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1مؤتمر
المؤلفون: Li-Chun Tien, Jing-Jou Tang, Mi-Chang Chang
المصدر: Fifth International Workshop on System-on-Chip for Real-Time Applications (IWSOC'05) System-on-Chip for Real-Time Applications System-on-Chip for Real-Time Applications, 2005. Proceedings. Fifth International Workshop on. :295-300 2005
Relation: Proceedings. Fifth International Workshop on System-on-Chip for Real-Time Applications
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2مؤتمر
المؤلفون: Huang, S.C., Lee, J.H., Lee, S.C., Chen, K.M., Song, M.H., Chiang, C.Y., Mi-Chang Chang
المصدر: IEEE International Integrated Reliability Workshop Final Report, 2004 Integrated reliability workshop Integrated Reliability Workshop Final Report, 2004 IEEE International. :169-172 2004
Relation: 2004 IEEE International Integrated Reliability Workshop Final Report
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3مؤتمر
المؤلفون: Chung-Hui Chen, Yean-Kuen Fang, Chien-Chun Tsai, Shen Tu, Mark, K.L., Chen, K.L., Mi-Chang Chang
المصدر: Proceedings of the IEEE 2002 Custom Integrated Circuits Conference (Cat. No.02CH37285) Custom integrated circuits conference Custom Integrated Circuits Conference, 2002. Proceedings of the IEEE 2002. :89-92 2002
Relation: Proceedings of the IEEE 2002 Custom Integrated Circuits Conference
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4مؤتمر
المؤلفون: Diaz, C.H., Mi-Chang Chang, Ong, T.C., Sun, J.Y.C.
المصدر: Proceedings of the IEEE 2002 Custom Integrated Circuits Conference (Cat. No.02CH37285) Custom integrated circuits conference Custom Integrated Circuits Conference, 2002. Proceedings of the IEEE 2002. :475-478 2002
Relation: Proceedings of the IEEE 2002 Custom Integrated Circuits Conference
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5مؤتمر
المؤلفون: Amerasekera, A., Ramaswamy, S., Mi-Chang Chang, Duvvury, C.
المصدر: Proceedings of International Reliability Physics Symposium Reliability physics Reliability Physics Symposium, 1996. 34th Annual Proceedings., IEEE International. :318-326 1996
Relation: Proceedings of International Reliability Physics Symposium
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6مؤتمر
المؤلفون: Liu, W., Bowen, C., Mi-Chang Chang
المصدر: International Electron Devices Meeting. Technical Digest Electron devices Electron Devices Meeting, 1996. IEDM '96., International. :151-154 1996
Relation: International Electron Devices Meeting. Technical Digest
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7مؤتمر
المؤلفون: Wu, T.I., Chih, Y.D., Chen, S.H., Wang, W., Mi-Chang Chang, Shih, J.R., Chin, H.W., Wu, K.
المصدر: Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 (IEEE Cat. No.04TH8743) Physical and failure analysis of integrated circuits Physical and Failure Analysis of Integrated Circuits, 2004. IPFA 2004. Proceedings of the 11th International Symposium on the. :115-117 2004
Relation: Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004
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8مؤتمر
المؤلفون: Shin-Puu Jeng, Mi-Chang Chang, Ting, L., Taylor, K., Lee, C., McAnally, P., Havemann, R.H.
المصدر: 1995 International Symposium on VLSI Technology, Systems, and Applications. Proceedings of Technical Papers VLSI technology, systems and applications VLSI Technology, Systems, and Applications, 1995. Proceedings of Technical Papers. 1995 International Symposium on. :164-168 1995
Relation: 1995 International Symposium on VLSI Technology, Systems, and Applications. Proceedings of Technical Papers
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9مؤتمر
المؤلفون: Mi-Chang Chang, Jue-Hsien Chern
المصدر: 1993 International Symposium on VLSI Technology, Systems, and Applications Proceedings of Technical Papers VLSI Technology, Systems, and Applications, 1993. Proceedings of Technical Papers. 1993 International Symposium on. :142-146 1993
Relation: 1993 International Symposium on VLSI Technology, Systems, and Applications
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10دورية أكاديمية
المؤلفون: Diaz, C.H., Mi-Chang Chang, Tong-Chern Ong, Sun, J.Y.-C.
المصدر: IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 38(3):444-449 Mar, 2003