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1دورية أكاديمية
المؤلفون: Makoto Uehara, Sumio Fujita, Nobuyuki Shimizu, Kongmeng Liew, Shoko Wakamiya, Eiji Aramaki
المصدر: Scientific Reports, Vol 12, Iss 1, Pp 1-7 (2022)
وصف الملف: electronic resource
Relation: https://doaj.org/toc/2045-2322
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المؤلفون: Makoto UEHARA, Masatsugu KIZUKA, Kenjiro MATSUMOTO, Tomoyuki KARASAWA, Takaaki OHKUBO, Atsushi TERAMOTO
المصدر: AIJ Journal of Technology and Design. 28:1107-1112
مصطلحات موضوعية: Architecture, Building and Construction
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::3493e7e542ab9e0b6acfeece3fd1eb99
https://doi.org/10.3130/aijt.28.1107 -
3
المؤلفون: Takaaki Ohkubo, Zhendong Su, Masatsugu Kizuka, Kenjirou Matsumoto, Atsushi Teramoto, Makoto Uehara
المصدر: AIJ Journal of Technology and Design. 26:851-856
مصطلحات موضوعية: Sensor system, Surface (mathematics), Materials science, Architecture, Development (differential geometry), Building and Construction, Wetting, Composite material
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::5385afdeb39139238fc0aaa8e7136dee
https://doi.org/10.3130/aijt.26.851 -
4Ellipsometric Microscope ―Design and Application of a Microscope for Oblique Observation of Samples―
المؤلفون: Makoto Uehara, Eiichi Kondoh, Lianhua Jin, Bernard Gelloz
المصدر: Journal of the Japan Society for Precision Engineering. 86:533-536
مصطلحات موضوعية: Microscope, Optics, Materials science, law, business.industry, Mechanical Engineering, Oblique case, business, law.invention
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e90c5b016a46d3dcc7b7c7fe58290eac
https://doi.org/10.2493/jjspe.86.533 -
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المؤلفون: Yuki Iizuka, Eiichi Kondoh, Bernard Gelloz, Lianhua Jin, Makoto Uehara
المصدر: Optical Review. 27:73-80
مصطلحات موضوعية: Quantum optics, Materials science, business.industry, Single measurement, 02 engineering and technology, Combing, 01 natural sciences, Atomic and Molecular Physics, and Optics, law.invention, 010309 optics, 020210 optoelectronics & photonics, Optics, Transmission (telecommunications), Optical microscope, Ellipsometry, law, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Reflection (physics), business
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6
المؤلفون: Hideyuki Kobayashi, Masashi Kimura, Makoto Uehara
المصدر: Proceedings of Sixth International Congress on Information and Communication Technology ISBN: 9789811623769
ICICT (1)مصطلحات موضوعية: SIMPLE (military communications protocol), business.industry, Computer science, Pooling, Global Positioning System, Pattern recognition, Artificial intelligence, Localization system, GPS signals, business, Convolutional neural network, Multipath propagation
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::5e7102ed9e2abe8e46b45ef4062ba57b
https://doi.org/10.1007/978-981-16-2377-6_84 -
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المصدر: AIJ Journal of Technology and Design. 25:33-38
مصطلحات موضوعية: Computer science, Architecture, Monitoring system, Building and Construction, Wetting, Construction engineering
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::fe2466d6f018437d4c5fa447fa51fd25
https://doi.org/10.3130/aijt.25.33 -
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المؤلفون: Makoto Uehara, Eiichi Kondoh, Lianhua Jin, Bernard Gelloz, Yuki Iizuka
المصدر: Optical Technology and Measurement for Industrial Applications 2020.
مصطلحات موضوعية: Materials science, Optics, Reflection (mathematics), Optical microscope, Physics::Instrumentation and Detectors, Ellipsometry, business.industry, law, Computer Science::Computer Vision and Pattern Recognition, Physics::Optics, business, law.invention
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9891bea43de1d5c6b654c898d75fd26a
https://doi.org/10.1117/12.2574762 -
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المؤلفون: Lianhua Jin, Bernard Gelloz, Yuki Iizuka, Eiichi Kondoh, Takashi Iwao, Makoto Uehara
المصدر: Applied Optics. 58:9224
مصطلحات موضوعية: Materials science, Opacity, business.industry, Atomic and Molecular Physics, and Optics, law.invention, Light intensity, Optics, Optical microscope, law, Ellipsometry, Calibration, Wafer, Electrical and Electronic Engineering, Thin film, business, Engineering (miscellaneous), Image resolution
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1dd24fbecef76602e90134f56f0aefb6
https://doi.org/10.1364/ao.58.009224 -
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المؤلفون: Takumi Tanaka, Eiichi Kondoh, Bernard Gelloz, Lianhua Jin, Makoto Uehara
المصدر: Japanese Journal of Applied Physics. 56:116602
مصطلحات موضوعية: 010302 applied physics, Materials science, Physics and Astronomy (miscellaneous), Field (physics), business.industry, Detector, General Engineering, General Physics and Astronomy, Polarizer, 01 natural sciences, law.invention, Metrology, 010309 optics, Optics, Ellipsometry, law, 0103 physical sciences, Calibration, business, Rotation (mathematics), Beam (structure)