المؤلفون: Binish, C. J., Athira, Maria John, Chundattu, Sony J., Mankunipoyil, Sham Aan, Vijayasankar, A. V.^{Aff2, IDs10965023038330_cor5}

المصدر: Journal of Polymer Research. 30(12)

المؤلفون: Bu, Yanqiang^{Aff1, Aff2}, Zhang, Li, Ma, Dewei^{Aff3, IDs10562020034668_cor3}, Zhuge, Fei^{Aff2, IDs10562020034668_cor4}

المصدر: Catalysis Letters. 151(8):2396-2407

لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل.

المؤلفون: Tian, Jianjun^Aff5, Wang, Shixun^Aff5, Cao, Guozhong^Aff6

المساهمون: Derby, Brian, Series editor^Aff1, Lin, Zhiqun, editor^Aff2, Yang, Yingkui, editor^Aff3, Zhang, Aiqing, editor^Aff4

المصدر: Polymer-Engineered Nanostructures for Advanced Energy Applications. :635-679

المؤلفون: Wang, Zhong Lin^{Aff6, Aff7}, Lin, Long^Aff6, Chen, Jun^Aff6, Niu, Simiao^Aff6, Zi, Yunlong^Aff6

المساهمون: Wang, Zhong Lin^Aff1, Lin, Long^Aff2, Chen, Jun^Aff3, Niu, Simiao^Aff4, Zi, Yunlong^Aff5

المصدر: Triboelectric Nanogenerators. :23-47

المؤلفون: Canham, Leigh^Aff2

المساهمون: Canham, Leigh, editor^Aff1

المصدر: Handbook of Porous Silicon. :213-220

المؤلفون: Christian Ganser, Gerhard Fritz-Popovski, Roland Morak, Parvin Sharifi, Benedetta Marmiroli, Barbara Sartori, Heinz Amenitsch, Thomas Griesser, Christian Teichert, Oskar Paris

المصدر: Beilstein Journal of Nanotechnology, Vol 7, Iss 1, Pp 637-644 (2016)

مصطلحات موضوعية: AFM cantilever, bilayer bending, grazing incidence small-angle X-ray scattering (GISAXS), mesoporous film, sorption-induced deformation, Technology, Chemical technology, TP1-1185, Science, Physics, QC1-999

وصف الملف: electronic resource

Relation: https://doaj.org/toc/2190-4286

URL الوصول: https://doaj.org/article/7b7af4dd67b14192aae423085ce75609

المؤلفون: Tan, Min, Liu, Qiming

المصدر: Journal of Nanoparticle Research: An Interdisciplinary Forum for Nanoscale Science and Technology. December 2016 18(12):1-8

المؤلفون: Guldin, Stefan^Aff1

المساهمون: Guldin, Stefan^Aff2

المصدر: Inorganic Nanoarchitectures by Organic Self-Assembly. :71-85

المؤلفون: Stucky, Galen D.^Aff1_8, Bartl, Michael H.^Aff2_8

المساهمون: Ramanathan, Shriram, editor^AffID1

المصدر: Thin Film Metal-Oxides : Fundamentals and Applications in Electronics and Energy. :255-279