المؤلفون: Mise, N., Watanabe, Y., Migita, S., Nabatame, T., Satake, H., Toriumi, A.

المصدر: 2006 International Workshop on Junction Technology Junction Technology, 2006. IWJT '06. International Workshop on. :170-175 2006

Relation: 2006 International Workshop on Junction Technology

المؤلفون: Nabatame, T., Kadoshima, M., Iwamoto, K., Mise, N., Migita, S., Ohno, M., Ota, H., Yasuda, N., Ogawa, A., Tominaga, K., Satake, H., Toriumi, A.

المصدر: IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :83-86 2004

Relation: 2004 International Electron Devices Meeting

المؤلفون: Mise, N., Ono, T., Usui, T.

المصدر: 2003 8th International Symposium Plasma- and Process-Induced Damage. Plasma- and process-induced damage Plasma- and Process-Induced Damage, 2003 8th International Symposium. :174-177 2003

Relation: 2003 8th International Symposium on Plasma- and Process-Induced Damage

المؤلفون: Mise, N., Hirasawa, S., Tamaru, T., Okudaira, S., Oomori, K., Usui, T., Maeno, R., Saikawa, T.

المصدر: 2001 6th International Symposium on Plasma- and Process-Induced Damage (IEEE Cat. No.01TH8538) Plasma- and process-induced damage Plasma- and Process-Induced Damage, 2001 6th International Symposium on. :108-111 2001

Relation: 2001 6th International Symposium on Plasma- and Process-Induced Damage

المؤلفون: Mise, N., Usui, T., Tanaka, J., Nojiri, K., Ono, T.

المصدر: 2000 5th International Symposium on Plasma Process-Induced Damage (IEEE Cat. No.00TH8479) Plasma process-induced damage Plasma Process-Induced Damage, 2000 5th International Symposium on. :46-49 2000

Relation: 2000 5th International Symposium on Plasma Process-Induced Damage

المؤلفون: Mise, N., Ogawa, A., Tonomura, O., Sekiguchi, T., Horii, S., Itatani, H., Saito, T., Sakai, M., Takebayashi, Y., Yamazaki, H., Torii, K.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 57(9):2080-2086 Sep, 2010

المؤلفون: Mise, N., Morooka, T., Eimori, T., Ono, T., Sato, M., Kamiyama, S., Nara, Y., Ohji, Y.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 56(1):85-92 Jan, 2009

المؤلفون: Mise, N., Migita, S., Watanabe, Y., Satake, H., Nabatame, T., Toriumi, A.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 55(5):1244-1249 May, 2008

المؤلفون: Mise, N., Tonomura, O., Sekiguchi, T., Horii, S., Itatani, H., Ogawa, A., Saito, T., Sakai, M., Takebayashi, Y., Yamazaki, H., Torii, K.

المصدر: 2009 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2009 IEEE International. :1-4 Dec, 2009

Relation: 2009 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Sato, M., Umezawa, N., Shimokawa, J., Arimura, H., Sugino, S., Tachibana, A., Nakamura, M., Mise, N., Kamiyama, S., Morooka, T., Eimori, T., Shiraishi, K., Yamabe, K., Watanabe, H., Yamada, K., Aoyama, T., Nabatame, T., Nara, Y., Ohji, Y.

المصدر: 2008 IEEE International Electron Devices Meeting Electron Devices Meeting, 2008. IEDM 2008. IEEE International. :1-4 Dec, 2008

Relation: 2008 IEEE International Electron Devices Meeting (IEDM)