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1دورية أكاديمية
المؤلفون: Franck Decroos, Cécile Langlade, Eric Bourillot, Geoffrey Darut, Manuel Francois
المصدر: Acta Polytechnica CTU Proceedings, Vol 27, Iss 0, Pp 42-47 (2020)
مصطلحات موضوعية: coatings, chromium oxides, raman micro-spectroscopy, residual stress, scanning microwave microscopy, Engineering (General). Civil engineering (General), TA1-2040
وصف الملف: electronic resource
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2دورية أكاديمية
المؤلفون: Marie Garnier, Eric Lesniewska, Virgil Optasanu, Bruno Guelorget, Pascal Berger, Luc Lavisse, Manuel François, Irma Custovic, Nicolas Pocholle, Eric Bourillot
المصدر: Nanomaterials, Vol 14, Iss 7, p 628 (2024)
مصطلحات موضوعية: light chemical element quantification, diffusion, local mechanical properties, scanning microwave microscopy, oxide-metal interface materials, Chemistry, QD1-999
وصف الملف: electronic resource
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المؤلفون: J. Petit, Guillaume Montay, Manuel Francois
المصدر: EPJ Web of Conferences, Vol 6, p 11002 (2010)
مصطلحات موضوعية: Materials science, business.industry, Physics, QC1-999, Slip band, Strain rate, Instability, Optics, Electronic speckle pattern interferometry, Ultimate tensile strength, Fracture (geology), Speckle imaging, Deformation (engineering), business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5a8d12cb81c5428d7202d2b2febd1a0c
https://doaj.org/article/6c4cccedac6740849001a707ac19b472 -
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المؤلفون: Manuel Francois, Guillaume Montay, Laurent Daniel, Jian Lu, Bruno Guelorget
المصدر: SPIE Proceedings.
مصطلحات موضوعية: Interferometry, Speckle pattern, Optics, Materials science, Strain (chemistry), business.industry, Electronic speckle pattern interferometry, Strain rate, Plasticity, Composite material, business, Tensile testing
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::256df78267caf5cce5345527fbfe1b3b
https://doi.org/10.1117/12.695840 -
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المصدر: Eighth International Symposium on Laser Metrology.
مصطلحات موضوعية: Interferometry, Speckle pattern, Materials science, Optics, business.industry, Tension (physics), Electronic speckle pattern interferometry, Fracture (geology), Speckle imaging, business, Instability, Plane stress
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::7e26b634993a3dcd7c280b867e07945f
https://doi.org/10.1117/12.611711 -
6دورية أكاديمية
المؤلفون: Konrad Skowron, Ewa Dryzek, Mirosław Wróbel, Paweł Nowak, Marianna Marciszko-Wiąckowska, Léa Le Joncour, Manuel François, Benoit Panicaud, Andrzej Baczmański
المصدر: Materials, Vol 13, Iss 18, p 4002 (2020)
مصطلحات موضوعية: magnesium, surface mechanical attrition treatment, SMAT, gradient structured materials, positron annihilation spectroscopy, corrosion, Technology, Electrical engineering. Electronics. Nuclear engineering, TK1-9971, Engineering (General). Civil engineering (General), TA1-2040, Microscopy, QH201-278.5, Descriptive and experimental mechanics, QC120-168.85
وصف الملف: electronic resource
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7دورية أكاديمية
المؤلفون: Mohamed Fares Slim, Akram Alhussein, Manuel François
المصدر: Proceedings, Vol 2, Iss 8, p 423 (2018)
مصطلحات موضوعية: Young’s modulus, shear modulus, poisson’s ratio, dynamical resonant method, IET, coatings, magnetron sputtering, uncertainty, tungsten, General Works
وصف الملف: electronic resource
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8
المؤلفون: Inal, K., Gergaud, P., Manuel Francois, Lebrun, Jl
المصدر: ResearcherID
Scopus-ElsevierURL الوصول: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::17dd1dbf4ee12edbffb7e2c2720fdcfc
http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=ORCID&SrcApp=OrcidOrg&DestLinkType=FullRecord&DestApp=WOS_CPL&KeyUT=WOS:000084243300001&KeyUID=WOS:000084243300001 -
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المؤلفون: Manuel Francois, Bourniquel, B., Not, C., Guillen, R., Duval, C.
المصدر: Scopus-Elsevier
ResearcherIDURL الوصول: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::3bbbb302c703ac4a0e28235e3067c90e
http://www.scopus.com/inward/record.url?eid=2-s2.0-0342918637&partnerID=MN8TOARS -
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المؤلفون: Manuel Francois
المصدر: ResearcherID
URL الوصول: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::29966ceb0ec34aa3a8c094f581f7e18f
http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=ORCID&SrcApp=OrcidOrg&DestLinkType=FullRecord&DestApp=WOS_CPL&KeyUT=WOS:000221089900001&KeyUID=WOS:000221089900001