المؤلفون: Curran, Brian W., Eisen, Lee E., Schwarz, Eric M., Mak, Pak-kin, Warnock, James, Meaney, Patrick J., Fee, Michael

المصدر: IEEE Micro Micro, IEEE. 31(2):26-40 Apr, 2011

المؤلفون: Lundin, Per^Aff1_3

المساهمون: Lundin, Per^AffID1

المصدر: Computers in Swedish Society : Documenting Early Use and Trends. :59-95

المساهمون: Banks, Michael A.

المصدر: On the Way to the Web : The Secret History of the Internet and its Founders. :15-24

المؤلفون: Elisabetta Mori

المصدر: IEEE Annals of the History of Computing. 42:24-38

مصطلحات موضوعية: Engineering, Focus (computing), General Computer Science, business.industry, First language, 05 social sciences, 050905 science studies, Sign system, Visual arts, Visual language, History and Philosophy of Science, Industrial design, Mainframe computer, Semiotics, 0509 other social sciences, business, History of computing

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::d879873dcc583d3e066ee2e582388a2a
https://doi.org/10.1109/mahc.2020.3027581

المؤلفون: Bodkin, Ronald G.^Aff2

المساهمون: Slottje, Daniel J., editor^Aff1

المصدر: Advances in Econometrics, Income Distribution and Scientific Methodology : Essays in Honor of Camilo Dagum. :41-60

المؤلفون: Ward, John, Cowley, Paul^Aff3

المساهمون: Lautenschlager, Michael, editor^Aff1, Reinke, Manfred, editor^Aff2

المصدر: Climate and Environmental Database Systems. 386:73-85

المؤلفون: Walter, David^Aff1, Kerridge, Jon^Aff1

المساهمون: Goos, Gerhard, editor, Hartmanis, Juris, editor, Gentzsch, Wolfgang, editor, Harms, Uwe, editor

المصدر: High-Performance Computing and Networking : International Conference and Exhibition Munich, Germany, April 18–20, 1994 Proceedings, Volume I: Applications. 796:435-440

المؤلفون: Punter, P. H.

المساهمون: Piggott, J. R., editor^Aff1, Paterson, A., editor^Aff1

المصدر: Understanding Natural Flavors. :97-112

المؤلفون: Chandler, Alfred D., Jr

المساهمون: Thomson, Ross, editor^Aff1

المصدر: Learning and Technological Change. :24-39

المؤلفون: Landzberg, Abraham H.^Aff1

المساهمون: Landzberg, Abraham H., editor

المصدر: Microelectronics Manufacturing Diagnostics Handbook. :1-8