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1مؤتمر
المؤلفون: Jungdong Kim, Donghun Kim, Minhyeok Choe, Kidan Bae, Sangchul Shin, Sangwoo Pae, Park, Jongwoo
المصدر: 2014 IEEE International Reliability Physics Symposium Reliability Physics Symposium, 2014 IEEE International. :3B.4.1-3B.4.3 Jun, 2014
Relation: 2014 IEEE International Reliability Physics Symposium (IRPS)
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المؤلفون: Sangsu Ha, Hyun-Jin Kim, Tae-Young Jeong, Sang-chul Shin, Minhyeok Choe, Sungyoung Yoon, Hyewon Shim, Hyun Chul Sagong, Junekyun Park, Seungjin Choo, Sangwoo Pae
المصدر: IRPS
مصطلحات موضوعية: 010302 applied physics, Pressure range, Materials science, Reliability (semiconductor), Passivation, 0103 physical sciences, Gate dielectric, Dangling bond, Process (computing), Forming gas, 01 natural sciences, Engineering physics, Characterization (materials science)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::f4681acc47ccbe4c0e653bb26a07d76d
https://doi.org/10.1109/irps.2018.8353649 -
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المؤلفون: Byoung Hun Lee, Jongwoo Park, Young Gon Lee, Jin Ju Kim, Kyong Taek Lee, Yonghun Kim, Minhyeok Choe, Ukjin Jung, Sangwoo Pae
المصدر: IEEE Transactions on Electron Devices. 62:1092-1097
مصطلحات موضوعية: Materials science, Gate oxide, Gate dielectric, MOSFET, Extraction (chemistry), Analytical chemistry, Time domain, Electrical and Electronic Engineering, Reflectometry, Capacitance, Electronic, Optical and Magnetic Materials, High-κ dielectric
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::a7b4ce081bdf1bcd847c449d87e287ab
https://doi.org/10.1109/ted.2015.2404920
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4
المؤلفون: Gunho Jo, Woojin Park, Kwanghee Lee, Jongwon Yoon, Minhyeok Choe, Sang Chul Lee, Sung-Oong Kang, Yung Ho Kahng, Takhee Lee
المصدر: Journal of Nanoscience and Nanotechnology. 14:4982-4987
مصطلحات موضوعية: Materials science, Atomic force microscopy, Graphene, Inorganic chemistry, Biomedical Engineering, chemistry.chemical_element, Bioengineering, General Chemistry, Chemical vapor deposition, Condensed Matter Physics, Catalysis, law.invention, Nickel, Carbon film, Amorphous carbon, chemistry, law, General Materials Science, Nanometre
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a6e60f1b8cb1794fd9d46a6ea6c7fab2
https://doi.org/10.1166/jnn.2014.8411 -
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المؤلفون: Kwangsoo Kim, Kyung Taek Lee, Minhyeok Choe, Sungeun Kim, Jongwoo Park, Kidan Bae, Junekyun Park, Sangwoo Pae, Hyun-Woo Lee, Hyun Chul Sagong
المصدر: ECS Transactions. 58:3-7
مصطلحات موضوعية: Materials science, Fabrication, Dielectric strength, business.industry, Annealing (metallurgy), Transistor, chemistry.chemical_element, Time-dependent gate oxide breakdown, law.invention, chemistry, law, Optoelectronics, business, Tin, Metal gate, Algorithm, High-κ dielectric
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المؤلفون: Takhee Lee, Yung Ho Kahng, Woong-Ki Hong, Minhyeok Choe, Gunho Jo, Woojin Park
المصدر: IEEE Transactions on Nanotechnology. 11:918-923
مصطلحات موضوعية: Materials science, business.industry, Bilayer, Gate dielectric, Nanowire, Wide-bandgap semiconductor, Dielectric, Computer Science Applications, Threshold voltage, Electric field, Optoelectronics, Field-effect transistor, Electrical and Electronic Engineering, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::a05922480f92d80d64a7b7c3242059cf
https://doi.org/10.1109/tnano.2012.2206607
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المؤلفون: Woong-Ki Hong, Gunho Jo, Jung Inn Sohn, Mark E. Welland, Minhyeok Choe, Takhee Lee
مصطلحات موضوعية: Materials science, Photoluminescence, Physics and Astronomy (miscellaneous), Condensed matter physics, Condensed Matter::Other, business.industry, Phonon, Exciton, Nanowire, Wide-bandgap semiconductor, Surface finish, Condensed Matter::Mesoscopic Systems and Quantum Hall Effect, Crystallographic defect, Condensed Matter::Materials Science, Surface roughness, Optoelectronics, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::56fe5465095385c4bae42b09d9487e37
https://ora.ox.ac.uk/objects/uuid:9e1531ab-580c-438a-81fd-5525377bda6b -
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المؤلفون: Minhyeok Choe, Sangmin Park, Wooyeon Kim, Jongwoo Park, Hyunjo Shin, Jeong-Hoon Kim, Yunwhan Kim, Jiheon Jeong, Hyewon Shim, Sangwoo Pae, Sang-chul Shin, Haebum Lee
المصدر: 2016 IEEE International Reliability Physics Symposium (IRPS).
مصطلحات موضوعية: Engineering, business.industry, Design for testing, media_common.quotation_subject, Volume (computing), Failure rate, Reliability engineering, Set (abstract data type), Stress test, Product (mathematics), Quality (business), business, Reliability (statistics), media_common
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::d2f742af3d7ac9d36c392b528eb78c86
https://doi.org/10.1109/irps.2016.7574583 -
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المؤلفون: Taehyeon Kwon, Mark E. Welland, Gunho Jo, Woong-Ki Hong, Jongwon Yoon, Woojin Park, Takhee Lee, Minhyeok Choe
المصدر: Thin Solid Films. 520:3624-3628
مصطلحات موضوعية: Materials science, Proton, business.industry, Photoconductivity, Metals and Alloys, Nanowire, Surfaces and Interfaces, Fluence, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Threshold voltage, Depletion region, Materials Chemistry, Optoelectronics, Field-effect transistor, Irradiation, business
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10Proton Irradiation Effects on Resistive Random Access Memory With ZrO$_{\rm x}$/HfO$_{\rm x}$ Stacks
المؤلفون: Daeseok Lee, Jubong Park, Hyunsang Hwang, Minhyeok Choe, Kuyyadi P. Biju, Seonghyun Kim, Joonmyoung Lee, Seungjae Jung, Takhee Lee
المصدر: IEEE Transactions on Nuclear Science. 58:3317-3320
مصطلحات موضوعية: Nuclear and High Energy Physics, Materials science, business.industry, Electrical engineering, Analytical chemistry, Trapping, Radiation, Active layer, Resistive random-access memory, High resistance, Nuclear Energy and Engineering, Electrical conduction, Irradiation, Electrical and Electronic Engineering, business, Leakage (electronics)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::957d4f6258497eb77051e644af02f1b4
https://doi.org/10.1109/tns.2011.2165731
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