المؤلفون: Cartier, E., Majumdar, A., Lee, K.-T., Ando, T., Frank, M. M., Rozen, J., Jenkins, K. A., Liang, C., Cheng, C.-W., Bruley, J., Hopstaken, M., Kerber, P., Yau, J.-B., Sun, X., Mo, R. T., Yeh, C.-C., Leobandung, E., Narayanan, V.

المصدر: 2017 47th European Solid-State Device Research Conference (ESSDERC) Solid-State Device Research Conference (ESSDERC), 2017 47th European. :292-295 Sep, 2017

Relation: ESSDERC 2017 - 47th IEEE European Solid-State Device Research Conference (ESSDERC)

المؤلفون: Yau, J.-B., Yoon, J., Cai, J., Ning, T. H., Chan, K. K., Engelmann, S. U., Park, D.-G., Mo, R. T., Shahidi, G.

المصدر: 2016 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) Bipolar/BiCMOS Circuits and Technology Meeting (BCTM), 2016 IEEE. :130-133 Sep, 2016

Relation: 2016 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - BCTM

المؤلفون: Sun, X., D'Emic, C., Cheng, C.-W., Majumdar, A., Sun, Y., Cartier, E., Bruce, R. L., Frank, M., Miyazoe, H., Shiu, K.-T., Lee, S., Rozen, J., Patel, J., Ando, T., Song, W.-B., Lofaro, M., Krishnan, M., Obrodovic, B., Lee, K.-T., Tsai, H., Wang, W.-E., Spratt, W., Chan, K., Yau, J.-B., Hashemi, P., Khojasteh, M., Cantoro, M., Ott, J., Rakshit, T., Zhu, Y., Sadana, D., Yeh, C.-C., Narayanan, V., Mo, R. T., Heo, Y.-C., Kim, D.-W., Rodder, M. S., Leobandung, E.

المصدر: 2017 Symposium on VLSI Technology VLSI Technology, 2017 Symposium on. :T40-T41 Jun, 2017

Relation: 2017 Symposium on VLSI Technology

المؤلفون: Hashemi, P., Ando, T., Koswatta, S., Lee, K.-L., Cartier, E., Ott, J. A., Lee, C.-H., Bruley, J., Lofaro, M. F., Dawes, S., Chan, K. K., Engelmann, S. U., Leobandung, E., Narayanan, V., Mo, R. T.

المصدر: 2017 Symposium on VLSI Technology VLSI Technology, 2017 Symposium on. :T120-T121 Jun, 2017

Relation: 2017 Symposium on VLSI Technology

المؤلفون: Hashemi, P., Ando, T., Balakrishnan, K., Cartier, E., Lofaro, M., Ott, J. A., Bruley, J., Lee, K.-L., Koswatta, S., Dawes, S., Rozen, J., Pyzyna, A., Chan, K., Engelmann, S. U., Park, D.-G., Narayanan, V., Mo, R. T., Leobandung, E.

المصدر: 2016 IEEE Symposium on VLSI Technology VLSI Technology, 2016 IEEE Symposium on. :1-2 Jun, 2016

Relation: 2016 IEEE Symposium on VLSI Technology

المؤلفون: Yau, J.-B., Cai, J., Yoon, J., D'emic, C., Chan, K. K., Ning, T. H., Engelmann, S. U., Park, D.-G., Mo, R. T.

المصدر: 2015 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), 2015 IEEE. :1-2 Oct, 2015

Relation: 2015 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)

المؤلفون: Fong, B., Situ, L., Poon, L. C. K., Liu, J., Mo, R. T., Tsang, K. F.

المصدر: 2015 IEEE 4th Global Conference on Consumer Electronics (GCCE) Consumer Electronics (GCCE), 2015 IEEE 4th Global Conference on. :408-409 Oct, 2015

Relation: 2015 IEEE 4th Global Conference on Consumer Electronics (GCCE)

المؤلفون: Hashemi, P., Ando, T., Balakrishnan, K., Bruley, J., Engelmann, S., Ott, J. A., Narayanan, V., Park, D.-G., Mo, R. T., Leobandung, E.

المصدر: 2015 Symposium on VLSI Circuits (VLSI Circuits) VLSI Circuits (VLSI Circuits), 2015 Symposium on. :T16-T17 Jun, 2015

Relation: 2015 Symposium on VLSI Circuits

المؤلفون: Sun, Y., Majumdar, A., Cheng, C.-W., Martin, R. M., Bruce, R. L., Yau, J.-B., Farmer, D. B., Zhu, Y., Hopstaken, M., Frank, M. M., Ando, T., Lee, K.-T., Rozen, J., Basu, A., Shiu, K.-T., Kerber, P., Park, D.-G., Narayanan, V., Mo, R. T., Sadana, D. K., Leobandung, E.

المصدر: 2014 IEEE International Electron Devices Meeting Electron Devices Meeting (IEDM), 2014 IEEE International. :25.3.1-25.3.4 Dec, 2014

Relation: 2014 IEEE International Electron Devices Meeting (IEDM)