المؤلفون: Nien, Yu-Teng, Li, Chen-Hong, Wu, Pei-Yin, Wang, Yung-Jheng, Wu, Kai-Chiang, Chao, Mango C.-T.

المصدر: 2023 IEEE 41st VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2023 IEEE 41st. :1-7 Apr, 2023

Relation: 2023 IEEE 41st VLSI Test Symposium (VTS)

المؤلفون: Hsu, Ho-Chieh, Lu, Cheng-Che, Wang, Shih-Wei, Jones, Kelly, Wu, Kai-Chiang, Chao, Mango C.-T.

المصدر: 2022 IEEE 40th VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2022 IEEE 40th. :1-7 Apr, 2022

Relation: 2022 IEEE 40th VLSI Test Symposium (VTS)

المؤلفون: Chen, Li-Wei, Sui, Yao-Nien, Lee, Tai-Cheng, Li, Yih-Lang, Chao, Mango C.-T., Tsai, I-Ching, Kung, Tai-Wei, Liu, En-Cheng, Chang, Yun-Chih

المصدر: 2022 23rd International Symposium on Quality Electronic Design (ISQED) Quality Electronic Design (ISQED), 2022 23rd International Symposium on. :1-6 Apr, 2022

Relation: 2022 23rd International Symposium on Quality Electronic Design (ISQED)

المؤلفون: Lee, Dong-Zhen, Chen, Ying-Yen, Wu, Kai-Chiang, Chao, Mango C.-T.

المصدر: 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE) Design, Automation & Test in Europe Conference & Exhibition (DATE), 2022. :436-441 Mar, 2022

Relation: 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE)

المؤلفون: Chang, Wen-Hsiang, Lin, Li-Yi, Chen, Yu-Guang, Chao, Mango C.-T.

المصدر: 2020 IEEE/ACM International Conference On Computer Aided Design (ICCAD) Computer Aided Design (ICCAD), 2020 IEEE/ACM International Conference. :1-9 Nov, 2020

Relation: 2020 IEEE/ACM International Conference On Computer Aided Design (ICCAD)

المؤلفون: Hu, Yu-Pang, Chang, Shuo-Wen, Wu, Kai-Chiang, Wang, Chi Chun, Huang, Fu-Sheng, Tang, Yi-Lun, Chen, Yung-Chen, Chen, Ming-Chien, Chao, Mango C.-T.

المصدر: 2020 IEEE International Test Conference in Asia (ITC-Asia) Test Conference in Asia (ITC-Asia), 2020 IEEE International. :106-111 Sep, 2020

Relation: 2020 IEEE International Test Conference in Asia (ITC-Asia)

المؤلفون: Wu, Tse-Wei, Lee, Dong-Zhen, Huang, Yu-Hao, Chao, Mango C.-T., Wu, Kai-Chiang, Kao, Shu-Yi, Chen, Ying-Yen, Chen, Po-Lin, Chern, Mason, Lee, Jih-Nung

المصدر: 2019 IEEE 37th VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2019 IEEE 37th. :1-6 Apr, 2019

Relation: 2019 IEEE 37th VLSI Test Symposium (VTS)

المؤلفون: Chang, Keng-Wei, Huang, Chun-Yang, Mu, Szu-Pang, Huang, Jian-Min, Chen, Shi-Hao, Chao, Mango C.-T.

المصدر: 2018 IEEE International Test Conference in Asia (ITC-Asia) ITC-ASIA Test Conference in Asia (ITC-Asia), 2018 IEEE International. :31-36 Aug, 2018

Relation: 2018 IEEE International Test Conference in Asia (ITC-Asia)

المؤلفون: Yu-Hao Huang, Ching-Ho Lu, Tse-Wei Wu, Yu-Teng Nien, Ying-Yen Chen, Wu, Max, Jih-Nung Lee, Chao, Mango C.-T.

المصدر: 2017 IEEE 35th VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2017 IEEE 35th. :1-6 Apr, 2017

Relation: 2017 IEEE 35th VLSI Test Symposium (VTS)

المؤلفون: Huang, Tzu-Hsuan, Hung, Wei-Tse, Yang, Hao-Yu, Chang, Wen-Hsiang, Chen, Ying-Yen, Kuo, Chun-Yi, Lee, Jih-Nung, Chao, Mango C.-T.

المصدر: 2017 22nd Asia and South Pacific Design Automation Conference (ASP-DAC) Design Automation Conference (ASP-DAC), 2017 22nd Asia and South Pacific. :426-431 Jan, 2017

Relation: 2017 22nd Asia and South Pacific Design Automation Conference (ASP-DAC)