المؤلفون: Das, S, Hong, Z, Stoica, VA, Gonçalves, MAP, Shao, YT, Parsonnet, E, Marksz, EJ, Saremi, S, McCarter, MR, Reynoso, A, Long, CJ, Hagerstrom, AM, Meyers, D, Ravi, V, Prasad, B, Zhou, H, Zhang, Z, Wen, H, Gómez-Ortiz, F, García-Fernández, P, Bokor, J, Íñiguez, J, Freeland, JW, Orloff, ND, Junquera, J, Chen, LQ, Salahuddin, S, Muller, DA, Martin, LW, Ramesh, R

المصدر: Nature Materials. 20(2)

مصطلحات موضوعية: Nanoscience & Nanotechnology

وصف الملف: application/pdf

URL الوصول: https://escholarship.org/uc/item/7vd7m1tz

المؤلفون: Das S; Department of Materials Science and Engineering, University of California, Berkeley, CA, USA. sujitdas@berkeley.edu.; Department of Physics, University of California, Berkeley, CA, USA. sujitdas@berkeley.edu., Hong Z; Department of Materials Science and Engineering, The Pennsylvania State University, University Park, PA, USA.; Department of Mechanical Engineering, Carnegie Mellon University, Pittsburgh, PA, USA., Stoica VA; Department of Materials Science and Engineering, The Pennsylvania State University, University Park, PA, USA., Gonçalves MAP; Materials Research and Technology Department, Luxembourg Institute of Science and Technology (LIST), Esch/Alzette, Luxemburg.; Departamento de Ciencias de la Tierra y Física de la Materia Condensada, Universidad de Cantabria, Cantabria Campus Internacional, Santander, Spain.; Physics and Materials Science Research Unit, University of Luxembourg, Belvaux, Luxembourg., Shao YT; School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA., Parsonnet E; Department of Physics, University of California, Berkeley, CA, USA., Marksz EJ; National Institute of Standards and Technology, Boulder, CO, USA., Saremi S; Department of Materials Science and Engineering, University of California, Berkeley, CA, USA., McCarter MR; Department of Physics, University of California, Berkeley, CA, USA., Reynoso A; Department of Physics, University of California, Berkeley, CA, USA., Long CJ; National Institute of Standards and Technology, Boulder, CO, USA., Hagerstrom AM; National Institute of Standards and Technology, Boulder, CO, USA., Meyers D; Department of Materials Science and Engineering, University of California, Berkeley, CA, USA., Ravi V; Department of Materials Science and Engineering, University of California, Berkeley, CA, USA., Prasad B; Department of Materials Science and Engineering, University of California, Berkeley, CA, USA., Zhou H; Advanced Photon Source, Argonne National Laboratory, Argonne, IL, USA., Zhang Z; Advanced Photon Source, Argonne National Laboratory, Argonne, IL, USA., Wen H; Advanced Photon Source, Argonne National Laboratory, Argonne, IL, USA., Gómez-Ortiz F; Departamento de Ciencias de la Tierra y Física de la Materia Condensada, Universidad de Cantabria, Cantabria Campus Internacional, Santander, Spain., García-Fernández P; Departamento de Ciencias de la Tierra y Física de la Materia Condensada, Universidad de Cantabria, Cantabria Campus Internacional, Santander, Spain., Bokor J; Department of Electrical Engineering and Computer Sciences, University of California, Berkeley, CA, USA., Íñiguez J; Materials Research and Technology Department, Luxembourg Institute of Science and Technology (LIST), Esch/Alzette, Luxemburg.; Physics and Materials Science Research Unit, University of Luxembourg, Belvaux, Luxembourg., Freeland JW; Advanced Photon Source, Argonne National Laboratory, Argonne, IL, USA., Orloff ND; National Institute of Standards and Technology, Boulder, CO, USA., Junquera J; Departamento de Ciencias de la Tierra y Física de la Materia Condensada, Universidad de Cantabria, Cantabria Campus Internacional, Santander, Spain., Chen LQ; Department of Materials Science and Engineering, The Pennsylvania State University, University Park, PA, USA., Salahuddin S; Department of Electrical Engineering and Computer Sciences, University of California, Berkeley, CA, USA., Muller DA; School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA.; Kavli Institute at Cornell for Nanoscale Science, Ithaca, NY, USA., Martin LW; Department of Materials Science and Engineering, University of California, Berkeley, CA, USA.; Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, CA, USA., Ramesh R; Department of Materials Science and Engineering, University of California, Berkeley, CA, USA. rramesh@berkeley.edu.; Department of Physics, University of California, Berkeley, CA, USA. rramesh@berkeley.edu.; Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, CA, USA. rramesh@berkeley.edu.

المصدر: Nature materials [Nat Mater] 2021 Jun; Vol. 20 (6), pp. 905.

نوع المنشور: Published Erratum

بيانات الدورية: Publisher: Nature Pub. Group Country of Publication: England NLM ID: 101155473 Publication Model: Print Cited Medium: Internet ISSN: 1476-4660 (Electronic) Linking ISSN: 14761122 NLM ISO Abbreviation: Nat Mater Subsets: PubMed not MEDLINE; MEDLINE

المؤلفون: Dawley NM; Department of Materials Science and Engineering, Cornell University, Ithaca, NY, USA., Marksz EJ; Department of Materials Science and Engineering, University of Maryland, College Park, MD, USA.; National Institute of Standards and Technology, Boulder, CO, USA., Hagerstrom AM; National Institute of Standards and Technology, Boulder, CO, USA., Olsen GH; School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA., Holtz ME; Department of Materials Science and Engineering, Cornell University, Ithaca, NY, USA.; School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA., Goian V; Institute of Physics ASCR, Prague, Czech Republic., Kadlec C; Institute of Physics ASCR, Prague, Czech Republic., Zhang J; Department of Materials Science and Engineering, Cornell University, Ithaca, NY, USA., Lu X; National Institute of Standards and Technology, Boulder, CO, USA., Drisko JA; National Institute of Standards and Technology, Boulder, CO, USA., Uecker R; Leibniz-Institut für Kristallzüchtung, Berlin, Germany., Ganschow S; Leibniz-Institut für Kristallzüchtung, Berlin, Germany., Long CJ; National Institute of Standards and Technology, Boulder, CO, USA., Booth JC; National Institute of Standards and Technology, Boulder, CO, USA., Kamba S; Institute of Physics ASCR, Prague, Czech Republic., Fennie CJ; School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA., Muller DA; School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA., Orloff ND; National Institute of Standards and Technology, Boulder, CO, USA., Schlom DG; Department of Materials Science and Engineering, Cornell University, Ithaca, NY, USA. schlom@cornell.edu.; Kavli Institute at Cornell for Nanoscale Science, Ithaca, NY, USA. schlom@cornell.edu.

المصدر: Nature materials [Nat Mater] 2020 Feb; Vol. 19 (2), pp. 176-181. Date of Electronic Publication: 2019 Dec 23.

نوع المنشور: Journal Article

بيانات الدورية: Publisher: Nature Pub. Group Country of Publication: England NLM ID: 101155473 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1476-4660 (Electronic) Linking ISSN: 14761122 NLM ISO Abbreviation: Nat Mater Subsets: PubMed not MEDLINE; MEDLINE

المؤلفون: Hagerstrom AM; Communications Technology Laboratory (CTL), National Institute of Standards and Technology (NIST), 325 Broadway, Boulder, Colorado 80305, USA.; Department of Physics, University of Colorado, Boulder, Colorado 80309, USA., Marksz EJ; Communications Technology Laboratory (CTL), National Institute of Standards and Technology (NIST), 325 Broadway, Boulder, Colorado 80305, USA.; Department of Materials Science and Engineering, University of Maryland, College Park, Maryland 20742, USA., Zhang X; Department of Materials Science and Engineering, University of Maryland, College Park, Maryland 20742, USA., Lu X; Communications Technology Laboratory (CTL), National Institute of Standards and Technology (NIST), 325 Broadway, Boulder, Colorado 80305, USA.; Department of Physics, University of Colorado, Boulder, Colorado 80309, USA., Long CJ; Communications Technology Laboratory (CTL), National Institute of Standards and Technology (NIST), 325 Broadway, Boulder, Colorado 80305, USA., Booth JC; Communications Technology Laboratory (CTL), National Institute of Standards and Technology (NIST), 325 Broadway, Boulder, Colorado 80305, USA., Takeuchi I; Department of Materials Science and Engineering, University of Maryland, College Park, Maryland 20742, USA., Orloff ND; Communications Technology Laboratory (CTL), National Institute of Standards and Technology (NIST), 325 Broadway, Boulder, Colorado 80305, USA.

المصدر: Physical review applied [Phys Rev Appl] 2020; Vol. 13 (4).

نوع المنشور: Journal Article

بيانات الدورية: Publisher: American Physical Society Country of Publication: United States NLM ID: 101633995 Publication Model: Print Cited Medium: Print ISSN: 2331-7019 (Print) Linking ISSN: 23317019 NLM ISO Abbreviation: Phys Rev Appl Subsets: PubMed not MEDLINE