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المصدر: SPIE Proceedings.
مصطلحات موضوعية: Materials science, Cardinal point, Optics, Pixel, CMOS, business.industry, Microbolometer, business, Sensitivity (electronics), Dot pitch
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::47f35849ad3b5be1bf32d13eb3c48c4d
https://doi.org/10.1117/12.723474