المؤلفون: Sasano, M., Hayashi, M., Azuma, T., Makita, T., Konishi, R., Yanagawa, Y.

المصدر: 2022 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC) Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2022 IEEE. :1-2 Nov, 2022

Relation: 2022 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC)

المؤلفون: Takenaka, T., Ishihara, K., Roppongi, M., Miao, Y., Mizukami, Y., Makita, T., Tsurumi, J., Watanabe, S., Takeya, J., Yamashita, M., Torizuka, K., Uwatoko, Y., Sasaki, T., Huang, X., Xu, W., Zhu, D., Su, N., Cheng, J. -G., Shibauchi, T., Hashimoto, K.

المصدر: Science Advances 7, eabf3996 (2021)

مصطلحات موضوعية: Condensed Matter - Strongly Correlated Electrons, Condensed Matter - Superconductivity

URL الوصول: http://arxiv.org/abs/2103.15607

المؤلفون: Azuma, N., Makita, T., Ueyama, S., Nagata, M., Takahashi, S., Murakami, M., Hori, K., Tanaka, S., Yamaguchi, M.

المصدر: 2013 IEEE International Test Conference (ITC) Test Conference (ITC), 2013 IEEE International. :1-9 Sep, 2013

Relation: 2013 IEEE International Test Conference (ITC)

المؤلفون: Makita, T., Ohyama, R., Fukumoto, M.

المصدر: Annual Report Conference on Electrical Insulation and Dielectric Phenomena Electrical insulation and dielectric phenomena Electrical Insulation and Dielectric Phenomena, 2002 Annual Report Conference on. :192-195 2002

Relation: 2002 IEEE Conference on Electrical Insulation and Dielectric Phenomena

المؤلفون: Kobayashi, M., Makita, T., Matsui, S., Koyama, M., Fujii, N., Hatono, I., Ueda, K.

المصدر: 2001 IEEE International Symposium on Semiconductor Manufacturing. ISSM 2001. Conference Proceedings (Cat. No.01CH37203) Semiconductor manufacturing Semiconductor Manufacturing Symposium, 2001 IEEE International. :381-384 2001

Relation: 2001 IEEE International Symposium on Semiconductor Manufacturing. ISSM 2001. Conference Proceedings

المؤلفون: Makita, T., Tamai, I., Seki, S.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 58(3):709-715 Mar, 2011

المؤلفون: Akashi, T., Chikai, T., Hamano, T., Yoshida, A., Honma, S., Aoki, H., Miyata, M., Ezawa, K., Makita, T., Miyaoka, M.

المصدر: Twenty First IEEE/CPMT International Electronics Manufacturing Technology Symposium Proceedings 1997 IEMT Symposium Electronics manufacturing technology Electronics Manufacturing Technology Symposium, 1997., Twenty-First IEEE/CPMT International. :319-325 1997

Relation: Twenty First IEEE/CPMT International Electronics Manufacturing Technology Symposium Proceedings 1997 IEMT Symposium

المؤلفون: Yuuki, A., Yamamuka, M., Makita, T., Horikawa, T., Shibano, T., Hirano, N., Maeda, H., Mikami, N., Ono, K., Ogata, H., Abe, H.

المصدر: Proceedings of International Electron Devices Meeting Electron devices Electron Devices Meeting, 1995. IEDM '95., International. :115-118 1995

Relation: Proceedings of International Electron Devices Meeting

المؤلفون: Makita, T., Toma, K., Ishikawa, K., Zama, H., Utagawa, T., Kawabe, U., Tanabe, K.

المصدر: IEEE Transactions on Applied Superconductivity IEEE Trans. Appl. Supercond. Applied Superconductivity, IEEE Transactions on. 11(1):155-158 Mar, 2001

المؤلفون: Tokoro, T., Makita, T., Nagao, M.

المصدر: 2008 Annual Report Conference on Electrical Insulation and Dielectric Phenomena Electrical Insulation and Dielectric Phenomena, 2008. CEIDP 2008. Annual Report Conference on. :184-187 Oct, 2008

Relation: 2008 Annual Report Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)