يعرض 1 - 10 نتائج من 5,382 نتيجة بحث عن '"Mascio, A."', وقت الاستعلام: 1.17s تنقيح النتائج
  1. 1
    دورية أكاديمية

    المصدر: IEEE Embedded Systems Letters IEEE Embedded Syst. Lett. Embedded Systems Letters, IEEE. 16(2):162-165 Jun, 2024

  2. 2
  3. 3
    مؤتمر

    المصدر: 2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2022 IEEE International Symposium on. :1-6 Oct, 2022

    Relation: 2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

  4. 4
    مؤتمر

    المصدر: 2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2022 IEEE International Symposium on. :1-6 Oct, 2022

    Relation: 2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

  5. 5
  6. 6
  7. 7
    مؤتمر

    المصدر: 2022 25th Euromicro Conference on Digital System Design (DSD) DSD Digital System Design (DSD), 2022 25th Euromicro Conference on. :741-747 Aug, 2022

    Relation: 2022 25th Euromicro Conference on Digital System Design (DSD)

  8. 8
    مؤتمر

    المصدر: 2022 IEEE International Conference on Environment and Electrical Engineering and 2022 IEEE Industrial and Commercial Power Systems Europe (EEEIC / I&CPS Europe) Environment and Electrical Engineering and 2022 IEEE Industrial and Commercial Power Systems Europe (EEEIC / I&CPS Europe), 2022 IEEE International Conference on. :1-6 Jun, 2022

    Relation: 2022 IEEE International Conference on Environment and Electrical Engineering and 2022 IEEE Industrial and Commercial Power Systems Europe (EEEIC / I&CPS Europe)

  9. 9
    مؤتمر

    المصدر: 2022 IEEE International Workshop on Metrology for Industry 4.0 & IoT (MetroInd4.0&IoT) Metrology for Industry 4.0 & IoT (MetroInd4.0&IoT), 2022 IEEE International Workshop on. :28-33 Jun, 2022

    Relation: 2022 IEEE International Workshop on Metrology for Industry 4.0 & IoT (MetroInd4.0&IoT)

  10. 10
    كتاب إلكتروني

    المؤلفون: Di Mascio, DaniloAff12

    المساهمون: Cho, Byung Kwan, Series EditorAff1, Choi, Han-Lim, Series EditorAff2, Choi, Insung S., Series EditorAff3, Chung, Sung Yoon, Series EditorAff4, Jeong, Jaeseung, Series EditorAff5, Jeong, Ki Jun, Series EditorAff6, Kim, Sang Ouk, Series EditorAff7, Kyung, Chongmin, Series EditorAff8, Lee, Sung Ju, Series EditorAff9, Min, Bumki, Series EditorAff10, Lee, Ji-Hyun, editorAff11

    المصدر: Cultural Space on Metaverse. :117-130