المؤلفون: Li-Chun Tien, Jing-Jou Tang, Mi-Chang Chang

المصدر: Fifth International Workshop on System-on-Chip for Real-Time Applications (IWSOC'05) System-on-Chip for Real-Time Applications System-on-Chip for Real-Time Applications, 2005. Proceedings. Fifth International Workshop on. :295-300 2005

Relation: Proceedings. Fifth International Workshop on System-on-Chip for Real-Time Applications

المؤلفون: Huang, S.C., Lee, J.H., Lee, S.C., Chen, K.M., Song, M.H., Chiang, C.Y., Mi-Chang Chang

المصدر: IEEE International Integrated Reliability Workshop Final Report, 2004 Integrated reliability workshop Integrated Reliability Workshop Final Report, 2004 IEEE International. :169-172 2004

Relation: 2004 IEEE International Integrated Reliability Workshop Final Report

المؤلفون: Chung-Hui Chen, Yean-Kuen Fang, Chien-Chun Tsai, Shen Tu, Mark, K.L., Chen, K.L., Mi-Chang Chang

المصدر: Proceedings of the IEEE 2002 Custom Integrated Circuits Conference (Cat. No.02CH37285) Custom integrated circuits conference Custom Integrated Circuits Conference, 2002. Proceedings of the IEEE 2002. :89-92 2002

Relation: Proceedings of the IEEE 2002 Custom Integrated Circuits Conference

المؤلفون: Diaz, C.H., Mi-Chang Chang, Ong, T.C., Sun, J.Y.C.

المصدر: Proceedings of the IEEE 2002 Custom Integrated Circuits Conference (Cat. No.02CH37285) Custom integrated circuits conference Custom Integrated Circuits Conference, 2002. Proceedings of the IEEE 2002. :475-478 2002

Relation: Proceedings of the IEEE 2002 Custom Integrated Circuits Conference

المؤلفون: Amerasekera, A., Ramaswamy, S., Mi-Chang Chang, Duvvury, C.

المصدر: Proceedings of International Reliability Physics Symposium Reliability physics Reliability Physics Symposium, 1996. 34th Annual Proceedings., IEEE International. :318-326 1996

Relation: Proceedings of International Reliability Physics Symposium

المؤلفون: Liu, W., Bowen, C., Mi-Chang Chang

المصدر: International Electron Devices Meeting. Technical Digest Electron devices Electron Devices Meeting, 1996. IEDM '96., International. :151-154 1996

Relation: International Electron Devices Meeting. Technical Digest

المؤلفون: Wu, T.I., Chih, Y.D., Chen, S.H., Wang, W., Mi-Chang Chang, Shih, J.R., Chin, H.W., Wu, K.

المصدر: Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 (IEEE Cat. No.04TH8743) Physical and failure analysis of integrated circuits Physical and Failure Analysis of Integrated Circuits, 2004. IPFA 2004. Proceedings of the 11th International Symposium on the. :115-117 2004

Relation: Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004

المؤلفون: Shin-Puu Jeng, Mi-Chang Chang, Ting, L., Taylor, K., Lee, C., McAnally, P., Havemann, R.H.

المصدر: 1995 International Symposium on VLSI Technology, Systems, and Applications. Proceedings of Technical Papers VLSI technology, systems and applications VLSI Technology, Systems, and Applications, 1995. Proceedings of Technical Papers. 1995 International Symposium on. :164-168 1995

Relation: 1995 International Symposium on VLSI Technology, Systems, and Applications. Proceedings of Technical Papers

المؤلفون: Mi-Chang Chang, Jue-Hsien Chern

المصدر: 1993 International Symposium on VLSI Technology, Systems, and Applications Proceedings of Technical Papers VLSI Technology, Systems, and Applications, 1993. Proceedings of Technical Papers. 1993 International Symposium on. :142-146 1993

Relation: 1993 International Symposium on VLSI Technology, Systems, and Applications

المؤلفون: Diaz, C.H., Mi-Chang Chang, Tong-Chern Ong, Sun, J.Y.-C.

المصدر: IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 38(3):444-449 Mar, 2003