المؤلفون: Marcos V.O. De Assis, Matheus P. Novaes, Cinara B. Zerbini, Luiz F. Carvalho, Taufik Abrao, Mario L. Proenca

المصدر: IEEE Access, Vol 6, Pp 69620-69639 (2018)

مصطلحات موضوعية: DDoS, DWT, MLP, port scan, PSO, SDN, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/8514012/; https://doaj.org/toc/2169-3536

URL الوصول: https://doaj.org/article/53162250ecc247099010438d2b812b23