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1مؤتمر
المؤلفون: Mohammad-Zulkifli, Syahirah, Zee, Bernice, Thomas, Gregorich, Gu, Allen, Yang, YanJing, Masako, Terada, Lee, Weijie
المصدر: 2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2019 IEEE 26th International Symposium on. :1-4 Jul, 2019
Relation: 2019 IEEE 26th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
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المؤلفون: Kavin Sivaneri Varadharajan Idhaiam, Gloria Oporto, Matthew Barre, Masako Terada, Jonathan Boyd, William Goldsmith, Timothy Nurkiewicz, Rakesh K. Gupta, Edward M. Sabolsky
المصدر: ACS Applied Polymer Materials. 5:1657-1669
مصطلحات موضوعية: Polymers and Plastics, Process Chemistry and Technology, Organic Chemistry
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المؤلفون: Allen Gu, Andriy Andreyev, Masako Terada, Thomas Rodgers, Vignesh Viswanathan
المصدر: 2023 International Conference on Electronics Packaging (ICEP).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::64bb9d51522528ab31807ee4eec66222
https://doi.org/10.23919/icep58572.2023.10129701 -
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المؤلفون: Matthew Andrew, Andriy Andreyev, Faguo Yang, Masako Terada, Allen Gu, Robin White
المصدر: Developments in X-Ray Tomography XIV.
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::2190c583c12a4937b160799a46a4ac89
https://doi.org/10.1117/12.2633095 -
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المؤلفون: Thomas Rodgers, Allen Gu, Greg Johnson, Masako Terada, Nathaniel Cohan, Vignesh Viswanathan, Michael W. Phaneuf, Joachim de Fourestier, Ethan Ruttan, Stewart McCracken, Suzanne Costello, Aidan M Robinson, Andrew Gibson, Alan Balfour
المصدر: International Symposium for Testing and Failure Analysis.
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::246ad1832d1e1a2111d958a60c06d720
https://doi.org/10.31399/asm.cp.istfa2022p0319 -
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المؤلفون: Allen Gu, Masako Terada, Heiko Stegmann, Thomas Rodgers, Chao Fu, Yanjing Yang
المصدر: 2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6bde57c69985af5ad4840068fdfb5b2f
https://doi.org/10.1109/ipfa55383.2022.9915756 -
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المؤلفون: William Harris, Allen Gu, Masako Terada
المصدر: 2022 IEEE International Reliability Physics Symposium (IRPS).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::cc43839b69e4dc9286fad7dd05552e36
https://doi.org/10.1109/irps48227.2022.9764574 -
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المؤلفون: Andriy Andreyev, Bernice Zee, Masako Terada, Yanjing Yang, Syahirah Mohammad-Zulkifli, Allen Gu
المصدر: International Symposium for Testing and Failure Analysis.
مصطلحات موضوعية: Optics, Materials science, business.industry, Deep learning, X-ray, High resolution, Artificial intelligence, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::368a5459c526b7dac6c11d661bcfdc24
https://doi.org/10.31399/asm.cp.istfa2021p0291 -
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المؤلفون: Allen Gu, Thom Gregorich, Yanjing Yang, Masako Terada
المصدر: 2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
مصطلحات موضوعية: Materials science, business.industry, Non destructive, Optoelectronics, Electronics, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::00f39b7fb949812bf1c5ac1d51240fc3
https://doi.org/10.1109/ipfa53173.2021.9617447 -
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المؤلفون: Cheryl Hartfield, Will Harris, Allen Gu, Masako Terada, Vignesh Viswanathan, Longan Jiao, Thomas Rodgers
المصدر: ECS Meeting Abstracts. :855-855