المؤلفون: Regan Á., Henchion M, McIntyre B

المصدر: Irish Journal of Agricultural and Food Research, Vol 57, Iss 1, Pp 9-14 (2018)

مصطلحات موضوعية: consumer perception, credence attributes, meat quality, segmentation, Agriculture (General), S1-972, Nutrition. Foods and food supply, TX341-641

وصف الملف: electronic resource

Relation: http://www.degruyter.com/view/j/ijafr.2018.57.issue-1/ijafr-2018-0002/ijafr-2018-0002.xml?format=INT; https://doaj.org/toc/0791-6833; https://doaj.org/toc/2009-9029

URL الوصول: https://doaj.org/article/ffb9b0d9e85d490b9d94bacdd5ddcbae

المؤلفون: Marshall, E., Hander, M., Valdes, M., Britton, J., Jones, T., Whitehead, J., McIntyre, B.

المصدر: IEEE Systems Technical Conference on Industrial and Commercial Power 2005. Industrial and Commercial Power Systems Technical Conference, 2005 IEEE. :212-217 2005

Relation: IEEE Systems Technical Conference on Industrial and Commercial Power

المؤلفون: Thompson, S., Anand, N., Armstrong, M., Auth, C., Arcot, B., Alavi, M., Bai, P., Bielefeld, J., Bigwood, R., Brandenburg, J., Buehler, M., Cea, S., Chikarmane, V., Choi, C., Frankovic, R., Ghani, T., Glass, G., Han, W., Hoffmann, T., Hussein, M., Jacob, P., Jain, A., Jan, C., Joshi, S., Kenyon, C., Klaus, J., Klopcic, S., Luce, J., Ma, Z., Mcintyre, B., Mistry, K., Murthy, A., Nguyen, P., Pearson, H., Sandford, T., Schweinfurth, R., Shaheed, R., Sivakumar, S., Taylor, M., Tufts, B., Wallace, C., Wang, P., Weber, C., Bohr, M.

المصدر: Digest. International Electron Devices Meeting, Electron devices meeting Electron Devices Meeting, 2002. IEDM '02. International. :61-64 2002

Relation: IEEE International Electron Devices Meeting

المؤلفون: Tyagi, S., Alavi, M., Bigwood, R., Bramblett, T., Brandenburg, J., Chen, W., Crew, B., Hussein, M., Jacob, P., Kenyon, C., Lo, C., McIntyre, B., Ma, Z., Moon, P., Nguyen, P., Rumaner, L., Schweinfurth, R., Sivakumar, S., Stettler, M., Thompson, S., Tufts, B., Xu, J., Yang, S., Bohr, M.

المصدر: International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138) Electron devices meeting Electron Devices Meeting, 2000. IEDM '00. Technical Digest. International. :567-570 2000

Relation: International Electron Devices Meeting. Technical Digest. IEDM

المؤلفون: Yang, S., Ahmed, S., Arcot, B., Arghavani, R., Bai, P., Chambers, S., Charvat, P., Cotner, R., Gasser, R., Ghani, T., Hussein, M., Jan, C., Kardas, C., Maiz, J., McGregor, P., McIntyre, B., Nguyen, P., Packan, P., Post, I., Sivakumar, S., Steigerwald, J., Taylor, M., Tufts, B., Tyagi, S., Bohr, M.

المصدر: International Electron Devices Meeting 1998. Technical Digest (Cat. No.98CH36217) Electron devices - IEDM 1998 Electron Devices Meeting, 1998. IEDM '98. Technical Digest., International. :197-200 1998

Relation: International Electron Devices Meeting 1998. Technical Digest

المؤلفون: Kotowski, J., McIntyre, B., Parry, J.

المصدر: Proceedings of the IEEE 1998 Custom Integrated Circuits Conference (Cat. No.98CH36143) Custom integrated circuits Custom Integrated Circuits Conference, 1998. Proceedings of the IEEE 1998. :35-38 1998

Relation: Proceedings of the IEEE 1998 Custom Integrated Circuits Conference

المؤلفون: Thompson, S.E., Armstrong, M., Auth, C., Alavi, M., Buehler, M., Chau, R., Cea, S., Ghani, T., Glass, G., Hoffman, T., Jan, C.-H., Kenyon, C., Klaus, J., Kuhn, K., Zhiyong Ma, Mcintyre, B., Mistry, K., Murthy, A., Obradovic, B., Nagisetty, R., Phi Nguyen, Sivakumar, S., Shaheed, R., Shifren, L., Tufts, B., Tyagi, S., Bohr, M., El-Mansy, Y.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 51(11):1790-1797 Nov, 2004

المؤلفون: Gopalakrishnan, K.N., McIntyre, B., Whittaker, J.

المصدر: Technology Management : the New International Language. :389-393 1991

Relation: Technology Management : the New International Language

المؤلفون: Prasad, C., Agostinelli, M., Auth, C., Brazier, M., Chau, R., Dewey, G., Ghani, T., Hattendorf, M., Hicks, J., Jopling, J., Kavalieros, J., Kotlyar, R., Kuhn, M., Kuhn, K., Maiz, J., McIntyre, B., Metz, M., Mistry, K., Pae, S., Rachmady, W., Ramey, S., Roskowski, A., Sandford, J., Thomas, C., Wiegand, C., Wiedemer, J.

المصدر: 2008 IEEE International Reliability Physics Symposium Reliability Physics Symposium, 2008. IRPS 2008. IEEE International. :667-668 Apr, 2008

Relation: 2008 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Mistry, K., Allen, C., Auth, C., Beattie, B., Bergstrom, D., Bost, M., Brazier, M., Buehler, M., Cappellani, A., Chau, R., Choi, C.-H., Ding, G., Fischer, K., Ghani, T., Grover, R., Han, W., Hanken, D., Hattendorf, M., He, J., Hicks, J., Huessner, R., Ingerly, D., Jain, P., James, R., Jong, L., Joshi, S., Kenyon, C., Kuhn, K., Lee, K., Liu, H., Maiz, J., McIntyre, B., Moon, P., Neirynck, J., Pae, S., Parker, C., Parsons, D., Prasad, C., Pipes, L., Prince, M., Ranade, P., Reynolds, T., Sandford, J., Shifren, L., Sebastian, J., Seiple, J., Simon, D., Sivakumar, S., Smith, P., Thomas, C., Troeger, T., Vandervoorn, P., Williams, S., Zawadzki, K.

المصدر: 2007 IEEE International Electron Devices Meeting Electron Devices Meeting, 2007. IEDM 2007. IEEE International. :247-250 Dec, 2007

Relation: 2007 IEEE International Electron Devices Meeting