المؤلفون: Lu, J.P., Miles, D.S., DeLoach, J., Yue, D.F., Chen, P.J., Bonifield, T., Crank, S., Yu, S.F., Mehrad, F., Obeng, Y., Ramappa, D.A., Corum, D., Guldi, R.L., Robertson, L.S., Liu, X., Hall, L.H., Xu, Y.Q., Lin, B.Y., Griffin, A.J., Johnson, F.S., Grider, T., Mercer, D., Montgomery, C.

المصدر: 2006 International Workshop on Junction Technology Junction Technology, 2006. IWJT '06. International Workshop on. :127-133 2006

Relation: 2006 International Workshop on Junction Technology

المؤلفون: Yu, S., Lu, J.-P., Mehrad, F., Bu, H., Shanware, A., Ramin, M., Pas, M., Visokay, M.R., Vitale, S., Yang, S.-H., Jiang, P., Hall, L., Montgomery, C., Obeng, Y., Bowen, C., Hong, H., Tran, J., Chapman, R., Bushman, S., Machala, C., Blatchford, J., Kraft, R., Colombo, L., Johnson, S., McKee, B.

المصدر: IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. International Electron Devices Meeting 2005 Electron Devices Meeting, 2005. IEDM Technical Digest. IEEE International. :221-224 2005

Relation: International Electron Devices Meeting 2005

المؤلفون: Yang, S., Pollack, G., Wang, X., Potla, S., Baldwin, G., Chen, F., Mehrad, F., Tran, T., Sadra, K., Chidambaram, P.R., Chakravarthi, S., Bowen, C., Wells, G., Olsen, L., Wu, J., Houston, T., Machala, C., Johnson, S.

المصدر: 2003 International Symposium on VLSI Technology, Systems and Applications. Proceedings of Technical Papers. (IEEE Cat. No.03TH8672) VLSI technology, systems and applications VLSI Technology, Systems, and Applications, 2003 International Symposium on. :101-104 2003

Relation: 2003 International Symposium on VLSI Technology, Systems and Applications. Proceedings of Technical Papers

المؤلفون: Kaya, C., Middendorf, M., Mehrad, F., Tamer San, K., Huber, B.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 42(12):2131-2136 Dec, 1995

المؤلفون: Baldwin, G., Ai, J., Benaissa, K., Chen, F., Chidambaram, P.R., Ekbote, S., Ghneim, S., Liu, S., Machala, C., Mehrad, F., Mosher, D., Pollack, G., Tran, T., Williams, B., Yang, J., Yang, S., Johnson, F.S.

المصدر: 2003 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.03CH37407) VLSI technology VLSI Technology, 2003. Digest of Technical Papers. 2003 Symposium on. :87-88 2003

Relation: 2003 Symposium on VLSI Technology. Digest of Technical Papers

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تسجيل الدخول للوصول الكامل.

لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل.

لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل.

المساهمون: Mehrad, F

المصدر: Other Information: Thesis (Ph. D.)

وصف الملف: Medium: X; Size: Pages: 143

URL الوصول: http://www.osti.gov/scitech/biblio/6777146