المؤلفون: Bouhana, E., Scheer, P., Boret, S., Gloria, D., Dambrine, G., Minondo, M., Jaouen, H.

المصدر: 2006 IEEE International Conference on Microelectronic Test Structures Microelectronic Test Structures Microelectronic Test Structures, 2006. ICMTS 2006. IEEE International Conference on. :65-70 2006

Relation: Proceedings of the 2006 International Conference on Microelectronic Test Structures

المؤلفون: Manceau, J.-P., Bruyere, S., Picollet, E., Minondo, M., Grundrich, C., Cottin, D., Bely, M.

المصدر: 2006 IEEE International Conference on Microelectronic Test Structures Microelectronic Test Structures Microelectronic Test Structures, 2006. ICMTS 2006. IEEE International Conference on. :199-204 2006

Relation: Proceedings of the 2006 International Conference on Microelectronic Test Structures

المؤلفون: Canepari, A., Bertrand, G., Minondo, M., Jourdan, N., Chante, J.-P.

المصدر: Research in Microelectronics and Electronics, 2005 PhD Microelectronics and Electronics Research in Microelectronics and Electronics, 2005 PhD. 2:71-74 2005

Relation: 2005 PhD Research in Microelectronics and Electronics

المؤلفون: Gilibert, F., Rideau, D., Payet, F., Boeuf, F., Batail, E., Minondo, M., Bouchakour, R., Skotnicki, T., Jaouen, H.

المصدر: Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005. Solid-State Device Research Conference Solid-State Device Research Conference, 2005. ESSDERC 2005. Proceedings of 35th European. :281-284 2005

Relation: Proceedings of ESSDERC 2005. 31st European Solid-State Device Research Conference

المؤلفون: Canepari, A., Bertrand, G., Giry, A., Minondo, M., Blanchet, F., Jaouen, H., Reynard, B., Jourdan, N., Chante, J.-P.

المصدر: Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005. Solid-State Device Research Conference Solid-State Device Research Conference, 2005. ESSDERC 2005. Proceedings of 35th European. :469-472 2005

Relation: Proceedings of ESSDERC 2005. 31st European Solid-State Device Research Conference

المؤلفون: Rideau, D., Dray, A., Gilibert, F., Agut, F., Giguerre, L., Gouget, G., Minondo, M., Juge, A.

المصدر: Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat. No.04CH37516) Microelectronic test structures Microelectronic Test Structures, 2004. Proceedings. ICMTS '04. The International Conference on. :149-154 2004

Relation: Proceedings of the 2004 International Conference on Microelectronic Test Structures

المؤلفون: Rideau, D., Scheer, P., Roy, D., Gouget, G., Minondo, M., Juge, A.

المصدر: International Conference on Microelectronic Test Structures, 2003. Microelectronic test structures Microelectronic Test Structures, 2003. International Conference on. :191-196 2003

Relation: ICMTS 2002. Proceedings of the 2003 International Conference on Microelectronic Test Structures

المؤلفون: Minondo, M., Gouget, G., Juge, A.

المصدر: ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures (Cat. No.01CH37153) Microelectronic test structures Microelectronic Test Structures, 2001. ICMTS 2001. Proceedings of the 2001 International Conference on. :263-267 2001

Relation: ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures

المؤلفون: Minondo, M., Boussey, J., Kamarinos, G.

المصدر: Proceedings of International Conference on Microelectronics Microelectronics Microelectronics, 1995. Proceedings., 1995 20th International Conference on. 1:47-50 vol.1 1995

Relation: Proceedings of International Conference on Microelectronics

المؤلفون: Hniki, S., Bertrand, G., Ortolland, S., Minondo, M., Rauber, B., Raynaud, C., Giry, A., Bon, O., Jaouen, H., Morancho, F.

المصدر: 2009 Proceedings of the European Solid State Device Research Conference Solid State Device Research Conference, 2009. ESSDERC '09. Proceedings of the European. :296-299 Sep, 2009

Relation: 2009 Proceedings of the European Solid State Device Research Conference (ESSDERC)