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المؤلفون: Marius Grigonis
المصدر: Problemos, Vol 89, Iss 89 (2016)
مصطلحات موضوعية: lcsh:Philosophy (General), media_common.quotation_subject, Philosophy, dualizmas, Mind–body dualism, fizikalizmas, Physicalism, Causal closure, Epistemology, Overdetermination, neperteklinis apibrėžtumas, lcsh:B1-5802, fizinis, kauzalinis uždarumas, media_common
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2a5ae1ba5dec9f9c483df00b353008c4
https://doi.org/10.15388/problemos.2016.89.9883 -
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المؤلفون: Markus K. Tilsch, Marius Grigonis, Georg J. Ockenfuss
المصدر: Chinese Optics Letters. 8:38-43
مصطلحات موضوعية: Optical coating, Optics, Materials science, business.industry, Electrical and Electronic Engineering, business, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::7089aa0bbd4afc06d46df78f2e785047
https://doi.org/10.3788/col201008s1.0038 -
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المؤلفون: Marius Grigonis, Markus K. Tilsch, Wilhelm Hebenstreit
المصدر: Thin Solid Films. 516:136-140
مصطلحات موضوعية: Materials science, Ion beam, Atomic force microscopy, Delamination, Metals and Alloys, Surfaces and Interfaces, Sputter deposition, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, X-ray photoelectron spectroscopy, Interfacial delamination, Materials Chemistry, Forensic engineering, Composite material, Layer (electronics), Multi layer
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المؤلفون: Marius Grigonis, Markus K. Tilsch, Karen Denise Hendrix
المصدر: Optical Interference Coatings.
مصطلحات موضوعية: Materials science, Band-pass filter, business.industry, Infrared, Cavity magnetron, Pulsed DC, Optoelectronics, Sputter deposition, Thin film, business, Durability, Refractive index
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::f2ed66a0721ff5a052bb15a5ee9900d1
https://doi.org/10.1364/oic.2010.ma8 -
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المؤلفون: Emile J. Knystautas, Marius Grigonis
المصدر: Applied Optics. 36:2839
مصطلحات موضوعية: Materials science, business.industry, Materials Science (miscellaneous), Fresnel equations, Industrial and Manufacturing Engineering, law.invention, Wavelength, Optics, law, Transmission electron microscopy, Optoelectronics, Business and International Management, Thin film, business, Interfacial roughness, Layer (electronics), Deposition (law), Monochromator
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::dbcf89e0ba0ab28c3c81731c4ac8928e
https://doi.org/10.1364/ao.36.002839