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1مؤتمر
المؤلفون: Li, S. W., Chan, Y. C., Hsu, C. H., Yang, S. Y., Liao, K. Y., Ho, C. H., Chen, C. Y., Chen, H. P., Lee, M. H., Magyari-Kope, B., Yun, W. S., Lee, T. Y., Radu, I., Huang, J. Z., Wu, C. I., Shue, Winston, Cao, Min
المصدر: 2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :i-iv Dec, 2023
Relation: 2023 International Electron Devices Meeting (IEDM)
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2مؤتمر
المؤلفون: Wu, J., Magyari-Kope, B.
المصدر: 2021 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) Simulation of Semiconductor Processes and Devices (SISPAD), 2021 International Conference on. :48-51 Sep, 2021
Relation: 2021 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)
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3مؤتمر
المؤلفون: Li, L., Agrawal, M., Yeh, S. Y., Lam, K. T., Wu, J., Magyari-Kope, B.
المصدر: 2022 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2022 International. :15.6.1-15.6.4 Dec, 2022
Relation: 2022 IEEE International Electron Devices Meeting (IEDM)
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4دورية أكاديمية
المؤلفون: Tsai, Y., Magyari-Kope, B., Li, Y., Samukawa, S., Nishi, Y., Sze, S.M.
المصدر: IEEE Journal of the Electron Devices Society IEEE J. Electron Devices Soc. Electron Devices Society, IEEE Journal of the. 7:322-328 2019
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5دورية أكاديمية
المؤلفون: Traore, B., Blaise, P., Sklenard, B., Vianello, E., Magyari-Kope, B., Nishi, Y.
المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 65(2):507-513 Feb, 2018
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6مؤتمر
المؤلفون: Pirrotta, O., Padovani, A., Larcher, L., Zhao, L., Magyari-Kope, B., Nishi, Y.
المصدر: 2014 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) Simulation of Semiconductor Processes and Devices (SISPAD), 2014 International Conference on. :37-40 Sep, 2014
Relation: 2014 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)
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7مؤتمر
المؤلفون: Shiraishi, K., Yang, M.Y., Kamiya, K., Magyari-Kope, B., Niwa, Masaaki, Nishi, Yoshio
المصدر: 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology Solid-State and Integrated Circuit Technology (ICSICT), 2012 IEEE 11th International Conference on. :1-4 Oct, 2012
Relation: 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology (ICSICT)
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8مؤتمر
المؤلفون: Shiraishi, K., Yamaguchi, K., Yang, M., Park, S. G., Kamiya, K., Shigeta, Y., Magyari-Kope, B., Niwa, M., Nishi, Y.
المصدر: 2012 28th International Conference on Microelectronics Proceedings Microelectronics (MIEL), 2012 28th International Conference on. :65-70 May, 2012
Relation: 2012 28th International Conference on Microelectronics (MIEL 2012)
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9دورية أكاديمية
المؤلفون: Kamiya, K., Yang, M. Y., Magyari-Kope, B., Niwa, M., Nishi, Y., Shiraishi, K.
المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 60(10):3400-3406 Oct, 2013
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10دورية أكاديمية
المؤلفون: Kobayashi, M., Irisawa, T., Magyari-Kope, B., Saraswat, K., Wong, H.-S. P., Nishi, Y.
المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 57(5):1037-1046 May, 2010