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1مؤتمر
المؤلفون: Schram, T., Kubicek, S., Rohr, E., Brus, S., Vrancken, C., Chang, S.-Z., Chang, V.S., Mitsuhashi, R., Okuno, Y., Akheyar, A., Cho, H.-J., Hooker, J.C., Paraschiv, V., Vos, R., Sebai, F., Ercken, M., Kelkar, P., Delabie, A., Adelmann, C., Witters, T., Ragnarsson, L-A., Kerner, C., Chiarella, T., Aoulaiche, M., Moon-Ju Cho, Kauerauf, T., De Meyer, K., Lauwers, A., Hoffmann, T., Absil, P.P., Biesemans, S.
المصدر: 2008 Symposium on VLSI Technology VLSI Technology, 2008 Symposium on. :44-45 Jun, 2008
Relation: 2008 Symposium on VLSI Technology
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2
المؤلفون: Seoa Park, Moon-Ju Cho, Ji-Soo Lee
المصدر: Journal of the Korea Academia-Industrial cooperation Society. 23:239-249
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b7d139fa8587f74a9e21448054bc8d15
https://doi.org/10.5762/kais.2022.23.12.239 -
3The defect-centric perspective of device and circuit reliability—From gate oxide defects to circuits
المؤلفون: Guido Groeseneken, Francky Catthoor, Michael Waltl, Marko Simicic, Pieter Weckx, Jacopo Franco, Gerhard Rzepa, Dimitri Linten, Erik Bury, Tibor Grasser, Bertrand Parvais, Moon Ju Cho, V. Putcha, Ben Kaczer, Robin Degraeve, Peter Debacker, Wolfgang Goes, Praveen Raghavan, Philippe Roussel
المصدر: Solid-State Electronics. 125:52-62
مصطلحات موضوعية: 010302 applied physics, Computer science, Circuit design, Perspective (graphical), Hardware_PERFORMANCEANDRELIABILITY, 02 engineering and technology, Condensed Matter Physics, Circuit reliability, 01 natural sciences, 020202 computer hardware & architecture, Electronic, Optical and Magnetic Materials, Reliability (semiconductor), Gate oxide, 0103 physical sciences, Hardware_INTEGRATEDCIRCUITS, 0202 electrical engineering, electronic engineering, information engineering, Materials Chemistry, Electronic engineering, Electrical and Electronic Engineering, Electronic circuit
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4
المؤلفون: Pierre C. Fazan, Naoto Horiguchi, Eddy Simoen, Tom Schram, Cor Claeys, Alessio Spessot, Romain Ritzenthaler, Marc Aoulaiche, Moon Ju Cho
المصدر: ECS Journal of Solid State Science and Technology. 5:N27-N31
مصطلحات موضوعية: 010302 applied physics, Input/output, Materials science, business.industry, Infrasound, Transistor, Oxide, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Electronic, Optical and Magnetic Materials, law.invention, chemistry.chemical_compound, chemistry, law, 0103 physical sciences, Trap density, Optoelectronics, 0210 nano-technology, business, Dram
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5
المؤلفون: Alessio Spessot, Marc Aoulaiche, Naoto Horiguchi, Cor Claeys, Pierre C. Fazan, Romain Ritzenthaler, Eddy Simoen, Tom Schram, Moon Ju Cho
المصدر: ECS Transactions. 69:281-289
مصطلحات موضوعية: Noise power, Materials science, business.industry, Transistor, Electrical engineering, Oxide, Noise (electronics), law.invention, chemistry.chemical_compound, Stack (abstract data type), chemistry, law, Gate oxide, Optoelectronics, business, Dram, High-κ dielectric
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6
المؤلفون: Pierre C. Fazan, Romain Ritzenthaler, Johan Albert, Vasile Paraschiv, Wilfried Vandervorst, E. Vecchio, Aftab Nazir, Efrain Altamirano-Sanchez, Geert Schoofs, Nadine Collaert, H.-J. Na, Sun-Ghil Lee, F. Sebai, Thomas Kauerauf, Naoto Horiguchi, Y. Son, Moon Ju Cho, Alexey Milenin, Alessio Spessot, Bastien Douhard, Marc Aoulaiche, K. B. Noh, Aaron Thean, Christian Caillat, Soon Aik Chew, Tom Schram
المصدر: IEEE Transactions on Electron Devices. 61:2935-2943
مصطلحات موضوعية: Dynamic random-access memory, Materials science, business.industry, Depletion-load NMOS logic, Electrical engineering, Hardware_PERFORMANCEANDRELIABILITY, Electronic, Optical and Magnetic Materials, law.invention, PMOS logic, CMOS, Stack (abstract data type), law, Hardware_INTEGRATEDCIRCUITS, Optoelectronics, Node (circuits), Electrical and Electronic Engineering, business, NMOS logic, Dram, Hardware_LOGICDESIGN
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7
المؤلفون: Guido Groeseneken, Anabela Veloso, Naoto Horiguchi, Guillaume Boccardi, Eddy Simoen, Jae Woo Lee, Moon Ju Cho, Thomas Chiarella, Aaron Thean, Lars-Ake Ragnarsson
المصدر: ACS Applied Materials & Interfaces. 5:8865-8868
مصطلحات موضوعية: Electron mobility, Fin field effect transistor, Materials science, business.industry, Annealing (metallurgy), Infrasound, Oxide, Plasma, chemistry.chemical_compound, chemistry, Trap density, Optoelectronics, General Materials Science, business, Metal gate
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المؤلفون: Guillaume Boccardi, Lars-Ake Ragnarsson, Anabela Veloso, Guido Groeseneken, Hiroaki Arimura, Thomas Chiarella, Jae Woo Lee, Aaron Thean, Moon Ju Cho, Eddy Simoen, Naoto Horiguchi
المصدر: IEEE Transactions on Electron Devices. 60:2960-2962
مصطلحات موضوعية: Electron mobility, Materials science, Annealing (metallurgy), Infrasound, Oxide, Analytical chemistry, Plasma, Electronic, Optical and Magnetic Materials, chemistry.chemical_compound, chemistry, MOSFET, Electrical and Electronic Engineering, Post treatment, Metal gate
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المؤلفون: Cor Claeys, Eddy Simoen, Abdelkarim Mercha, Joao Antonio Martino, Michele Rodrigues, Moon Ju Cho, Nadine Collaert
المصدر: ECS Transactions. 23:559-565
مصطلحات موضوعية: Charge pumping, Materials science, chemistry, business.industry, Interface (computing), Electrode, Trap density, Optoelectronics, chemistry.chemical_element, Silicon on insulator, business, Tin
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10
المؤلفون: J. Versluijs, A. De Keersgieter, Z. Tao, E. Vecchio, Geert Eneman, Aaron Thean, Harold Dekkers, Anabela Veloso, Stephan Brus, Vasile Paraschiv, Nadine Collaert, Moon Ju Cho, Eddy Simoen, Laurent Souriau, J. Geypen, Hugo Bender, P. Lagrain, Philippe Matagne, Katia Devriendt, Wen Fang, Geert Hellings
المصدر: 2015 Symposium on VLSI Technology (VLSI Technology).
مصطلحات موضوعية: Reliability (semiconductor), Materials science, CMOS, business.industry, Modulation, Logic gate, Electrical engineering, Nanowire, Optoelectronics, Dissipation, business, Metal gate, Noise (electronics)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::120af9b10fd9a17d90af31f5c761273a
https://doi.org/10.1109/vlsit.2015.7223652