يعرض 1 - 10 نتائج من 40 نتيجة بحث عن '"Melzner, H."', وقت الاستعلام: 1.07s تنقيح النتائج
  1. 1
    دورية أكاديمية
    Micromechanical Adhesion Experiments and Simulation on Cu-Damascene Processed Test Devices

    المؤلفون: Heyn, W., Ananiev, S., Melzner, H., Goller, K., Zechner, J., Clausner, A., Zschech, E.

    المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 23(1):80-88 Mar, 2023

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  2. 2
    دورية أكاديمية
    Adhesion experiments on Cu-Damascene processed interconnect structures for mode III loading

    المؤلفون: Heyn, W., Melzner, H., Goller, K., Ananiev, S., Zechner, J., Clausner, A., Zschech, E.

    المصدر: In Microelectronics Reliability September 2023 148

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  3. 3
    مؤتمر
    Smaller is Better? Maximization of Good Chips per Wafer by Co-Optimization of Yield and Chip Area

    المؤلفون: Melzner, H.

    المصدر: The 17th Annual SEMI/IEEE ASMC 2006 Conference Advanced Semiconductor Manufacturing Conference, 2006. ASMC 2006. The 17th Annual SEMI/IEEE. :372-379 2006

    Relation: The 17th Annual SEMI/IEEE ASMC 2006 Conference

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  4. 4
    مؤتمر
    BEX-a novel wafer yield distribution model and analysis

    المؤلفون: Melzner, H., Darnhofer, T.

    المصدر: 2004 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop (IEEE Cat. No.04CH37530) Advanced semiconductor manufacturing Advanced Semiconductor Manufacturing, 2004. ASMC '04. IEEE Conference and Workshop. :105-109 2004

    Relation: 2004 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop

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  5. 5
    مؤتمر
    Statistical modeling and analysis of wafer test fail counts

    المؤلفون: Melzner, H.

    المصدر: 13th Annual IEEE/SEMI Advanced Semiconductor Manufacturing Conference. Advancing the Science and Technology of Semiconductor Manufacturing. ASMC 2002 (Cat. No.02CH37259) Advanced semiconductor manufacturing Advanced Semiconductor Manufacturing 2002 IEEE/SEMI Conference and Workshop. :266-271 2002

    Relation: 13th Annual IEEE/SEMI Advanced Semiconductor Manufacturing Conference. Advancing the Science and Technology of Semiconductor Manufacturing. ASMC 2002

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  6. 6
    دورية أكاديمية
    Maximization of Good Chips Per Wafer by Optimization of Memory Redundancy

    المؤلفون: Melzner, H., Olbrich, A.

    المصدر: IEEE Transactions on Semiconductor Manufacturing IEEE Trans. Semicond. Manufact. Semiconductor Manufacturing, IEEE Transactions on. 20(2):68-76 May, 2007

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  7. 7
    دورية أكاديمية
    Special Section on the Advanced Semiconductor Manufacturing Conference 2007 (ASMC 2007)

    المؤلفون: Patterson, O. D., Melzner, H., Beeg, T.

    المصدر: IEEE Transactions on Semiconductor Manufacturing IEEE Trans. Semicond. Manufact. Semiconductor Manufacturing, IEEE Transactions on. 21(3):306-307 Aug, 2008

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  8. 8
    مؤتمر
    A Self Aligned Contact Process with Improved Surface Planarization

    المؤلفون: Kusters, K.H., Sesselmann, W., Melzner, H., Friesel, B.

    المصدر: ESSDERC '88: 18th European Solid State Device Research Conference Solid State Device Research Conference, 1988. ESSDERC '88. 18th European. :c4-503-c4-506 Sep, 1988

    Relation: 18th European Solid State Device Research Conference

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  9. 9
    دورية أكاديمية
    Early inflammatory mediator response following isolated traumatic brain injury and other major trauma in humans

    المؤلفون: Arand, M., Melzner, H., Kinzl, L., Brückner, U., Gebhard, F.

    المصدر: Langenbeck’s Archives of Surgery. May 2001 386(4):241-248

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  10. 10
    مؤتمر
    Navigating in the density plane – achieving flat wafer surface and uniform metal thickness in CMP processes.

    المؤلفون: Melzner, H., Ning Cui, Postnikov, S.

    المصدر: Advanced Semiconductor Manufacturing Conference (ASMC), 2010 IEEE/SEMI; 2010, p189-195, 7p

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