المؤلفون: Smith, S., Tsiamis, A., McCallum, M., Hourd, A. C., Stevenson, J. T. M., Walton, A. J.

المصدر: 2010 International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2010 IEEE International Conference on. :24-29 Mar, 2010

Relation: 2010 International Conference on Microelectronic Test Structures (ICMTS)

المؤلفون: Smith, S., Tsiamis, A., McCallum, M., Hourd, A.C., Stevenson, J.T.M., Walton, A.J.

المصدر: 2006 IEEE International Conference on Microelectronic Test Structures Microelectronic Test Structures Microelectronic Test Structures, 2006. ICMTS 2006. IEEE International Conference on. :119-123 2006

Relation: Proceedings of the 2006 International Conference on Microelectronic Test Structures

المؤلفون: Smith, S., Walton, A.J., McCallum, M., Hourd, A.C., Stevenson, J.T.M., Ross, A.W.S.

المصدر: Proceedings of the 2005 International Conference on Microelectronic Test Structures, 2005. ICMTS 2005. Microelectronic Test Structures Microelectronic Test Structures, 2005. ICMTS 2005. Proceedings of the 2005 International Conference on. :17-22 2005

Relation: ICMTS 2005. Proceedings of the 2005 International Conference on Microelectronic Test Structures

المؤلفون: Smith, S., McCallum, M., Walton, A.J., Stevenson, J.T.M., Harris, P.D., Ross, A.W.S., Hourd, A.C., Jiang, L.

المصدر: Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat. No.04CH37516) Microelectronic test structures Microelectronic Test Structures, 2004. Proceedings. ICMTS '04. The International Conference on. :29-34 2004

Relation: Proceedings of the 2004 International Conference on Microelectronic Test Structures

المؤلفون: McCallum, M., Guillemin, B.

المصدر: IEEE Transactions on Audio, Speech, and Language Processing IEEE Trans. Audio Speech Lang. Process. Audio, Speech, and Language Processing, IEEE Transactions on. 21(7):1445-1457 Jul, 2013

المؤلفون: Smith, S., McCallum, M., Walton, A.J., Stevenson, J.T.M.

المصدر: Proceedings of the 2002 International Conference on Microelectronic Test Structures, 2002. ICMTS 2002. Microelectronic test structures Microelectronic Test Structures, 2002. ICMTS 2002. Proceedings of the 2002 International Conference on. :7-12 2002

Relation: ICMTS 2002. Proceedings of the 2002 International Conference on Microelectronic Test Structures

المؤلفون: Tsiamis, A., Smith, S., McCallum, M., Hourd, A., Stevenson, T., Walton, A. J.

المصدر: IEEE Transactions on Semiconductor Manufacturing IEEE Trans. Semicond. Manufact. Semiconductor Manufacturing, IEEE Transactions on. 25(2):162-169 May, 2012

المؤلفون: Scarpantonio, L., Cotton, S.A., Del Giorgio, E., McCallum, M., Hannon, M.J., Pikramenou, Z.

المصدر: In Journal of Inorganic Biochemistry August 2020 209

المؤلفون: Smith, S., Tsiamis, A., McCallum, M., Hourd, A. C., Stevenson, J. T. M., Walton, A. J., Dixson, R. G., Allen, R. A., Potzick, J. E., Cresswell, M. W., Orji, N. G.

المصدر: IEEE Transactions on Semiconductor Manufacturing IEEE Trans. Semicond. Manufact. Semiconductor Manufacturing, IEEE Transactions on. 22(1):72-79 Feb, 2009

المؤلفون: Smith, S., Tsiamis, A., McCallum, M., Hourd, A. C., Stevenson, J. T. M., Walton, A. J.

المصدر: IEEE Transactions on Semiconductor Manufacturing IEEE Trans. Semicond. Manufact. Semiconductor Manufacturing, IEEE Transactions on. 21(2):154-160 May, 2008