المؤلفون: Barraud, S., Casse, M., Gaben, L., Nguyen, P., Hartmann, J. M., Samson, M. P., Maffini-Alvaro, V., Tabone, C., Vizioz, C., Arvet, C., Pimenta-Barros, P., Glowacki, F., Bernier, N., Rozeau, O., Jaud, M. A., Martinie, S., Laccord, J., Allain, F., De Salvo, B., Vinet, M.

المصدر: 2015 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), 2015 IEEE. :1-3 Oct, 2015

Relation: 2015 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)

المؤلفون: Coquand, R., Barraud, S., Casse, M., Koyama, M., Maffini-Alvaro, V., Samson, M.-P., Tosti, L., Mescot, X., Ghibaudo, G., Monfray, S., Boeuf, F., Faynot, O., De Salvo, B.

المصدر: 2013 Proceedings of the European Solid-State Device Research Conference (ESSDERC) Solid-State Device Research Conference (ESSDERC), 2013 Proceedings of the European. :198-201 Sep, 2013

Relation: ESSDERC 2013 - 43rd European Solid State Device Research Conference

المؤلفون: Coquand, R., Barraud, S., Casse, M., Leroux, P., Vizioz, C., Comboroure, C., Perreau, P., Ernst, E., Samson, M.-P., Maffini-Alvaro, V., Tabone, C., Barnola, S., Munteanu, D., Ghibaudo, G., Monfray, S., Boeuf, F., Poiroux, T.

المصدر: 2012 13th International Conference on Ultimate Integration on Silicon (ULIS) Ultimate Integration on Silicon (ULIS), 2012 13th International Conference on. :37-40 Mar, 2012

Relation: 2012 13th International Conference on Ultimate Integration on Silicon (ULIS)

المؤلفون: Tachi, K., Vulliet, N., Barraud, S., Guillaumot, B., Maffini-Alvaro, V., Vizioz, C., Arvet, C., Campidelli, Y., Gautier, P., Hartmann, J.M., Skotnicki, T., Cristoloveanu, S., Iwai, H., Faynot, O., Ernst, T.

المصدر: 2010 Proceedings of the European Solid State Device Research Conference Solid-State Device Research Conference (ESSDERC), 2010 Proceedings of the European. :368-371 Sep, 2010

Relation: ESSDERC 2010 - 40th European Solid State Device Research Conference

المؤلفون: Barraud, S., Hartmann, J.-M., Maffini-Alvaro, V., Tosti, L., Delaye, V., Lafond, D.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 61(4):953-956 Apr, 2014

المؤلفون: Coquand, R., Casse, M., Barraud, S., Cooper, D., Maffini-Alvaro, V., Samson, M.-P., Monfray, S., Boeuf, F., Ghibaudo, G., Faynot, O., Poiroux, T.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 60(2):727-732 Feb, 2013

المؤلفون: Barraud, S., Lapras, V., Samson, M.P., Gaben, L., Grenouillet, L., Maffini-Alvaro, V., Morand, Y., Daranlot, J., Rambal, N., Previtalli, B., Reboh, S., Tabone, C., Coquand, R., Augendre, E., Rozeau, O., Hartmann, J. M., Vizioz, C., Arvet, C., Pimenta-Barros, P., Posseme, N., Loup, V., Comboroure, C., Euvrard, C., Balan, V., Tinti, I., Audoit, G., Bernier, N., Cooper, D., Saghi, Z., Allain, F., Toffoli, A., Faynot, O., Vinet, M.

المصدر: 2016 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2016 IEEE International. :17.6.1-17.6.4 Dec, 2016

Relation: 2016 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Nguyen, P., Barraud, S., Koyama, M., Casse, M., Andrieu, F., Tabone, C., Glowacki, F., Hartmann, J.-M., Maffini-Alvaro, V., Rouchon, D., Bernier, N., Lafond, D., Samson, M.-P., Allain, F., Vizioz, C., Delprat, D., Nguyen, B.-Y., Mazure, C., Faynot, O., Vinet, M.

المصدر: 2014 SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), 2014 IEEE. :1-2 Oct, 2014

Relation: 2014 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)

المؤلفون: Barraud, S., Coquand, R., Hartmann, J.-M., Maffini-Alvaro, V., Samson, M.-P., Tosti, L., Allain, F.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 34(9):1103-1105 Sep, 2013

المؤلفون: Barraud, S., Coquand, R., Casse, M., Koyama, M., Hartmann, J.-M., Maffini-Alvaro, V., Comboroure, C., Vizioz, C., Aussenac, F., Faynot, O., Poiroux, T.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 33(11):1526-1528 Nov, 2012