المؤلفون: Loechelt, Gary, Grivna, Gordy, Golonka, Laurence, Hoggatt, Charles, Massie, Hal, De Pestel, Freddy, Martens, Nick, Mouhoubi, Samir, Roig, Jaume, Colpaert, Tony, Coppens, Peter, Bauwens, Filip, De Backer, Eddy

المصدر: 2012 24th International Symposium on Power Semiconductor Devices and ICs Power Semiconductor Devices and ICs (ISPSD), 2012 24th International Symposium on. :85-88 Jun, 2012

Relation: 2012 24th International Symposium on Power Semiconductor Devices & IC's (ISPSD)

المؤلفون: Poort, Eltjo R.^Aff18, Martens, Nick^Aff19, van de Weerd, Inge^Aff19, van Vliet, Hans^Aff20

المساهمون: Hutchison, David, editor^Aff1, Kanade, Takeo, editor^Aff2, Kittler, Josef, editor^Aff3, Kleinberg, Jon M., editor^Aff4, Mattern, Friedemann, editor^Aff5, Mitchell, John C., editor^Aff6, Naor, Moni, editor^Aff7, Nierstrasz, Oscar, editor^Aff8, Pandu Rangan, C., editor^Aff9, Steffen, Bernhard, editor^Aff10, Sudan, Madhu, editor^Aff11, Terzopoulos, Demetri, editor^Aff12, Tygar, Doug, editor^Aff13, Vardi, Moshe Y., editor^Aff14, Weikum, Gerhard, editor^Aff15, Regnell, Björn, editor^Aff16, Damian, Daniela, editor^Aff17

المصدر: Requirements Engineering: Foundation for Software Quality : 18th International Working Conference, REFSQ 2012, Essen, Germany, March 19-22, 2012. Proceedings. 7195:37-51

المؤلفون: MARTENS, NICK

المصدر: Professional Safety, 1998 Sep 01. 43(9), 30-34.

URL الوصول: https://www.jstor.org/stable/45447468

المؤلفون: Martens, Nick, Wiebe, Jesse

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e258d36797801e83d05f30d402f4e2b9

المؤلفون: Goessens, Claus, Martens, Nick, Baele, Joris, Backer, Eddy De, Pestel, Freddy De, Engle, Mike

المصدر: ECS Transactions; September 2007, Vol. 11 Issue: 2 p275-282, 8p