المؤلفون: Manhaeve, H.

المصدر: Proceedings. 2005 IEEE International Workshop on Current and Defect Based Testing, 2005. DBT 2005. Current and Defect Based Testing Current and Defect Based Testing, 2005. DBT 2005. Proceedings. 2005 IEEE International Workshop on. :49-56 2005

Relation: Proceedings. 2005 IEEE International Workshop on Current and Defect Based Testing

المؤلفون: Fudoli, A., Ascagni, A., Appello, D., Manhaeve, H.

المصدر: The Eighth IEEE European Test Workshop, 2003. Proceedings. European test workshop Test Workshop, 2003. Proceedings. The Eighth IEEE European. :65-70 2003

Relation: 8th IEEE European Test Workshop (ETW 03)

المؤلفون: Manhaeve, H., Vaccaro, J.S., Benecke, L., Prystasz, D.

المصدر: Proceedings The Seventh IEEE European Test Workshop European test workshop Test Workshop, 2002. Proceedings. The Seventh IEEE European. :81-86 2002

Relation: Proceedings the Seventh IEEE European Test Workshop

المؤلفون: Manhaeve, H., Kerckenaere, S.

المصدر: Proceedings 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems Defect and fault tolerance in VLSI systems Defect and Fault Tolerance in VLSI Systems, 2001. Proceedings. 2001 IEEE International Symposium on. :57-65 2001

Relation: Proceedings 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

المؤلفون: Manhaeve, H., Verfaillie, J., Straka, B., Cornil, J.P.

المصدر: European Test Workshop 1999 (Cat. No.PR00390) European test workshop European Test Workshop 1999. Proceedings. :51-56 1999

Relation: European Test Workshop 1999

المؤلفون: Stopjakova, V., Manhaeve, H., Sidiropulos, M.

المصدر: Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings (Cat. No. PR00078) Design, automation and test in Europe Design, Automation and Test in Europe Conference and Exhibition 1999. Proceedings. :538-542 1999

Relation: Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings

المؤلفون: Maidon, Y., Deval, Y., Manhaeve, H.

المصدر: Proceedings 1998 IEEE International Workshop on IDDQ Testing (Cat. No.98EX232) IDDQ testing IDDQ Testing, 1998. Proceedings. 1998 IEEE International Workshop on. :59-63 1998

Relation: Proceedings 1998 IEEE International Workshop on IDDQ Testing

المؤلفون: Straka, B., Manhaeve, H., Vanneuville, J., Svajda, M.

المصدر: Proceedings Design, Automation and Test in Europe Design, automation and test in Europe Design, Automation and Test in Europe, 1998., Proceedings. :495-500 1998

Relation: Proceedings Design, Automation and Test in Europe

المؤلفون: Stopjakova, V., Manhaeve, H.

المصدر: Proceedings European Design and Test Conference. ED & TC 97 European design and test conference European Design and Test Conference, 1997. ED&TC 97. Proceedings. :266-270 1997

Relation: Proceedings European Design and Test Conference. ED & TC 97

المؤلفون: Manhaeve, H., Svajda, M., Straka, B.

المصدر: Digest of Papers 1996 IEEE International Workshop on IDDQ Testing IDDQ testing IDDQ Testing, 1996., IEEE International Workshop on. :89-93 1996

Relation: Digest of Papers 1996 IEEE International Workshop on IDDQ Testing