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1مؤتمر
المؤلفون: Mourrain, C., Cretu, B., Ghibaudo, G., Cottin, P.
المصدر: ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures (Cat. No.00CH37095) Microelectronic test structures Microelectronic Test Structures, 2000. ICMTS 2000. Proceedings of the 2000 International Conference on. :181-186 2000
Relation: ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures
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2مؤتمر
المؤلفون: Josse, E., Gowziecki, R., Alieu, J., Mourrain, C., Havond, D., Halimaoui, A., Martin, F., Skotnicki, T.
المصدر: 28th European Solid-State Device Research Conference Solid-State Device Research Conference, 1998. Proceeding of the 28th European. :364-367 1998
Relation: 28th European Solid-State Device Research Conference
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3مؤتمر
المؤلفون: Skotnicki, T., Bouillon, P., Gwoziecki, R., Halimaoui, A., Mourrain, C., Sagnes, I., Regolini, J.L., Jouber, O., Paoli, M., Schiavone, P.
المصدر: 27th European Solid-State Device Research Conference Solid-State Device Research Conference, 1997. Proceeding of the 27th European. :216-219 1997
Relation: 27th European Solid-State Device Research Conference
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4مؤتمر
المؤلفون: Hardillier, S., Mourrain, C., Bouzid, M.J., Ghibaudo, G.
المصدر: 1997 IEEE International Conference on Microelectronic Test Structures Proceedings Microelectronic test structures Microelectronic Test Structures, 1997. ICMTS 1997. Proceedings. IEEE International Conference on. :63-66 1997
Relation: 1997 IEEE International Conference on Microelectronic Test Structures Proceedings
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5مؤتمر
المؤلفون: Alieu, J., Gwoziecki, R., Paoli, M., Skotnicki, T., Hernandez, C., Martin, F., Mourrain, C., Bensahel, D., Basso, M.-T., Galvier, J., Haond, M.
المصدر: 1998 Symposium on VLSI Technology Digest of Technical Papers (Cat. No.98CH36216) VLSI technology VLSI Technology, 1998. Digest of Technical Papers. 1998 Symposium on. :192-193 1998
Relation: 1998 Symposium on VLSI Technology Digest of Technical Papers
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6دورية أكاديمية
المؤلفون: Franco GC, Gallay F, Berenguer M, Mourrain C, Couturier P
المصدر: Journal of Telemedicine & Telecare; Jul2008, Vol. 14 Issue 5, p231-235, 5p
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7دورية
المؤلفون: Mourrain, C., Tourniol, C., Bouzid, M. J.
المصدر: Microelectronics Reliability; 1998, Vol. 38 Issue: 6 p1115-1120, 6p
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8مؤتمر
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل. -
9مؤتمر
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل.
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