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1مؤتمر
المؤلفون: Plouchart, J.-O., Jonghae Kim, Gross, B.J., Kun Wu, Trzcinski, R., Karam, V., Hyde, P., Williams, R., Myung-Hee Na, Mc Cullen, J., Clark, W.
المصدر: IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. International Electron Devices Meeting 2005 Electron Devices Meeting, 2005. IEDM Technical Digest. IEEE International. :4 pp.-1033 2005
Relation: International Electron Devices Meeting 2005
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2
المؤلفون: Dong Ik Suh, Won-Tae Koo, Youngmo Kim, Ja-Yong Kim, Seung Wook Ryu, Heeyoung Jeon, Ki Vin Im, Gwangyeob Lee, Taeone Youn, Hyeonho Jeong, Seho Lee, Myung-Hee Na, Seon Yong Cha
المصدر: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::3a1efd0b90f47471c08fe8fa689b091e
https://doi.org/10.1109/edtm55494.2023.10102993 -
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المؤلفون: Soo Man Seo, Hisanori Aikawa, Soo Gil Kim, Toshihiko Nagase, Yuich Ito, Tae Jung Ha, Kenichi Yoshino, Bo Kyung Jung, Tadaaki Oikawa, Ku Youl Jung, Hyun In Moon, Bum Su Kim, Fumiyoshi Matsuoka, Kosuke Hatsuda, Katsuhiko Hoya, Seiyon Kim, Sung-Hoon Lee, Myung-Hee Na, Seon Yong Cha
المصدر: 2022 International Electron Devices Meeting (IEDM).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::93062041cdb27bb915b9189a66ed2cfe
https://doi.org/10.1109/iedm45625.2022.10019549 -
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المؤلفون: Jae-Gil Lee, Joongsik Kim, Dong Ik Suh, Ildo Kim, Gwon Deok Han, Seung Wook Ryu, Seho Lee, Myung-Hee Na, Seon Yong Cha, Hyeon Woo Park, Cheol Seong Hwang
المصدر: 2022 IEEE International Memory Workshop (IMW).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::4be797658b86936a385a1d10ddf44f89
https://doi.org/10.1109/imw52921.2022.9779292 -
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المؤلفون: Sijung Yoo, Donghoon Kim, Yoon Mo Koo, Sujee Kim Wooju Jeong, Hyungjoon Shim, Won-Jun Lee, Beom Seok Lee, Seungyun Lee, Hyejung Choi, Hyung Dong Lee, Taehoon Kim, Myung-Hee Na
المصدر: 2022 IEEE International Memory Workshop (IMW).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::ce352b9bc0034b70e4935886f30800f5
https://doi.org/10.1109/imw52921.2022.9779247 -
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المؤلفون: Sangsu Park, Gyonhui Lee, Youngjae Kwon, Dong Ik Suh, Hanwool Lee, Sangeun Je, Dabin Kim, Dohan Lee, Seungwook Ryu, Seungbum Kim, Euiseok Kim, Sunghoon Lee, Kyoung Park, Seho Lee, Myung-Hee Na, Seonyong Cha
المصدر: 2022 IEEE International Memory Workshop (IMW).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::def47f1a90a2424b12dbe32a336d2124
https://doi.org/10.1109/imw52921.2022.9779296 -
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المؤلفون: Alessio Spessot, Eugenio Dentoni Litta, Anne Vandooren, Marc Schaekers, Hao Yu, Shairfe Muhammad Salahuddin, Julien Ryckaert, Romain Ritzenthaler, Myung-Hee Na, Jean-Luc Everaert, Anshul Gupta
المصدر: IEEE Transactions on Electron Devices. 67:4631-4635
مصطلحات موضوعية: 010302 applied physics, Interconnection, Random access memory, Computer science, Hardware_PERFORMANCEANDRELIABILITY, 01 natural sciences, Electronic, Optical and Magnetic Materials, CMOS, Logic gate, 0103 physical sciences, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Wafer, Static random-access memory, Electrical and Electronic Engineering, Cost of ownership
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المؤلفون: Minchul Sung, Kwangmyoung Rho, Jayong Kim, Junho Cheon, Kiyoung Choi, Dohee Kim, Hoseok Em, Gyeongcheol Park, Jungwook Woo, Yeongyu Lee, Jaehyeon Ko, Moonhoi Kim, Gwangyeob Lee, Seung Wook Ryu, Dong Sun Sheen, Yangsung Joo, Seiyon Kim, Chang Hyun Cho, Myung-Hee Na, Jinkook Kim
المصدر: 2021 IEEE International Electron Devices Meeting (IEDM).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b368d1e138f827222b6bcacae8569598
https://doi.org/10.1109/iedm19574.2021.9720545 -
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المؤلفون: Debjyoti Bhattacharjee, Nathan Laubeuf, Diederik Verkest, Arindam Maliik, Peter Debacker, Stefan Cosemans, Ioannis A. Papistas, Myung Hee Na
المصدر: ISCAS
مصطلحات موضوعية: Acceleration, Computer engineering, Computer science, Systems architecture, Inference, Ranging, Static random-access memory, Convolutional neural network, Energy (signal processing), Efficient energy use
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::2fd3fd7221e8e8db9a95cbd2c783a3b8
https://doi.org/10.1109/iscas51556.2021.9401064 -
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المؤلفون: S. Sarkar, Bilal Chehab, Julien Ryckaert, Alessio Spessot, Myung Hee Na
المصدر: Design-Process-Technology Co-optimization for Manufacturability XIV.
مصطلحات موضوعية: Standard cell, Computer science, media_common.quotation_subject, Transistor, law.invention, Presentation, Cmos technology scaling, Computer architecture, law, Hardware_INTEGRATEDCIRCUITS, System on a chip, Architecture, Lithography, Scaling, media_common
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6ed1f53d1d89534fd66711c62660c4c7
https://doi.org/10.1117/12.2551690