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1دورية أكاديمية
المؤلفون: Malgorzata Kopycinska-Müller, Luise Schreiber, Eric Schwarzer-Fischer, Anne Günther, Conner Phillips, Tassilo Moritz, Jörg Opitz, Yeong-Jin Choi, Hui-suk Yun
المصدر: Materials, Vol 16, Iss 10, p 3607 (2023)
مصطلحات موضوعية: optical coherence tomography, quality control, defect detection, 3-D printing, image processing, image analysis, Technology, Electrical engineering. Electronics. Nuclear engineering, TK1-9971, Engineering (General). Civil engineering (General), TA1-2040, Microscopy, QH201-278.5, Descriptive and experimental mechanics, QC120-168.85
وصف الملف: electronic resource
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المصدر: Handbook of Nondestructive Evaluation 4.0 ISBN: 9783030482008
Handbook of Nondestructive Evaluation 4.0مصطلحات موضوعية: Materials science, visual_art, Metallurgy, visual_art.visual_art_medium, Ceramic
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d293d8620ff6190c91ffda73d0fd871b
https://doi.org/10.1007/978-3-030-73206-6_15 -
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المؤلفون: Kong Boon Yeap, Ehrenfried Zschech, Sven Niese, Ude D. Hangen, Claudio Zambaldi, René Hübner, Malgorzata Kopycinska-Müller
المساهمون: Publica
المصدر: Philosophical Magazine. 92:3142-3157
مصطلحات موضوعية: Crystallography, Materials science, Indentation, Modulus, Penetration (firestop), Nanoindentation, Composite material, Condensed Matter Physics, Anisotropy, Penetration depth, Single crystal, Amorphous solid
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المصدر: Advanced Engineering Materials. 13:312-318
مصطلحات موضوعية: Materials science, business.industry, Modulus, Atomic force acoustic microscopy, Nanotechnology, Substrate (electronics), Condensed Matter Physics, Characterization (materials science), Indentation, Microelectronics, General Materials Science, Thin film, Composite material, business, Silicon oxide
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5
المؤلفون: Malgorzata Kopycinska-Müller, Donna C. Hurley, Roy H. Geiss
المصدر: Ultramicroscopy. 106:466-474
مصطلحات موضوعية: Accuracy and precision, Materials science, Silicon, Scanning electron microscope, business.industry, Analytical chemistry, Atomic force acoustic microscopy, chemistry.chemical_element, Conductive atomic force microscopy, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, Contact mechanics, Optics, chemistry, business, Instrumentation, Nanoscopic scale, Elastic modulus
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المؤلفون: Donna C. Hurley, A. B. Kos, Malgorzata Kopycinska-Müller, Roy H. Geiss
المصدر: Advanced Engineering Materials. 7:713-718
مصطلحات موضوعية: Materials science, Nanostructure, Modulus, Atomic force acoustic microscopy, Acoustic microscopy, General Materials Science, Nanotechnology, Thin film, Condensed Matter Physics, Nanoscopic scale, Nanomechanics, Metrology
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المؤلفون: Bernd Köhler, Nataliya Kuzeyeva, Malgorzata Kopycinska-Müller, André Striegler, Klaus-Jurgen Wolter
المصدر: 2013 IEEE 15th Electronics Packaging Technology Conference (EPTC 2013).
مصطلحات موضوعية: Kelvin probe force microscope, Materials science, Indentation, Modulus, Atomic force acoustic microscopy, Nanotechnology, Conductive atomic force microscopy, Nanoindentation, Composite material, Silicon oxide, Characterization (materials science)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::82eba966f58079d014190e0b71d224a5
https://doi.org/10.1109/eptc.2013.6745749 -
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المؤلفون: Klaus-Jurgen Wolter, Ehrenfried Zschech, S. Mahajan, N. Kuzeyeva, Müller T, Malgorzata Kopycinska-Müller, Bernd Köhler, Kong Boon Yeap
المصدر: Nanotechnology. 24(35)
مصطلحات موضوعية: Materials science, Nanoporous, Mechanical Engineering, Analytical chemistry, Atomic force acoustic microscopy, Modulus, Bioengineering, General Chemistry, Dielectric, Nanoindentation, Characterization (materials science), Mechanics of Materials, Indentation, General Materials Science, Electrical and Electronic Engineering, Porosity
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المؤلفون: André Striegler, Bernd Köhler, Malgorzata Kopycinska-Müller, Arnd Hürrich, Klaus Jurgen Wolter, Norbert Meyendorf
المصدر: MRS Proceedings. 1185
مصطلحات موضوعية: Kelvin probe force microscope, Materials science, Indentation, Modulus, Atomic force acoustic microscopy, Conductive atomic force microscopy, Scanning capacitance microscopy, Composite material, Non-contact atomic force microscopy, Photoconductive atomic force microscopy
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المؤلفون: Donna C. Hurley, Roy H. Geiss, Malgorzata Kopycinska-Müller
المصدر: Microscopy and Microanalysis. 11
مصطلحات موضوعية: Kelvin probe force microscope, Piezoresponse force microscopy, Materials science, Cantilever, Atomic force acoustic microscopy, Conductive atomic force microscopy, Composite material, Nanoindentation, Instrumentation, Non-contact atomic force microscopy