-
1مؤتمر
المؤلفون: Mostaccio, Alessio, Miozzi, Carolina, Amendola, Sara, Occhiuzzi, Cecilia, Marrocco, Gaetano
المصدر: 2024 IEEE International Workshop on Metrology for Industry 4.0 & IoT (MetroInd4.0 & IoT) Metrology for Industry 4.0 & IoT (MetroInd4.0 & IoT), 2024 IEEE International Workshop on. :506-511 May, 2024
Relation: 2024 IEEE International Workshop on Metrology for Industry 4.0 & IoT (MetroInd4.0 & IoT)
-
2مؤتمر
المؤلفون: Miozzi, Carolina, D'Uva, Nicola, Amendola, Sara, Maggiolini, Enrico, Bianchi, Andrea, Occhiuzzi, Cecilia, Marrocco, Gaetano
المصدر: 2023 IEEE International Workshop on Metrology for Industry 4.0 & IoT (MetroInd4.0&IoT) Metrology for Industry 4.0 & IoT (MetroInd4.0&IoT), 2023 IEEE International Workshop on. :84-89 Jun, 2023
Relation: 2023 IEEE International Workshop on Metrology for Industry 4.0 & IoT (MetroInd4.0&IoT)
-
3مؤتمر
المؤلفون: Bianco, Giulio Maria, Raso, Emanuele, Fiore, Luca, Riente, Alessia, Barba, Adina Bianca, Miozzi, Carolina, Bracciale, Lorenzo, Arduini, Fabiana, Loreti, Pierpaolo, Marrocco, Gaetano, Occhiuzzi, Cecilia
المصدر: 2022 IEEE 12th International Conference on RFID Technology and Applications (RFID-TA) RFID Technology and Applications (RFID-TA), 2022 IEEE 12th International Conference on. :142-145 Sep, 2022
Relation: 2022 IEEE 12th International Conference on RFID Technology and Applications (RFID-TA)
-
4مؤتمر
المؤلفون: Miozzi, Carolina, Stendardo, Giorgia, Bianco, Giulio Maria, Montecchia, Franscesco, Marrocco, Gaetano
المصدر: 2021 IEEE International Conference on RFID (RFID) RFID (RFID), 2021 IEEE International Conference on. :1-6 Apr, 2021
Relation: 2021 IEEE International Conference on RFID (RFID)
-
5تقرير
المؤلفون: Occhiuzzi, Cecilia, Camera, Francesca, D'Orazio, Michele, D'Uva, Nicola, Amendola, Sara, Bianco, Giulio Maria, Miozzi, Carolina, Garavaglia, Luigi, Martinelli, Eugenio, Marrocco, Gaetano
المصدر: IEEE Journal of Radio Frequency Identification, 2022
مصطلحات موضوعية: Electrical Engineering and Systems Science - Systems and Control, Computer Science - Machine Learning, Electrical Engineering and Systems Science - Signal Processing
URL الوصول: http://arxiv.org/abs/2204.12415
-
6مؤتمر
المصدر: 2020 IEEE International Workshop on Metrology for Industry 4.0 & IoT Metrology for Industry 4.0 & IoT, 2020 IEEE International Workshop on. :202-206 Jun, 2020
Relation: 2020 IEEE International Workshop on Metrology for Industry 4.0 & IoT (MetroInd4.0&IoT)
-
7مؤتمر
المؤلفون: Amato, Francesco, Miozzi, Carolina, Nappi, Simone, Marrocco, Gaetano
المصدر: 2019 IEEE International Conference on RFID Technology and Applications (RFID-TA) RFID Technology and Applications (RFID-TA), 2019 IEEE International Conference on. :380-383 Sep, 2019
Relation: 2019 IEEE International Conference on RFID Technology and Applications (RFID-TA)
-
8مؤتمر
المؤلفون: Camera, Francesca, Occhiuzzi, Cecilia, Miozzi, Carolina, Nappi, Simone, Bozzo, Andrea, Tomola, Paolo, Bin, Alessandra, Marrocco, Gaetano
المصدر: 2019 IEEE International Conference on RFID Technology and Applications (RFID-TA) RFID Technology and Applications (RFID-TA), 2019 IEEE International Conference on. :499-504 Sep, 2019
Relation: 2019 IEEE International Conference on RFID Technology and Applications (RFID-TA)
-
9كتاب إلكتروني
المؤلفون: Miozzi, CarolinaAff39, Errico, VitoAff39, Saggio, GiovanniAff39, Marrocco, GaetanoAff40
المساهمون: Angrisani, Leopoldo, Series EditorAff1, Arteaga, Marco, Series EditorAff2, Panigrahi, Bijaya Ketan, Series EditorAff3, Chakraborty, Samarjit, Series EditorAff4, Chen, Jiming, Series EditorAff5, Chen, Shanben, Series EditorAff6, Chen, Tan Kay, Series EditorAff7, Dillmann, Rüdiger, Series EditorAff8, Duan, Haibin, Series EditorAff9, Ferrari, Gianluigi, Series EditorAff10, Ferre, Manuel, Series EditorAff11, Hirche, Sandra, Series EditorAff12, Jabbari, Faryar, Series EditorAff13, Jia, Limin, Series EditorAff14, Kacprzyk, Janusz, Series EditorAff15, Khamis, Alaa, Series EditorAff16, Kroeger, Torsten, Series EditorAff17, Li, Yong, Series EditorAff18, Liang, Qilian, Series EditorAff19, Martín, Ferran, Series EditorAff20, Ming, Tan Cher, Series EditorAff21, Minker, Wolfgang, Series EditorAff22, Misra, Pradeep, Series EditorAff23, Möller, Sebastian, Series EditorAff24, Mukhopadhyay, Subhas, Series EditorAff25, Ning, Cun-Zheng, Series EditorAff26, Nishida, Toyoaki, Series EditorAff27, Oneto, Luca, Series EditorAff28, Pascucci, Federica, Series EditorAff29, Qin, Yong, Series EditorAff30, Seng, Gan Woon, Series EditorAff31, Speidel, Joachim, Series EditorAff32, Veiga, Germano, Series EditorAff33, Wu, Haitao, Series EditorAff34, Zamboni, Walter, Series EditorAff35, Zhang, Junjie James, Series EditorAff36, Di Francia, Girolamo, editorAff37, Di Natale, Corrado, editorAff38
المصدر: Sensors and Microsystems : Proceedings of AISEM 2021 – In Memory of Arnaldo D’Amico. 918:176-181
-
10كتاب إلكتروني
المؤلفون: Miozzi, CarolinaAff10, Amendola, SaraAff10, Bergamini, AlbertoAff11, Marrocco, GaetanoAff10
المساهمون: Magjarevic, Ratko, Editor-in-chiefAff1, Ładyżyński, Piotr, Series editorAff2, Ibrahim, Fatimah, Series editorAff3, Lacković, Igor, Series editorAff4, Rock, Emilio Sacristan, Series editorAff5, Eskola, Hannu, editorAff6, Väisänen, Outi, editorAff7, Viik, Jari, editorAff8, Hyttinen, Jari, editorAff9
المصدر: EMBEC & NBC 2017 : Joint Conference of the European Medical and Biological Engineering Conference (EMBEC) and the Nordic-Baltic Conference on Biomedical Engineering and Medical Physics (NBC), Tampere, Finland, June 2017. 65:1041-1044