المؤلفون: Shih, Bo-Jheng, Pan, Yu-Ming, Wang, Chiao-Yen, Chiu, Huan-Yu, Yang, Chih-Chao, Shen, Chang-Hong, Cheng, Huang-Chung, Chen, Kuan-Neng

المصدر: 2024 IEEE 74th Electronic Components and Technology Conference (ECTC) ECTC Electronic Components and Technology Conference (ECTC), 2024 IEEE 74th. :2167-2171 May, 2024

Relation: 2024 IEEE 74th Electronic Components and Technology Conference (ECTC)

المؤلفون: Kwak, Jungyoun, Choe, Gihun, Lee, Junmo, Yu, Shimeng

المصدر: 2024 IEEE International Symposium on Circuits and Systems (ISCAS) Circuits and Systems (ISCAS), 2024 IEEE International Symposium on. :1-5 May, 2024

Relation: 2024 IEEE International Symposium on Circuits and Systems (ISCAS)

المؤلفون: Yang, Mengtian, Wang, Yipeng, Kulkarni, Jaydeep P.

المصدر: 2023 IEEE 30th International Conference on High Performance Computing, Data, and Analytics (HiPC) HIPC High Performance Computing, Data, and Analytics (HiPC), 2023 IEEE 30th International Conference on. :61-65 Dec, 2023

Relation: 2023 IEEE 30th International Conference on High Performance Computing, Data, and Analytics (HiPC)

المؤلفون: Vemuri, M.S., Tida, U.R.

المصدر: IEEE Access Access, IEEE. 12:23066-23080 2024

المؤلفون: Kwak, Jungyoun, Li, Wantong, Yu, Shimeng

المصدر: 2023 IEEE 66th International Midwest Symposium on Circuits and Systems (MWSCAS) Circuits and Systems (MWSCAS), 2023 IEEE 66th International Midwest Symposium on. :336-340 Aug, 2023

Relation: 2023 IEEE 66th International Midwest Symposium on Circuits and Systems (MWSCAS)

المؤلفون: Chen, Sihao, Jiao, Yanxin, Peng, Baokang, Li, Ming, Zhang, Lining, Wang, Runsheng, Huang, Ru

المصدر: 2023 International Symposium of Electronics Design Automation (ISEDA) Electronics Design Automation (ISEDA), 2023 International Symposium of. :418-422 May, 2023

Relation: 2023 International Symposium of Electronics Design Automation (ISEDA)

المؤلفون: Hung, Shao-Chun, Chaudhuri, Arjun, Banerjee, Sanmitra, Chakrabarty, Krishnendu

المصدر: 2023 IEEE 41st VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2023 IEEE 41st. :1-4 Apr, 2023

Relation: 2023 IEEE 41st VLSI Test Symposium (VTS)

المؤلفون: Srimani, Tathagata, Radway, Robert M., Kim, Jinwoo, Prabhu, Kartik, Rich, Dennis, Gilardi, Carlo, Raina, Priyanka, Shulaker, Max, Lim, Sung Kyu, Mitra, Subhasish

المصدر: 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE) Design, Automation & Test in Europe Conference & Exhibition (DATE), 2023. :1-6 Apr, 2023

Relation: 2023 Design, Automation & Test in Europe Conference & Exhibition (DATE)

المؤلفون: Chung, H., Pan, Y., Lin, N., Hong, Z., Shih, B., Yang, C., Shen, C., Huang, P., Cheng, H., Chen, K., Hu, C.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 44(7):1036-1039 Jul, 2023

المؤلفون: Bae, Sanggeun, Oh, Jungyeop, Kang, Mingu, Choi, Sung-Yool

المصدر: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) Electron Devices Technology & Manufacturing Conference (EDTM), 2023 7th IEEE. :1-3 Mar, 2023

Relation: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)