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1
المؤلفون: Tyler J. Grassman, Ari N. Blumer, Marzieh Baan
المصدر: Microscopy and Microanalysis. 27:3442-3444
مصطلحات موضوعية: Materials science, Composite material, Thin film, Instrumentation, Electron backscatter diffraction
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2
المؤلفون: Tyler J. Grassman, Zak H. Blumer, Marzieh Baan, Jacob T. Boyer, Ari N. Blumer
المصدر: Microscopy and Microanalysis. 27:912-914
مصطلحات موضوعية: Nuclear magnetic resonance, Materials science, Electron, Dislocation, Contrast imaging, Instrumentation, Characterization (materials science)
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3
المؤلفون: Afshin Alipour, M. Bulut Coskun, Marzieh Baan, S. O. Reza Moheimani
المصدر: CCTA
مصطلحات موضوعية: Cantilever, Materials science, Fabrication, Frequency separation, business.industry, Resonance, Feedthrough, Optoelectronics, Actuator, business, Piezoelectricity, Lithography
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::c7c5f7b3720f2067cb0a5d82723d677e
https://doi.org/10.1109/ccta.2019.8920686