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المؤلفون: Minjung Jin, Sunghae Kim
المصدر: Sociétés. :63-74
مصطلحات موضوعية: Sociology and Political Science, Arts and Humanities (miscellaneous), Demography
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::225b00a0ab408ab12ee62f447273fd40
https://doi.org/10.3917/soc.145.0063 -
2
المؤلفون: Myungsoo Yeo, Hyunchul Sagong, Eun-Cheol Lee, Kihyun Choi, Tae-Young Jeong, Minjung Jin, Hai Jiang, Hwa-Sung Rhee
المصدر: 2020 IEEE International Integrated Reliability Workshop (IIRW).
مصطلحات موضوعية: Materials science, Reliability (semiconductor), business.industry, Technology scaling, Optoelectronics, Thermal coupling, Time-dependent gate oxide breakdown, business, Self heating, Joule heating
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::759391534604a5f7823384432169023d
https://doi.org/10.1109/iirw49815.2020.9312859 -
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المؤلفون: Minjung Jin, Soonwan Kwon, Taiki Uemura, Y. Kim, J.M. Park, Hwa-Sung Rhee, Young-Joon Cho, Mi-Hyang Lee, Bomi Kim, Kihyun Choi, Tae-Young Jeong, Myeong-cheol Kim, Hyewon Shim, Hai Jiang, Hyunchul Sagong, K. Kim, Won-Jin Kim, Hyeonwoo Nam, D. Mun, Sangwoo Pae, E. Kwon, Myungsoo Yeo, Bang-Lin Lee
المصدر: 2020 IEEE Symposium on VLSI Technology.
مصطلحات موضوعية: business.industry, Computer science, Extreme ultraviolet lithography, Transistor, Electromagnetic compatibility, Automotive industry, Chip, law.invention, law, Electronic engineering, Static random-access memory, business, 5G, Common emitter
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::612047cdc3eb0b3d16f46a21e99263a3
https://doi.org/10.1109/vlsitechnology18217.2020.9265018 -
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المؤلفون: Kangjung Kim, Gunrae Kim, Yoohwan Kim, Hyewon Shim, Sangwoo Pae, Jinju Kim, Minjung Jin
المصدر: Microelectronics Reliability. 81:201-209
مصطلحات موضوعية: Materials science, business.industry, 020208 electrical & electronic engineering, Transistor, 02 engineering and technology, Ring oscillator, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, 020202 computer hardware & architecture, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, law.invention, Reliability (semiconductor), Stack (abstract data type), Modulation, law, 0202 electrical engineering, electronic engineering, information engineering, Optoelectronics, Static random-access memory, Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, business, High-κ dielectric, Electronic circuit
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المؤلفون: Jinju Kim, Minjung Jin, Sangwoo Pae, Hyunchul Sagong
المصدر: 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
مصطلحات موضوعية: 010302 applied physics, Critical space, Semiconductor device fabrication, Robustness (computer science), Computer science, 020208 electrical & electronic engineering, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Time-dependent gate oxide breakdown, 02 engineering and technology, 01 natural sciences, Reliability engineering
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::bb0fa1320e70279339033c735949890f
https://doi.org/10.1109/ipfa.2018.8452491 -
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المؤلفون: Sang-chul Shin, Jinju Kim, Hyunchul Sagong, Minhyuck Choi, Ukjin Jung, Sangwoo Pae, Hyun-Jin Kim, Minjung Jin, Junekyun Park
المصدر: IRPS
مصطلحات موضوعية: 010302 applied physics, Materials science, Gate oxide, business.industry, 0103 physical sciences, Gate dielectric, Optoelectronics, Time-dependent gate oxide breakdown, SILC, business, 01 natural sciences
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::2e9ad79cf416735443e8d350cacd726e
https://doi.org/10.1109/irps.2018.8353577 -
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المؤلفون: Taiki Uemura, Jungin Kim, Jinju Kim, Hyun Chul Sagong, Gunrae Kim, Ukjin Jung, Changze Liu, Sangwoo Pae, Sang-chul Shin, Junekyun Park, Minjung Jin
المصدر: 2017 IEEE International Reliability Physics Symposium (IRPS).
مصطلحات موضوعية: 010302 applied physics, Engineering, Variation (linguistics), business.industry, 0103 physical sciences, Electronic engineering, Node (circuits), Static random-access memory, business, 01 natural sciences, Reliability (statistics), Reliability engineering
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9895eb26a05ceb92006dad815918217e
https://doi.org/10.1109/irps.2017.7936416 -
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المؤلفون: Hyewon Shim, Minjung Jin, Jongsun Bae, Changze Liu, Sangwoo Pae, Yoohwan Kim
المصدر: 2017 IEEE International Reliability Physics Symposium (IRPS).
مصطلحات موضوعية: 010302 applied physics, Engineering, Negative-bias temperature instability, business.industry, 020208 electrical & electronic engineering, Hardware_PERFORMANCEANDRELIABILITY, 02 engineering and technology, Ring oscillator, 01 natural sciences, Stress (mechanics), Reliability (semiconductor), Duty cycle, 0103 physical sciences, Hardware_INTEGRATEDCIRCUITS, 0202 electrical engineering, electronic engineering, information engineering, Electronic engineering, Stress time, business, Electronic circuit, Hot-carrier injection
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e3dbf719a748b8f314363ad3220b8654
https://doi.org/10.1109/irps.2017.7936313 -
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المؤلفون: Junekyun Park, Taiki Uemura, Taehyun An, Soonyoung Lee, Sangwoo Pae, Man Chang, Minjung Jin, Jinju Kim, Changze Liu, Jungin Kim, Kangjung Kim, Hyewon Shim, Gunrae Kim
المصدر: 2016 IEEE International Electron Devices Meeting (IEDM).
مصطلحات موضوعية: 010302 applied physics, Engineering, business.industry, 020208 electrical & electronic engineering, Transistor, Electrical engineering, Time-dependent gate oxide breakdown, 02 engineering and technology, 01 natural sciences, PMOS logic, law.invention, Reliability (semiconductor), Stack (abstract data type), law, Logic gate, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Electronic engineering, Node (circuits), Static random-access memory, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9958675bab4dfade9e2c908d044ef77b
https://doi.org/10.1109/iedm.2016.7838420 -
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المؤلفون: Minjung Jin, Yoohwan Kim, Haebum Lee, Changze Liu, Jinju Kim, Lijie Zhang, Sangwoo Pae, Kab-Jin Nam, Hyewon Shim, Jongwoo Park, Seungjin Choo, Jungin Kim
المصدر: 2016 IEEE International Reliability Physics Symposium (IRPS).
مصطلحات موضوعية: 010302 applied physics, Negative-bias temperature instability, Materials science, business.industry, ComputingMethodologies_MISCELLANEOUS, Hardware_PERFORMANCEANDRELIABILITY, 02 engineering and technology, Ring oscillator, Nanosecond, 01 natural sciences, 020202 computer hardware & architecture, Characterization (materials science), Stress (mechanics), Reliability (semiconductor), 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Electronic engineering, Optoelectronics, Waveform, InformationSystems_MISCELLANEOUS, business, Hot-carrier injection
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::59e568f95eb0dfd6ab6fce4834764d97
https://doi.org/10.1109/irps.2016.7574505