المؤلفون: Pang, L.-L., Zhou, H.-Q., Zhang, Y.-X., Zhuang, W.-T., Pang, F., Chen, L.-J., Liao, J., Huang, Y.-H., Mao, T.-Q., Mai, Z.-H., Zhang, L., Fang, W.-F.

المصدر: In ESMO Open June 2024 9(6)

المؤلفون: Rivai, F., Chen, C. Q., Ng, P. T., Tan, P. K., Tan, H., Ma, Y., Mai, Z. H., Lam, J.

المصدر: 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2017 IEEE 24th International Symposium on the. :1-5 Jul, 2017

Relation: 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

المؤلفون: Chen, C. Q., Ang, G. B., Ng, P. T., Rivai, Francis, Nagalingam, D., Ng, H. P., Yip, K. H., Lam, J., Mai, Z. H.

المصدر: 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2017 IEEE 24th International Symposium on the. :1-4 Jul, 2017

Relation: 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

المؤلفون: Nagalingam, D., Moon, S., Quah, A. C. T., Ng, P. T., Ting, S. L., Alag, J. Cuevas, Ang, G. B., Mai, Z. H., Lam, J. C.

المصدر: 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2017 IEEE 24th International Symposium on the. :1-6 Jul, 2017

Relation: 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

المؤلفون: Xu, N. Y., Teo, Angela, Ng, H. P., Ang, G. B., Chen, C. Q., Jerome, A., Mai, Z. H., Lam, J.

المصدر: 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2017 IEEE 24th International Symposium on the. :1-4 Jul, 2017

Relation: 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

المؤلفون: Seungje, Moon, Nagalingam, D., Quah, A. C. T., Ang, G. B., Ng, H. P., Teo, Angela, Xu, N. Y., Mai, Z. H., Lam, J.

المصدر: 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2016 IEEE 23rd International Symposium on the. :11-16 Jul, 2016

Relation: 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

المؤلفون: Chen, C. Q., Ng, P. T., Rivai, Francis, Ma, Y. Z., Tan, P. K., Tan, H., Lam, Jeffery, Mai, Z. H.

المصدر: 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2016 IEEE 23rd International Symposium on the. :60-63 Jul, 2016

Relation: 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

المؤلفون: Ng, H. P., Xu, N. Y., Teo, Angela, Ang, G. B., Quah, A. C. T., Dayanand, Chen, C. Q., Mai, Z. H., Lam, J.

المصدر: 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2016 IEEE 23rd International Symposium on the. :414-417 Jul, 2016

Relation: 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

المؤلفون: Ng, P. T., Chen, C. Q., Ang, G. B., Quah, C. T., Ng, H. P., Yip, K. H., Mai, Z. H., Lam, J.

المصدر: 2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits Physical and Failure Analysis of Integrated Circuits (IPFA), 2015 IEEE 22nd International Symposium on the. :238-241 Jun, 2015

Relation: 2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

المؤلفون: Feng, H., Tan, P. K., Yap, H. H., Low, G. R., He, R., Zhao, Y. Z., Liu, B., Dawood, M. K., Zhu, J., Huang, Y. M., Wang, D. D., Tan, H., Lam, J., Mai, Z. H.

المصدر: 2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits Physical and Failure Analysis of Integrated Circuits (IPFA), 2015 IEEE 22nd International Symposium on the. :459-464 Jun, 2015

Relation: 2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)