المؤلفون: Garba-Seybou, Tidjani, Federspiel, Xavier, Monsieur, Frederic, Sicre, Mathieu, Cacho, Florian, Hai, Joycelyn, Bravaix, Alain

المصدر: 2023 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2023 IEEE International. :1-8 Mar, 2023

Relation: 2023 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Julliard, Pierre-Louis, Jay, Antoine, Gunde, Miha, Salles, Nicolas, Monsieur, Frederic, Guitard, Nicolas, Cabout, Thomas, Joblot, Sylvain, Martin-Samos, Layla, Rideau, Denis, Cristiano, Fuccio, Hemeryck, Anne

المصدر: 2021 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) Simulation of Semiconductor Processes and Devices (SISPAD), 2021 International Conference on. :219-223 Sep, 2021

Relation: 2021 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)

المؤلفون: Gasiot, Gilles, Abouzeid, Fady, Malherbe, Victor, Damiens, Joel, Monsieur, Frederic, De Boissac, Capucine Lecat Mathieu, Soussan, Dimitri, Lorquet, Vincent, Thery, Thomas, Roche, Philippe

المصدر: 2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Radiation and Its Effects on Components and Systems (RADECS), 2019 19th European Conference on. :1-5 Sep, 2019

Relation: 2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS)

المؤلفون: Joblot, Sylvain, Duru, Romain, Guitard, Nicolas, Lu, Vincent, Nassiet, Thomas, Beneyton, Remi, Cristiano, Fuccio, Dabertrand, Karen, Borrel, Julien, Juhel, Marc, Arevalo, Edwin, Monsieur, Frederic, Borowiak, Celine, Ghegin, Elodie, Clement, Laurent, Oudot, Evan, Rideau, Denis, Zou, Wei, Pinzelli, Luc

المصدر: 2018 22nd International Conference on Ion Implantation Technology (IIT) Ion Implantation Technology (IIT), 2018 22nd International Conference on. :121-124 Sep, 2018

Relation: 2018 22nd International Conference on Ion Implantation Technology (IIT)

المؤلفون: Bordignon, Thomas, Duriez, Blandine, Guitard, Nicolas, Duru, Romain, Pribat, Clément, Richy, Jérôme, Reboh, Shay, Dhar, Siddhartha, Monsieur, Frédéric, Fache, Thibaud, Chalupa, Zdenek, Hartmann, Jean-Michel, Chevalier, Pascal, Roelens, Yannick, Danneville, François, Crémer, Sébastien

المصدر: In Solid State Electronics December 2023 210

المؤلفون: Cros, Antoine, Monsieur, Frederic, Carminati, Yann, Normandon, Philippe, Petit, David, Arnaud, Franck, Rosa, Julien

المصدر: Proceedings of the 2015 International Conference on Microelectronic Test Structures Microelectronic Test Structures (ICMTS), 2015 International Conference on. :65-69 Mar, 2015

Relation: 2015 International Conference on Microelectronic Test Structures (ICMTS)

المؤلفون: Seo, Soon-Cheon, Yang, Chih-Chao, Yeh, Chun-Chen, Haran, Bala, Horak, Dave, Fan, Susan, Koburger, Charles, Canaperi, Donald, Papa rao, Satyavolu S., Monsieur, Frederic, Knorr, Andreas, Kerber, Andreas, Hu, Chao-Kun, Kelly, James, Vo, Tuan, Cummings, Jason, Smalleya, Matthew, Petrillo, Karen, Mehta, Sanjay, Schmitz, Stefan, Levin, Theodore, Park, Dae-Guy, Stathis, James H., Spooner, Terry, Paruchuri, Vamsi, Wynne, Jean, Edelstein, Daniel, McHerron, Dale, Doris, Bruce

المصدر: 2009 IEEE International Interconnect Technology Conference Interconnect Technology Conference, 2009. IITC 2009. IEEE International. :8-10 Jun, 2009

Relation: 2009 IEEE International Interconnect Technology Conference - IITC

المؤلفون: Martinez, Vincent, Besset, Carine, Monsieur, Frederic, Montes, Laurent, Ghibaudo, Gerard

المصدر: 2008 IEEE International Integrated Reliability Workshop Final Report Integrated Reliability Workshop Final Report, 2008. IRW 2008. IEEE International. :21-24 Oct, 2008

Relation: 2008 IEEE International Integrated Reliability Workshop Final Report (IRW)

المؤلفون: Lopez, Diana, Monsieur, Frederic, Ricq, Stephane, Roux, Julien-Marc, Balestra, Francis

المصدر: 2008 IEEE International Integrated Reliability Workshop Final Report Integrated Reliability Workshop Final Report, 2008. IRW 2008. IEEE International. :36-39 Oct, 2008

Relation: 2008 IEEE International Integrated Reliability Workshop Final Report (IRW)

المؤلفون: Diop, Malick, Revil, Nathalie, Marin, Mathieu, Monsieur, Frederic, Schwartzmann, Thierry, Ghibaudo, Gerard

المصدر: 2008 IEEE International Integrated Reliability Workshop Final Report Integrated Reliability Workshop Final Report, 2008. IRW 2008. IEEE International. :77-80 Oct, 2008

Relation: 2008 IEEE International Integrated Reliability Workshop Final Report (IRW)