المؤلفون: Michalak, S. E., DuBois, A. J., Storlie, C. B., Quinn, H. M., Rust, W. N., DuBois, D. H., Modl, D. G., Manuzzato, A., Blanchard, S. P.

المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 12(2):445-454 Jun, 2012