المؤلفون: Lin Sze Khoo, Mei Kuan Lim, Chun Yong Chong, Roisin McNaney

المصدر: Sensors, Vol 24, Iss 2, p 348 (2024)

مصطلحات موضوعية: machine learning, mental health, multimodal detection, passive sensing, systematic review, Chemical technology, TP1-1185

وصف الملف: electronic resource

Relation: https://www.mdpi.com/1424-8220/24/2/348; https://doaj.org/toc/1424-8220

URL الوصول: https://doaj.org/article/0ddc5a215a6945cba0b782999e19efd8

المؤلفون: Su Lan Yang, Adiratna Mat Ripen, Chin Tho Leong, Jen Ven Lee, Chia How Yen, Avinash Kumar Chand, Karina Koh, Nur Aisyah Binti Abdul Rahim, Varaalakshmy Gokilavanan, Nik Nur Eliza binti Mohamed, Raj Kumar A/L. Sevalingam, Nadirah Sulaiman, Ahmad Kamil bin Ab Razak, Nurul Haslinda binti Mohd Nor, Mei Kuan Pong, Ket Yan Tai, Valerie Toh, Yuan Liang Woon, Kalaiarasu M. Peariasamy

المصدر: Emerging Microbes and Infections, Vol 11, Iss 1, Pp 1262-1271 (2022)

مصطلحات موضوعية: COVID-19, breakthrough, antibody, BNT162b2, healthcare worker, vaccine, Infectious and parasitic diseases, RC109-216, Microbiology, QR1-502

وصف الملف: electronic resource

Relation: https://doaj.org/toc/2222-1751

URL الوصول: https://doaj.org/article/debe5f5070da4f5fb56957d2067e2f83

المؤلفون: Pan, Wei Hung, Chok, Ming Jie, Wong, Jonathan Leong Shan, Shin, Yung Xin, Poon, Yeong Shian, Yang, Zhou, Chong, Chun Yong, Lo, David, Lim, Mei Kuan

المصدر: 2024 IEEE/ACM 46th International Conference on Software Engineering: Software Engineering Education and Training (ICSE-SEET) ICSE-SEET Software Engineering: Software Engineering Education and Training (ICSE-SEET), 2024 IEEE/ACM 46th International Conference on. :1-11 Apr, 2024

Relation: 2024 IEEE/ACM 46th International Conference on Software Engineering: Software Engineering Education and Training (ICSE-SEET)

المؤلفون: Pu, Muxin, Chong, Chun Yong, Lim, Mei Kuan

المصدر: 2023 IEEE/ACM 8th International Workshop on Metamorphic Testing (MET) MET Metamorphic Testing (MET), 2023 IEEE/ACM 8th International Workshop on. :31-38 May, 2023

Relation: 2023 IEEE/ACM 8th International Workshop on Metamorphic Testing (MET)

المؤلفون: Lim, Nyee Thoang, Yi Kuan, Meng, Pu, Muxin, Lim, Mei Kuan, Yong Chong, Chun

المصدر: 2022 26th International Conference on Pattern Recognition (ICPR) Pattern Recognition (ICPR), 2022 26th International Conference on. :2503-2509 Aug, 2022

Relation: 2022 26th International Conference on Pattern Recognition (ICPR)

المؤلفون: Pu, Muxin, Kuan, Meng Yi, Lim, Nyee Thoang, Chong, Chun Yong, Lim, Mei Kuan

المصدر: 2022 IEEE/ACM 7th International Workshop on Metamorphic Testing (MET) MET Metamorphic Testing (MET), 2022 IEEE/ACM 7th International Workshop on. :7-14 May, 2022

Relation: 2022 IEEE/ACM 7th International Workshop on Metamorphic Testing (MET)

المؤلفون: Liu, Demin, Mei, Kuan-Chun, Hu, Han-Wen, Tsai, Yi-Chieh, Cheng, Huang-Chung, Chen, Kuan-Neng

المصدر: 2022 IEEE 72nd Electronic Components and Technology Conference (ECTC) ECTC Electronic Components and Technology Conference (ECTC), 2022 IEEE 72nd. :187-193 May, 2022

Relation: 2022 IEEE 72nd Electronic Components and Technology Conference (ECTC)

المؤلفون: Lau, Julia Kaiwen, Kong, Kelvin Kai Wen, Yong, Julian Hao, Tan, Per Hoong, Yang, Zhou, Yong, Zi Qian, Low, Joshua Chern Wey, Chong, Chun Yong, Lim, Mei Kuan, Lo, David

مصطلحات موضوعية: Computer Science - Software Engineering

URL الوصول: http://arxiv.org/abs/2305.17445

المؤلفون: Yuen, Daniel Hao Xian, Pang, Andrew Yong Chen, Yang, Zhou, Chong, Chun Yong, Lim, Mei Kuan, Lo, David

مصطلحات موضوعية: Electrical Engineering and Systems Science - Audio and Speech Processing, Computer Science - Computation and Language, Computer Science - Sound, Computer Science - Software Engineering

URL الوصول: http://arxiv.org/abs/2302.05582

المؤلفون: Sheng, Sim Wai, Yee, Yip Sook, Raymond, Wong Jee Keen, Mei, Kuan Tze

المصدر: 2021 11th IEEE International Conference on Control System, Computing and Engineering (ICCSCE) Control System, Computing and Engineering (ICCSCE), 2021 11th IEEE International Conference on. :66-70 Aug, 2021

Relation: 2021 11th IEEE International Conference on Control System, Computing and Engineering (ICCSCE)