المؤلفون: Dazzi, F., Schweizer, T., Ceribella, G., Corti, D., Dettlaff, A., Garcia, J.R., Hafner, D., Herranz, D., Lopez-Moya, M., Mariotti, M., Maier, R., Metz, S., Mirzoyan, R., Nakajima, D., Saito, T., Shayduk, M., Sitarek, J., Strom, D., Teshima, M., Tran, S., Will, M.

المصدر: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 68(7):1473-1486 Jul, 2021

المؤلفون: Azadifar, M., Rubinstein, M., Rachidi, F., Rakov, V.A., Pavanello, D., Metz, S.

المصدر: 2018 34th International Conference on Lightning Protection (ICLP) Lightning Protection (ICLP), 2018 34th International Conference on. :1-6 Sep, 2018

Relation: 2018 34th International Conference on Lightning Protection (ICLP)

المؤلفون: Azadifar, M., Rachidi, F., Rubinstein, M., Paolone, M., Rakov, V.A., Pavanello, D., Metz, S., Romero, C.

المصدر: 2015 International Symposium on Lightning Protection (XIII SIPDA) Lightning Protection (XIII SIPDA), 2015 International Symposium on. :32-36 Sep, 2015

Relation: 2015 International Symposium on Lightning Protection (XIII SIPDA)

المؤلفون: Li, D., Azadifar, M., Rachidi, F., Rubinstein, M., Paolone, M., Pavanello, D., Metz, S., Zhang, Q., Wang, Z.

المصدر: IEEE Transactions on Electromagnetic Compatibility IEEE Trans. Electromagn. Compat. Electromagnetic Compatibility, IEEE Transactions on. 58(1):161-171 Feb, 2016

المؤلفون: Emlen Metz, S. (ORCID 0000-0001-5401-6508), Baelen, Rebecca N., Yu, Alisa (ORCID 0000-0002-6185-673X)

المصدر: Review of Education. Oct 2020 8(3):768-799.

Peer Reviewed: Y

Page Count: 32

Descriptors: Adolescents, Cognitive Development, Secondary School Students, Thinking Skills, Concept Formation, Empathy, Critical Thinking

المؤلفون: Liquin, Emily G, Metz, S Emlen, Lombrozo, Tania

المصدر: Proceedings of the Annual Meeting of the Cognitive Science Society. 40

مصطلحات موضوعية: explanation, mystery, science, religion

وصف الملف: application/pdf

URL الوصول: https://escholarship.org/uc/item/006843x6
https://escholarship.org/content/qt006843x6/qt006843x6.pdf

المؤلفون: Renaud, P., Metz, S., Jiguet, S., Bertsch, A.

المصدر: TRANSDUCERS '03. 12th International Conference on Solid-State Sensors, Actuators and Microsystems. Digest of Technical Papers (Cat. No.03TH8664) Solid-state sensors, actuators and microsystems TRANSDUCERS, Solid-State Sensors, Actuators and Microsystems, 12th International Conference on, 2003. 2:991-994 vol.2 2003

Relation: IEEE International Solid-State Sensors and Actuators Conference

المؤلفون: Metz, Kathleen Emlen, Cardace, Amy, Berson, Eric, Ly, Uyen, Wong, Nicole, Sisk-Hilton, Stephanie, Metz, S. Emlen, Wilson, Mark (ORCID 0000-0002-0425-5305)

المصدر: Journal of the Learning Sciences. 2019 28(4-5):556-615.

Peer Reviewed: Y

Page Count: 60

Sponsoring Agency: National Science Foundation (NSF)

Descriptors: Elementary School Science, Elementary School Students, Grade 2, Grade 3, Evolution, Scientific Literacy, Comprehension, Science Education, Science Process Skills, Abstract Reasoning, Epistemology, Science Curriculum, Instructional Design, Scientific Concepts

المؤلفون: Metz, S., Trautmann, C., Bertsch, A., Renaud, P.

المصدر: Technical Digest. MEMS 2002 IEEE International Conference. Fifteenth IEEE International Conference on Micro Electro Mechanical Systems (Cat. No.02CH37266) Microelectromechanical systems - MEMS 2002 Micro Electro Mechanical Systems, 2002. The Fifteenth IEEE International Conference on. :81-84 2002

Relation: Technical Digest. MEMS 2002 IEEE International Conference. Fifteenth IEEE International Conference on Micro Electro Mechanical Systems

المؤلفون: Henning, A.K., Mourlas, N., Metz, S., Zias, A.

المصدر: 13th Annual IEEE/SEMI Advanced Semiconductor Manufacturing Conference. Advancing the Science and Technology of Semiconductor Manufacturing. ASMC 2002 (Cat. No.02CH37259) Advanced semiconductor manufacturing Advanced Semiconductor Manufacturing 2002 IEEE/SEMI Conference and Workshop. :165-168 2002

Relation: 13th Annual IEEE/SEMI Advanced Semiconductor Manufacturing Conference. Advancing the Science and Technology of Semiconductor Manufacturing. ASMC 2002