, G., Sioncke, S., Nyns, L., Opdebeeck, A., Maes, J. W., Xie, Q., Givens, M., Tang, F., Jiang, X., Guo, W., Kunert, B., Teugels, L., Devriendt, K., Hernandez, A. Sibaja, Franco, J., van Dorp, D., Barla, K., Collaert, N., Thean, A. V-Y.

المصدر: 2016 IEEE Symposium on VLSI Technology VLSI Technology, 2016 IEEE Symposium on. :1-2 Jun, 2016

Relation: 2016 IEEE Symposium on VLSI Technology

المؤلفون: Arimura, H., Cott, D., Loo, R., Vanherle, W., Xie, Q., Tang, F., Jiang, X., Franco, J., Sioncke, S., Ragnarsson, L.-A., Chiu, E., Lu, X., Geypen, J., Bender, H., Maes, J. W., Givens, M., Sibaja-Hernandez, A., Wostyn, K., Boccardi, G., Mitard, J., Collaert, N., Mocuta, D.

المصدر: 2016 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2016 IEEE International. :33.4.1-33.4.4 Dec, 2016

Relation: 2016 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: VAES, B., VAN HOECKE, L., ALLAERT, S., MAES, J.-W., FRANÇOIS, J., POELAERT, J., LAPAGE, K.

المصدر: Acta Anaesthesiologica Belgica; May2024, Vol. 75 Issue 2, p107-115, 9p

المؤلفون: Chang, V. S., Ragnarsson, L.-A., Yu, H. Y., Aoulaiche, M., Conard, T., Yin, K., Schram, T., Maes, J. W., De Gendt, S., Biesemans, S.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 54(10):2738-2749 Oct, 2007