يعرض 1 - 10 نتائج من 509 نتيجة بحث عن '"Metra, C."', وقت الاستعلام: 1.00s تنقيح النتائج
  1. 1
    مؤتمر

    المصدر: 2024 IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS) On-Line Testing and Robust System Design (IOLTS), 2024 IEEE 30th International Symposium on. :1-6 Jul, 2024

    Relation: 2024 IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS)

  2. 2
    مؤتمر

    المؤلفون: Zhupa, M., Naldi, M., Omana, M., Metra, C.

    المصدر: 2024 IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS) On-Line Testing and Robust System Design (IOLTS), 2024 IEEE 30th International Symposium on. :1-3 Jul, 2024

    Relation: 2024 IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS)

  3. 3
    مؤتمر

    المؤلفون: Finelli, F., Omana, M., Metra, C.

    المصدر: 2022 IEEE 23rd Latin American Test Symposium (LATS) Latin American Test Symposium (LATS), 2022 IEEE 23rd. :1-6 Sep, 2022

    Relation: 2022 IEEE 23rd Latin American Test Symposium (LATS)

  4. 4
    دورية أكاديمية

    المؤلفون: Omana, M., Bardhan, S., Metra, C.

    المصدر: IEEE Transactions on Emerging Topics in Computing IEEE Trans. Emerg. Topics Comput. Emerging Topics in Computing, IEEE Transactions on. 10(4):2086-2091 Jan, 2022

  5. 5
    دورية أكاديمية
  6. 6
    دورية أكاديمية

    المصدر: IEEE Transactions on Very Large Scale Integration (VLSI) Systems IEEE Trans. VLSI Syst. Very Large Scale Integration (VLSI) Systems, IEEE Transactions on. 27(1):20-28 Jan, 2019

  7. 7
    دورية أكاديمية
  8. 8
    دورية أكاديمية

    المؤلفون: Metra, C.

    المصدر: IEEE Transactions on Emerging Topics in Computing IEEE Trans. Emerg. Topics Comput. Emerging Topics in Computing, IEEE Transactions on. 8(4):885-886 Jan, 2020

  9. 9
    مؤتمر

    المؤلفون: Omana, M., Fiore, A., Metra, C.

    المصدر: 2016 Design, Automation & Test in Europe Conference & Exhibition (DATE) Design, Automation & Test in Europe Conference & Exhibition (DATE), 2016. :672-677 Mar, 2016

    Relation: 2016 Design, Automation & Test in Europe Conference & Exhibition (DATE)

  10. 10
    دورية أكاديمية

    المصدر: IEEE Transactions on Very Large Scale Integration (VLSI) Systems IEEE Trans. VLSI Syst. Very Large Scale Integration (VLSI) Systems, IEEE Transactions on. 25(1):238-246 Jan, 2017