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المؤلفون: Nur Ameera Ameelia Binti Iskandar Zulkarnain, Jason Sweis, Ezni Aznida Binti Kamal Baharin, Mohamad Fahmi Bin Muhsain, Muhamad Asraf Bin Ahmad Ibrahim, Muhamad Faiz Bin Abd Malek
المصدر: DTCO and Computational Patterning.
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::44661f5140dea713e7c5a600ccff42dc
https://doi.org/10.1117/12.2606175 -
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المؤلفون: Muhamad Asraf Bin Ahmad Ibrahim, Philippe Hurat, Ezni Aznida Binti Kamal Baharin, Ya-Chieh Lai, Mohamad Fahmi Bin Muhsain, Jason Sweis
المصدر: Design-Process-Technology Co-optimization for Manufacturability XII.
مصطلحات موضوعية: Computer science, business.industry, Embedded system, Next-generation network, Hardware_INTEGRATEDCIRCUITS, Block detection, Pattern analysis, Process window, Design cycle, Tape-out, business, Turnaround time
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::51bb7fba970a0cd3ed8d0c0e125b9b3c
https://doi.org/10.1117/12.2297675 -
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المؤلفون: Ahmad Nurul Ihsan Bin Ahmad Noorhani, Ezni Aznida Binti Kamal Baharin, Mohamad Fahmi Bin Muhsain, Ya-Chieh Lai, Jason Sweis, Philippe Hurat, Muhamad Asraf Bin Ahmad Ibrahim
المصدر: SPIE Proceedings.
مصطلحات موضوعية: Automated optical inspection, business.industry, Computer science, Real-time computing, Process (computing), Mask inspection, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Automation, 010309 optics, Automated X-ray inspection, 0103 physical sciences, Node (circuits), 0210 nano-technology, business, Simulation
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::f60a08e10fc0746e1abc005c759e24db
https://doi.org/10.1117/12.2260976