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1دورية أكاديمية
المؤلفون: Wen-Teng Chang, Meng-His Li, Chun-Hao Hsu, Wen-Chin Lin, Wen-Kuan Yeh
المصدر: IEEE Open Journal of Nanotechnology, Vol 2, Pp 72-77 (2021)
مصطلحات موضوعية: Work function metal, threshold voltage tuning, energy-dispersive X-ray spectroscopy, FinFETs, reliability, Chemical technology, TP1-1185, Electrical engineering. Electronics. Nuclear engineering, TK1-9971
وصف الملف: electronic resource
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2
المؤلفون: Meng-His Li, Wen-Kuan Yeh, Wen-Teng Chang, Wen-Chin Lin, Chun-Hao Hsu
المصدر: IEEE Open Journal of Nanotechnology, Vol 2, Pp 72-77 (2021)
مصطلحات موضوعية: FinFETs, Materials science, TP1-1185, Hardware_PERFORMANCEANDRELIABILITY, law.invention, Hardware_GENERAL, law, Hardware_INTEGRATEDCIRCUITS, Metal gate, Leakage (electronics), Hot-carrier injection, reliability, threshold voltage tuning, business.industry, Chemical technology, Transistor, Work function metal, TK1-9971, Threshold voltage, CMOS, Logic gate, Optoelectronics, Electrical engineering. Electronics. Nuclear engineering, energy-dispersive X-ray spectroscopy, business, Hardware_LOGICDESIGN, Voltage